Journal of Vacuum Science & Technology B

Journal of Vacuum Science & Technology B, Vol.14, No.2 Entire volume, number list

ISSN: 1071-1023 (Print)

In this Issue (202 articles)

585 - 592	Nanocluster Formation by Spin-Coating - Quantitative Atomic-Force Microscopy and Rutherford Backscattering Spectrometry Analysis Partridge A, Toussaint SL, Flipse CF, Vanijzendoorn LJ, Vandenoetelaar LC
593 - 596	Direct Observation of Fullerene-Adsorbed Tips by Scanning-Tunneling-Microscopy Kelly KF, Sarkar D, Prato S, Resh JS, Hale GD, Halas NJ
597 - 601	Microfabrication of Near-Field Optical Probes Ruiter AG, Moers MH, Vanhulst NF, Deboer M
602 - 605	Scanning Force Microscopy for the Study of Domain-Structure in Ferroelectric Thin-Films Gruverman A, Auciello O, Tokumoto H
606 - 611	Electron Trajectories and Light-Emitting Images of Starlike Thin-Film Field Emitters Kaneko A, Sumita I
612 - 616	Fabrication of Si Field Emitters by Dry-Etching and Mask Erosion Rakhshandehroo MR, Pang SW
617 - 622	Ballistic-Electron-Emission Microscopy Studies of Electron-Scattering in Au/GaAs Schottky Diodes Damaged by Focused Ion-Beam Implantation Mcnabb JW, Craighead HG
623 - 631	Atomic-Scale Roughness of GaAs(001)2X4 Surfaces Fan Y, Karpov I, Bratina G, Sorba L, Gladfelter W, Franciosi A
632 - 637	Application of Phase-Sensitive Photoreflectance Spectroscopy to a Study of Undoped AlGaAs/GaAs Quantum-Well Structures Hughes PJ, Weiss BL
638 - 641	Nonlinear Characteristics Induced by Carrier Accumulation in InAs/GaAs Superlattice Cap Layer on GaAs/GaAlAs Multiquantum-Well Structure Matsui Y, Kusumi Y
642 - 646	Strain Relaxation in Compositionally Graded Epitaxial Layers Kim SD, Lord SM, Harris JS
647 - 651	Characterization of Oxide Desorption from InSb(001) Substrates Liu WK, Santos MB
652 - 656	Thermal-Stability and Degradation Mechanism of Wsin/InGaP Schottky Diodes Shiojima K, Nishimura K, Hyuga F
657 - 661	High-Temperature Stable Ir-Al/N-GaAs Schottky Diodes - Effect of the Barrier Height Controlling Lalinsky T, Osvald J, Machajdik D, Mozolova Z, Sisolak J, Constantinidis G, Kobzev AP
662 - 673	Electron-Beam-Induced Deposition from W(Co)(6) at 2 to 20 keV and Its Applications Hoyle PC, Cleaver JR, Ahmed H
674 - 678	Properties of Tanx Films as Diffusion-Barriers in the Thermally Stable Cu/Si Contact Systems Takeyama M, Noya A, Sase T, Ohta A, Sasaki K
679 - 686	Simulation of Uniformity and Lifetime Effects in Collimated Sputtering Tait RN, Dew SK, Tsai W, Hodul D, Smy T, Brett MJ
687 - 690	Number of Voids Formed on a Line - Parameter for Electromigration Lifetime Hinode K, Kondo S, Deguchi O
691 - 697	Study of the H-2 Remote Plasma Cleaning of InP Substrate for Epitaxial-Growth Losurdo M, Capezzuto P, Bruno G
698 - 706	Optical-Properties of Reactive-Ion-Etched Si/Si1-xGex Heterostructures Koster T, Gondemann J, Hadam B, Spangenberg B, Schutze M, Roskos HG, Kurz H, Brunner J, Abstreiter G
707 - 709	Enhanced Dry-Etching of Silicon with Deuterium Plasma Iwakuro H, Kuroda T, Shen DH, Lin ZD
710 - 715	SiO2 to Si Selectivity Mechanisms in High-Density Fluorocarbon Plasma-Etching Kirmse KH, Wendt AE, Disch SB, Wu JZ, Abraham IC, Meyer JA, Breun RA, Woods RC
716 - 723	Mxp+ - A New Dielectric Etcher with Enabling Technology, High Productivity, and Low Cost-of-Consumables Shan HC, Lee E, Welch M, Pu B, Carducci J, Ke KH, Gao H, Luscher P, Crean G, Wang R, Blume R, Cooper J, Wu R
724 - 726	Effect of Fluorine Concentration on the Etch Characteristics of Fluorinated Tetraethylorthosilicate Films Allen LR
727 - 731	Effects of Native-Oxide Removal from Silicon Substrate and Annealing on SiO2-Films Deposited at 120-Degrees-C by Plasma-Enhanced Chemical-Vapor-Deposition Using Disilane and Nitrous-Oxide Song JH, Ajmera PK, Lee GS
732 - 737	Inductively-Coupled Plasma for Polymer Etching of 200 mm Wafers Forgotson N, Khemka V, Hopwood J
738 - 743	Investigation of Low-Temperature SiO2 Plasma-Enhanced Chemical-Vapor-Deposition Deshmukh SC, Aydil ES
744 - 750	Real-Time Investigation of Nucleation and Growth of Silicon on Silicon Dioxide Using Silane and Disilane in a Rapid Thermal-Processing System Hu YZ, Diehl DJ, Zhao CY, Wang CL, Liu Q, Irene EA, Christensen KN, Venable D, Maher DM
751 - 756	Rugged Surface Polycrystalline Silicon Film Deposition and Its Application in a Stacked Dynamic Random-Access Memory Capacitor Electrode Ino M, Miyano J, Kurogi H, Tamura H, Nagatomo Y, Yoshimaru M
757 - 762	Reliability of Ultimate Ultrathin Silicon-Oxide Films Produced by the Continuous Ultradry Process Yamada H
763 - 767	Quantitative Depth Profiling of Boron in Shallow Bf2+-Implanted Silicon by Using Laser-Ionization Sputtered Neutral Mass-Spectrometry Higashi Y, Maruo T, Homma Y, Miyake M
768 - 771	Growth of Copper Nanocrystallites on Copper Seed Cones - Evidence for the Presence of a Liquid-Phase on an Ion-Impacting Cone Surface Okuyama F
772 - 774	Role of Gas-Phase Reactions in Subatmospheric Chemical-Vapor-Deposition Ozone/Teos Processes for Oxide Deposition Shareef IA, Rubloff GW, Bill WN
787 - 787	8th International-Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques - Preface Hamers RJ
789 - 793	Biosensor Based on Force Microscope Technology Baselt DR, Lee GU, Colton RJ
794 - 799	Scanning Local-Acceleration Microscopy Burnham NA, Kulik AJ, Gremaud G, Gallo PJ, Oulevey F
800 - 803	Scanning Near-Field Optical Microscopy/Spectroscopy of Thin Organic Films Nagahara LA, Tokumoto H
804 - 808	Characteristics of Photon Scanning Tunneling Microscope Read-Out Kobayashi K, Watanuki O
809 - 811	Molecular-Orientation in Polymers from Near-Field Optical Polarization Measurements Williamson RL, Miles MJ
812 - 815	Imaging of Organic Molecular Films Using a Scanning Near-Field Optical Microscope Combined with an Atomic-Force Microscope Yamada H, Tokumoto H, Akamine S, Fukuzawa K, Kuwano H
816 - 819	Scattering of Electromagnetic-Waves by Silicon-Nitride Tips Bouju X, Dereux A, Vigneron JP, Girard C
820 - 823	Heterostructure Interface Characterization Using Scanning Tunneling Microscope Excited Time-Resolved Luminescence Horn J, Vogt A, Aller I, Hartnagel HL, Stehle M
824 - 826	Study of Luminescent Porous Polycrystalline Silicon Thin-Films Han PG, Poon MC, Ko PK, Sin JK, Wong H
827 - 831	Design and Performance Analysis of a 3-Dimensional Sample Translation Device Used in Ultrahigh-Vacuum Scanned Probe Microscopy Schlittler RR, Gimzewski JK
832 - 837	Thermal Imaging of Thin-Films by Scanning Thermal Microscope Oesterschulze E, Stopka M, Ackermann L, Scholz W, Werner S
838 - 841	Microwave Tunneling Current from the Resonant Interaction of an Amplitude-Modulated Laser with a Scanning Tunneling Microscope Hagmann MJ
842 - 844	Voltage Contrast in Submicron Integrated-Circuits by Scanning Force Microscopy Bohm C, Sprengepiel J, Otterbeck M, Kubalek E
845 - 848	Normal and Lateral Force Images, Sub-Angstrom Height Resolution, and Midlevel Lateral Resolution with a Phonograph Cartridge as Scanning Force Sensor Mariani T, Frediani C, Ascoli C
849 - 851	Shearing Stress on the Surface-Topography by Scanning Shearing Stress Microscopy Iwata F, Sasaki A, Kawaguchi M, Katsumata A, Aoyama H
852 - 855	Gamble Mode - Resonance Contact Mode in Atomic-Force Microscopy Oconnor SD, Gamble RC, Eby RK, Baldeschwieler JD
856 - 860	Atomic-Force Microscopy and Lateral Force Microscopy Using Piezoresistive Cantilevers Linnemann R, Gotszalk T, Rangelow IW, Dumania P, Oesterschulze E
861 - 863	New Optoelectronic Tip Design for Ultrafast Scanning-Tunneling-Microscopy Groeneveld RH, Rasing T, Kaufmann LM, Smalbrugge E, Wolter JH, Melloch MR, Vankempen H
864 - 867	Driven Nonlinear Atomic-Force Microscopy Cantilevers - From Noncontact to Tapping Modes of Operation Sarid D, Ruskell TG, Workman RK, Chen D
868 - 871	Direct Measurement of Laser Momentum-Transfer to Dense Media by Means of Atomic-Force Microscopy Cantilevers Labardi M, Larocca GC, Mango F, Bassani F, Allegrini M
872 - 876	Scanning Force Microscopy with 2 Optical Levers for Detection of Deformations of the Cantilever Kawakatsu H, Saito T
877 - 881	Acoustic and Dynamic Force Microscopy with Ultrasonic Probes Murdfield T, Fischer UC, Fuchs H, Volk R, Michels A, Meinen F, Beckman E
882 - 886	Strain-Imaging Observation of a Pb(Zr,Ti)O-3 Thin-Film Takata K
887 - 891	Imaging Mechanism and Effects of Adsorbed Water in Contact-Type Scanning Capacitance Microscopy Nakagiri N, Yamamoto T, Sugimura H, Suzuki Y
892 - 896	Imaging Conducting Surfaces and Dielectric Films by a Scanning Capacitance Microscope Lanyi S, Torok J, Rehurek P
897 - 900	Scanning-Tunneling-Microscopy Head Having Integrated Capacitive Sensors for Calibration of Scanner Displacements Picotto GB, Desogus S, Lanyi S, Nerino R, Sosso A
901 - 905	Scanning Force Microscopy in the Dynamic-Mode Using Microfabricated Capacitive Sensors Blanc N, Brugger J, Derooij NF, Durig U
906 - 908	Atomic-Structure of the Steps on Si(001) Studied by Scanning-Tunneling-Microscopy Komura T, Yoshimura M, Yao T
909 - 913	Scanning-Tunneling-Microscopy Investigation of the Dimer Vacancy-Dimer Vacancy Interaction on the Si(001) 2Xn Surface Smith AR, Men FK, Chao KJ, Zhang ZY, Shih CK
914 - 917	Variable Low-Temperature Scanning-Tunneling-Microscopy Study of Si(001) - Nature of the 2X1-)C(2X4) Phase-Transition Smith AR, Men FK, Chao KJ, Shih CK
918 - 924	Laser-Desorption from and Reconstruction on Si(100) Surfaces Studied by Scanning-Tunneling-Microscopy Xu J, Overbury SH, Wendelken JF
925 - 928	Low-Temperature Scanning-Tunneling-Microscopy on Vicinal Ge(100) Rottger B, Bertrams T, Neddermeyer H
929 - 932	Atomic-Structure of the Diamond (100) Surface Studied Using Scanning-Tunneling-Microscopy Stallcup RE, Villarreal LM, Lim SC, Akwani I, Aviles AF, Perez JM
933 - 937	Scanning-Tunneling-Microscopy Study of SiC(0001) Surface Reconstructions Owman F, Martensson P
938 - 942	Surface-Structure of 3C-SiC(111) Fabricated by C-60 Precursor - A Scanning-Tunneling-Microscopy and High-Resolution Electron-Energy-Loss Spectroscopy Study Hu CW, Kasuya A, Suto S, Wawro A, Nishina Y
943 - 947	(2X4)/C(2X8) to (4X2)/C(8X2) Transition on GaAs(001) Surfaces Moriarty P, Benton PH, Ma YR, Dunn AW, Henini M, Woolf DA
948 - 952	Application of Scanning-Tunneling-Microscopy to Determine the Exact Charge States of Surface Point-Defects Chao KJ, Smith AR, Shih CK
953 - 956	Atomic-Resolution Imaging of InP(110) Surface Observed with Ultrahigh-Vacuum Atomic-Force Microscope in Noncontact Mode Sugawara Y, Ohta M, Ueyama H, Morita S, Osaka F, Ohkouchi S, Suzuki M, Mishima S
957 - 960	InSb((111)over-Bar)3X1 - New Surface Reconstruction Bjorkqvist M, Gothelid M, Olsson LO, Kanski J, Karlsson UO
961 - 965	Intrinsic Defects at TiO2(110) Surfaces Studied with Scanning-Tunneling-Microscopy Fischer S, Munz AW, Schierbaum KD, Gopel W
966 - 969	Scanning-Tunneling-Microscopy of the UO2(111) Surface Castell MR, Muggelberg C, Briggs GA, Goddard DT
970 - 973	Layer-by-Layer Etching of HgI2 Films and Crystals by Scanning Force Microscopy Lang HP, Erler B, Rossberg A, Piechotka M, Kaldis E, Guntherodt HJ
974 - 978	Growth of a Uniaxial Incommensurate C-60 Lattice on Ge(100)2X1 Klyachko D, Chen DM
979 - 981	Adsorption and Decomposition of C-60 Molecules on Si(111) Surfaces Chen D, Workman RK, Sarid D
982 - 987	Low-Coverage Adsorption of Sb-4 on Si(113) Studied by Scanning-Tunneling-Microscopy Mussig HJ, Dabrowski J, Arabczyk W, Hinrich S, Wolff G
988 - 991	Atomic-Hydrogen-Induced Ag Cluster Formation on Si(111)-Root-3X-Root-3-Ag Surface Observed by Scanning-Tunneling-Microscopy Oura K, Ohnishi H, Yamamoto Y, Katayama I, Ohba Y
992 - 994	Ga-Induced Restructuring of Si(112) and Si(337) Baski AA, Whitman LJ
995 - 999	Initial-Stages of in Adsorption on Si(111) 7X7 Lin XF, Mai HA, Chizhov I, Willis RF
1000 - 1004	Scanning-Tunneling-Microscopy of Sr Adsorption on the Si(100)-2X1 Surface Bakhtizin RZ, Kishimoto J, Hashizume T, Sakurai T
1005 - 1009	Pb/Si(111) Investigation at the Ultralow-Coverage Range Gomezrodriguez JM, Veuillen JY, Cinti RC
1010 - 1014	Submonolayer Pb Deposition on Si(100) Studied by Scanning-Tunneling-Microscopy Veuillen JY, Gomezrodriguez JM, Cinti RC
1015 - 1018	Studies of Low-Coverage Adsorption of Li on Si(001) - Observation of Negative Differential Resistance and Electron Trapping Johansson MK, Gray SM, Johansson LS
1019 - 1023	High-Temperature Scanning-Tunneling-Microscopy Study of the Li/Si(111) Surface Olthoff S, Welland ME
1024 - 1028	Island, Trimer, and Chain Formation on the Sb-Terminated GaAs(111)B Surface Moriarty P, Beton PH, Henini M, Woolf DA
1029 - 1031	Scanning-Tunneling-Microscopy Study of the Interfacial Structure of Nickel Silicides Yoshimura M, Shinabe S, Yao T
1032 - 1037	Interaction of Vinyltrimethylsilane with the Si(111)-(7X7) Surface Andersohn L, Kochanski GP, Norman JA, Hinch BJ
1038 - 1042	Combined Scanning-Tunneling-Microscopy and Infrared-Spectroscopy Study of the Interaction of Diborane with Si(001) Wang YJ, Shan J, Hamers RJ
1043 - 1047	Nanoscale Roughening of Si(001) by Oxide Desorption in Ultrahigh-Vacuum Gray SM, Johansson MK, Johansson LS
1048 - 1050	Initial-Stages of the Nitridation of the Si(111) Surface Observed by Scanning-Tunneling-Microscopy Yoshimura M, Takahashi E, Yao T
1051 - 1054	Adsorption and Reaction of No on Si(111) Studied by Scanning-Tunneling-Microscopy Rottger B, Kliese R, Neddermeyer H
1055 - 1059	Correlation Between Contact-Electrified Charge Groups on a Thin Silicon-Oxide Uchihashi T, Okusako T, Sugawara Y, Yamanishi Y, Oasa T, Morita S
1060 - 1063	Structure and Electronic States on Reduced BaTiO3 (100) Surface Observed by Scanning-Tunneling-Microscopy and Spectroscopy Bando H, Shimitzu T, Aiura Y, Haruyama Y, Oka K, Nishihara Y
1064 - 1069	Probing Complex Low-Dimensional Solids with Scanning Probe Microscopes - From Charge-Density Waves to High-Temperature Superconductivity Liu J, Huang JL, Lieber CM
1070 - 1074	Spatial and Energy Variation of the Local-Density of States in the Charge-Density-Wave Phase of 2H-NbSe2 Mallet P, Sacks W, Roditchev D, Defourneau D, Klein J
1075 - 1078	Moire Patterns in Scanning-Tunneling-Microscopy Images of Layered Materials Kobayashi K
1079 - 1082	Scanning Tunneling Microscope Investigations of Lead-Phthalocyanine on MoS2 Strohmaier R, Ludwig C, Petersen J, Gompf B, Eisenmenger W
1083 - 1089	Atomic-Force Microscopy of Mercury Iodide Crystal-Growth from Porous-Media at Room-Temperature Henderson DO, Tung YS, Mu R, Ueda A, Collins WE, Burger A, Chen KT, Frazier DO
1090 - 1095	Atomic-Force Microscopy Study of Mercuric Iodide Surfaces Tung YS, Henderson DO, Mu R, Collins WE, Chen KT, George MA, Burger A
1096 - 1104	Layered Heavy-Metal Iodides Examined by Atomic-Force Microscopy George MA, Chen KT, Collins WE, Burger A, Nason D, Boatner L
1105 - 1108	Surface-Morphology of Metalorganic Vapor-Phase Epitaxy-Grown InAs and InGaAs Observed by Atomic-Force Microscopy Hsu CC, Xu JB, Wilson IH
1109 - 1113	Molecular Arrangement of Copper Phthalocyanine on Hydrogen-Terminated Si(111) - Influence of Surface-Roughness Nakamura M, Morita Y, Mori Y, Ishitani A, Tokumoto H
1114 - 1116	Atomic-Scale Reaction Regulated in One-Dimensional Channels Evidenced by Scanning-Tunneling-Microscopy Matsumoto Y, Tanaka K
1117 - 1120	Tip-Induced Lifting of the Au(100) (Hex)-Phase Reconstruction in a Low-Temperature Ultrahigh-Vacuum Scanning Tunneling Microscope Buisset J, Rust HP, Schweizer EK, Cramer L, Bradshaw AM
1121 - 1125	Comparative-Study of the Interface Roughness of Ag/Au and Cu/Au Multilayers with Scanning-Tunneling-Microscopy and X-Ray-Diffraction Heyvaert I, Temst K, Vanhaesendonck C, Bruynseraede Y
1126 - 1130	Structure of Epitaxial Thin TiO2 Films on W(110) as Studied by Low-Energy-Electron Diffraction and Scanning-Tunneling-Microscopy Herman GS, Gallagher MC, Joyce SA, Peden CH
1131 - 1135	Equilibrium Morphology of Au(111) Vicinal Surfaces Revealed by Scanning-Tunneling-Microscopy Rousset S, Pourmir F, Gauthier S, Lacaze E, Sotto M, Klein J, Lecoeur J
1136 - 1140	Spatially and Rotationally Oriented Adsorption of Molecular Adsorbates on Ag(111) Investigated Using Cryogenic Scanning-Tunneling-Microscopy Chen X, Frank ER, Hamers RJ
1141 - 1144	Growth of NiO(100) Layers on Ag(100) - Characterization by Scanning-Tunneling-Microscopy Bertrams T, Neddermeyer H
1145 - 1148	Diffusion of Atoms on Au(111) by the Electric-Field Gradient in Scanning-Tunneling-Microscopy Mendez J, Gomezherrero J, Pascual JI, Saenz JJ, Soler JM, Baro AM
1149 - 1152	Vicinal Surfaces of Au(110) and Ag(110) Investigated by Scanning-Tunneling-Microscopy Li JT, Berndt R, Gaisch R, Schneider WD
1153 - 1156	Tapping Mode Atomic-Force Microscopy Observation of Self-Affine Fractal Roughness in Electrochemically Roughened Silver Electrode Surfaces Otsuka I, Iwasaki T
1157 - 1161	Atomic-Force Microscopy Investigations of Loaded Crack Tips in NiAl Goken M, Vehoff H, Neumann P
1162 - 1166	In-Situ Scanning Tunneling Microscope Investigation of Passivation and Stainless-Steels and Iron Schreyer A, Eng L, Bohni H
1167 - 1172	Vacuum Plasma-Sprayed Hydroxyapatite Coatings on Titanium-Alloy Substrates - Surface Characterization and Observation of Dissolution Processes Using Atomic-Force Microscopy Campbell PA, Gledhill HC, Brown SR, Turner IG
1173 - 1175	Scanning-Tunneling-Microscopy and Spectroscopy on Thin Fe3O4 (110) Films on MgO Jansen R, Vankempen H, Wolf RM
1176 - 1179	Spatially-Resolved Electron-Tunneling Spectroscopy on Single-Crystalline Rb3C60 Jess P, Hubler U, Behler S, Thommengeiser V, Lang HP, Guntherodt HJ
1180 - 1183	Surface-Structure of Ferroelectric Domains on the Triglycine Sulfate (010) Surface Bluhm H, Wiesendanger R, Meyer KP
1184 - 1187	Magnetic Force Microscopy Analysis of the Micromagnetization Mode of Double-Layered Perpendicular Magnetic Recording Media Homma T, Kurokawa Y, Nakamura T, Osaka T, Otsuka I
1188 - 1190	Growth-Structure of Fe on the Cu(001) Surface Noh HP, Choi YJ, Park JY, Jeong IC, Suh YD, Kuk Y
1191 - 1196	Deconvolution of Topographic and Ferroelectric Contrast by Noncontact and Friction Force Microscopy Eng LM, Friedrich M, Fousek J, Gunter P
1197 - 1201	Low-Temperature Magnetic-Resonance Force Detection Wago K, Zuger O, Kendrick R, Yannoni CS, Rugar D
1202 - 1205	Scanning Hall Probe Microscopy of Superconductors and Magnetic-Materials Oral A, Bending SJ, Henini M
1206 - 1209	Scanning Tunneling Microscope for Magnetooptical Imaging Prins MW, Groeneveld RH, Abraham DL, Schad R, Vankempen H, Vankesteren HW
1210 - 1213	Vortex Images in Thin-Films of YBa2Cu3O7-X and Bi2Sr2Ca1Cu2O8+x Obtained by Low-Temperature Magnetic Force Microscopy Yuan CW, Zheng Z, Delozanne AL, Tortonese M, Rudman DA, Eckstein JN
1214 - 1216	Domain-Structure of Co/Pt Multilayers Studied by Magnetic Force Microscopy Lohndorf M, Wadas A, Wiesendanger R, Vankesteren HW
1217 - 1220	Spectroscopic Study of the CuO Chains in YBa2Cu3O7-X Edwards H, Derro DJ, Barr AL, Markert JT, Delozanne AL
1221 - 1223	Schottky-Barrier Height Measurement on Nisi2/Si(100) by Capacitance Microscope Khang Y, Mang KM, Booh KH, Kuk Y
1224 - 1228	Scanning Tunneling Spectroscopy on Low-T-C and High-T-C Superconductors Mielke F, Memmert U, Golubov AA, Hartmann U
1229 - 1233	Observation of Coulomb Staircase and Negative Differential Resistance at Room-Temperature by Scanning-Tunneling-Microscopy Radojkovic P, Schwartzkopff M, Enachescu M, Stefanov E, Hartmann E, Koch F
1234 - 1237	Charge Injection and Extraction on Organic Dot Structures by Atomic-Force Microscopy Hieda H, Tanaka K, Gemma N
1238 - 1242	Role of Interface Microstructure in Rectifying Metal/Semiconductor Contacts - Ballistic-Electron-Emission Observations Correlated to Microstructure Morgan BA, Ring KM, Kavanagh KL, Talin AA, Williams RS, Yasuda T, Yasui T, Segawa Y
1243 - 1249	Energy-Band of Manipulated Atomic Structures on an Insulator Substrate Yamada T, Yamamoto Y, Harrison WA
1250 - 1254	Elastic Deformations of Tip and Sample During Atomic-Force Microscope Measurements Heuberger M, Dietler G, Schlapbach L
1255 - 1258	Friction Forces on Hydrogen Passivated (110) Silicon and Silicon Dioxide Studied by Scanning Force Microscopy Scandella L, Meyer E, Howald L, Luthi R, Guggisberg M, Gobrecht J, Guntherodt HJ
1259 - 1263	Study of Plastic-Flow in Ultrasmall Au Contacts Stalder A, Durig U
1264 - 1267	Influence of Humidity on Friction Measurements of Supported MoS2 Single Layers Schumacher A, Kruse N, Prins R, Meyer E, Luthi R, Howald L, Guntherodt HJ, Scandella L
1268 - 1271	Nanometer-Scale Modification of Tribomechanical Properties of Si(111)H Surfaces Performed and Investigated by a Conducting-Probe Scanning Force Microscope Teuschler T, Mahr K, Miyazaki S, Hundhausen M, Ley L
1272 - 1275	Study of Molecular Scale Friction on Stearic-Acid Crystals by Friction Force Microscopy Takano H, Fujihira M
1276 - 1279	Dewetting Dynamics and Nucleation of Polymers Observed by Elastic and Friction Force Microscopy Overney RM, Leta DP, Fetters LJ, Liu Y, Rafailovich MH, Sokolov J
1280 - 1284	Friction on the Atomic-Scale - An Ultrahigh-Vacuum Atomic-Force Microscopy Study on Ionic-Crystals Luthi R, Meyer E, Bammerlin M, Howald L, Haefke H, Lehmann T, Loppacher C, Guntherodt HJ, Gyalog T, Thomas H
1285 - 1288	Site-Specific Friction Force Spectroscopy Meyer E, Luthi R, Howald L, Bammerlin M, Guggisberg M, Guntherodt HJ
1289 - 1295	Measurement of Interfacial Shear (Friction) with an Ultrahigh-Vacuum Atomic-Force Microscope Carpick RW, Agrait N, Ogletree DF, Salmeron M
1296 - 1301	Scanning Force and Friction Microscopy at Highly Oriented Polycrystalline Graphite and Cup2(100) Surfaces in Ultrahigh-Vacuum Muller T, Kasser T, Labardi M, Luxsteiner M, Marti O, Mlynek J, Krausch G
1302 - 1307	Tip-Sample Interactions - Extraction of Single Molecular Pair Potentials from Force Curves Unger MA, Oconnor SD, Baldeschwieler JD
1308 - 1312	Materials Properties Measurements - Choosing the Optimal Scanning Probe Microscope Configuration Burnham NA, Gremaud G, Kulik AJ, Gallo PJ, Oulevey F
1313 - 1317	Transient-Response of Tapping Scanning Force Microscopy in Liquids Chen GY, Warmack RJ, Oden PI, Thundat T
1318 - 1321	Atomic-Force Microscopy Images Obtained with C-60 Modified Tips Kim SH, Park SK, Park C, Jeon IC
1322 - 1326	Direct Patterning of Si(001) Surfaces by Atomic Manipulation Salling CT
1327 - 1330	Low-Voltage Electron-Beam Lithography with Scanning-Tunneling-Microscopy in Air - A New Method for Producing Structures with High Aspect Ratios Kragler K, Gunther E, Leuschner R, Falk G, Vonseggern H, Saemannischenko G
1331 - 1335	Application of Scanning-Tunneling-Microscopy Nanofabrication Process to Single-Electron Transistor Matsumoto K, Ishii M, Segawa K
1336 - 1340	Electron-Stimulated Desorption of Hydrogen from the Si(111) Surface by Scanning-Tunneling-Microscopy Schwartzkopff M, Radojkovic P, Enachescu M, Hartmann E, Koch F
1341 - 1343	Imaging and Manipulation of Nanometer-Size Liquid Droplets by Scanning Polarization Force Microscopy Hu J, Carpick RW, Salmeron M, Xiao XD
1344 - 1348	Scanning-Tunneling-Microscopy Induced Chemical-Vapor-Deposition of Semiconductor Quantum Dots Samara D, Williamson JR, Shih CK, Banerjee SK
1349 - 1352	Ultrahigh Density Data-Storage on Ag-Tdcn Thin-Films by Scanning-Tunneling-Microscopy Gao HJ, Wang DW, Liu N, Xue ZQ, Pang SJ
1353 - 1355	Information-Storage Using Conductance Change of Langmuir-Blodgett-Film and Atomic-Force Microscope Scanning Tunneling Microscope Yano K, Kuroda R, Shimada Y, Shido S, Kyogaku M, Matsuda H, Takimoto K, Eguchi K, Nakagiri T
1356 - 1359	Critical Humidity for Removal of Atoms from the Gold Surface with Scanning-Tunneling-Microscopy Lebreton C, Wang ZZ
1360 - 1364	Morphology and Dissolution Processes of Metal Sulfide Minerals Observed with the Electrochemical Scanning Tunneling Microscope Higgins SR, Hamers RJ
1365 - 1368	Stability of Surface Atomic Structures of Ionic-Crystals Studied by Atomic-Force Microscopy Observation of Various Faces of CaSO4 Crystal in Solutions Shindo H, Seo A, Itasaka M, Odaki T, Tanaka K
1369 - 1372	Atomic Structures and Growth Mechanisms of Electrodeposited Ag and Te Films as Discerned by Atomic-Force Microscopy Ikemiya N, Yamada K, Hara S
1373 - 1377	In-Situ Studies of Potassium Hydrogen Phthalate Crystal Dissolution Using Scanning Probe Microscopy Campbell PA, Ester GR, Halfpenny PJ
1378 - 1382	Effects of Electric Potentials on Surface Forces in Electrolyte-Solutions Arai T, Fujihira M
1383 - 1385	Atomic-Force Microscopy Stress Sensors for Studies in Liquids Oshea SJ, Welland ME, Brunt TA, Ramadan AR, Rayment T
1386 - 1389	Approaching the Liquid/Air Interface with Scanning Force Microscopy Eng LM, Seuret C, Looser H, Gunter P
1390 - 1394	Atomic-Force Microscopy of Biomolecules Hansma HG
1395 - 1398	Atomic-Force Microscopy Observation of Native Neurons and Modifications Induced by Glutamate Cricenti A, Destasio G, Generosi R, Scarselli MA, Perfetti P, Ciotti MT, Mercanti D
1399 - 1404	Combination of Fluorescence in-Situ Hybridization and Scanning Force Microscopy for the Ultrastructural Characterization of Defined Chromatin Regions Fritzsche W, Takacs L, Vereb G, Schlammadinger J, Jovin TM
1405 - 1409	Reconstruction of Ribosomal-Subunits and rDNA Chromatin Imaged by Scanning Force Microscopy Fritzsche W, Martin L, Dobbs D, Jondle D, Miller R, Vesenka J, Henderson E
1410 - 1412	Atomic-Force Microscope Imaging of Ribosome and Chromosome Li MQ, Xu L, Ikai A
1413 - 1417	Atomic-Force Microscopy Reconstruction of G-Wire DNA Vesenka J, Marsh T, Miller R, Henderson E
1418 - 1421	Modified DNA Immobilized on Bioreactive Self-Assembled Monolayer on Gold for Dynamic Force Microscopy Imaging in Aqueous Buffer Solution Hegner M, Dreier M, Wagner P, Semenza G, Guntherodt HJ
1422 - 1426	Covalent Immobilization of Immunoglobulins-G and Fab’ Fragments on Gold Substrates for Scanning Force Microscopy Imaging in Liquids Droz E, Taborelli M, Descouts P, Wells TN, Werlen RC
1427 - 1431	Dynamical and Mechanical Study of Immobilized Microtubules with Atomic-Force Microscopy Vinckier A, Dumortier C, Engelborghs Y, Hellemans L
1432 - 1437	Hydrogen-Bonding Molecules and Their Effect on Scanning Tunneling Microscope Image-Contrast of Covalently Immobilized Protein Molecules Parker MC, Davies MC, Tendler SJ
1438 - 1443	Chromosome Classification by Atomic-Force Microscopy Volume Measurement Mcmaster TJ, Winfield MO, Baker AA, Karp A, Miles MJ
1444 - 1448	Improvements in Atomic-Force Microscopy Protocols for Imaging Fibrous Proteins Hallett P, Tskhovrebova L, Trinick J, Offer G, Miles MJ
1449 - 1452	Studying Membranes with Scanning Force Microscopy and Patch-Clamp Technique Mosbacher J, Haberle W, Horber JK
1453 - 1460	Butanethiol Self-Assembly on Au(001) - The 1X4 Au Missing-Row, C(2X8) Molecular Lattice Poirier GE
1461 - 1465	Comparative Scanning-Tunneling-Microscopy Observation of a Homologous Series of N-Alkyloxy-Cyanobiphenyles Walzer K, Hietschold M
1466 - 1471	Omega-Functionalized Self-Assembled Monolayers Chemisorbed on Ultraflat Au(111) Surfaces for Biological Scanning Probe Microscopy in Aqueous Buffers Wagner P, Zaugg F, Kernen P, Hegner M, Semenza G
1472 - 1475	Current Imaging Tunneling Spectroscopy of an Alkyl Cyanobiphenyl Liquid-Crystal Rivera M, Williamson RL, Miles MJ
1476 - 1480	Structural Investigation of Cytochrome-F Langmuir-Blodgett-Films with Scanning-Tunneling-Microscopy - Protein Aggregation Tazi A, Boussaad S, Derose JA, Leblanc RM
1481 - 1485	Atomic-Force Microscope Study of Chromatic Transitions in Polydiacetylene Thin-Films Lio A, Reichert A, Nagy JO, Salmeron M, Charych DH
1486 - 1491	Scanning Thermal Microscopy - Subsurface Imaging, Thermal Mapping of Polymer Blends, and Localized Calorimetry Hammiche A, Hourston DJ, Pollock HM, Reading M, Song M
1492 - 1497	Characterization of Mixed Miscible and Nonmiscible Phospholipid Langmuir-Blodgett-Films by Atomic-Force Microscopy Solletti JM, Botreau M, Sommer F, Duc TM, Celio MR
1498 - 1502	Scanning-Tunneling-Microscopy Based on the Conductivity of Surface-Adsorbed Water - Charge-Transfer Between Tip and Sample via Electrochemistry in a Water Meniscus or via Tunneling Heim M, Eschrich R, Hillebrand A, Knapp HF, Guckenberger R, Cevc G
1503 - 1508	Combined Scanning Force, Lateral Force, and Scanning Surface-Potential Microscopy on Phase-Separated Langmuir-Blodgett-Films Jacobi S, Chi LF, Fuchs H
1509 - 1512	Scanning Force Microscopy of Polyolefinic Rubbers in Homopolypropylene Matrices Labardi M, Allegrini M, Marchetti E, Sgarzi P
1513 - 1517	Minimizing the Size of Force-Controlled Point Contacts on Silicon for Carrier Profiling Snauwaert J, Blanc N, Dewolf P, Vandervorst W, Hellemans L
1518 - 1521	Scanned Probe Microscope Tip Characterization Without Calibrated Tip Characterizers Villarrubia JS
1522 - 1526	In-Situ Control and Analysis of the Scanning Tunneling Microscope Tip by Formation of Sharp Needles on the Si Sample and W Tip Heike S, Hashizume T, Wada Y
1527 - 1530	Pt-SnO2 Thin-Films for Gas Sensor Characterized by Atomic-Force Microscopy and X-Ray Photoemission Spectromicroscopy Cricenti A, Generosi R, Scarselli MA, Perfetti P, Siciliano P, Serra A, Tepore A, Almeida J, Coluzza C, Margaritondo G
1531 - 1535	International Intercomparison of Scanning-Tunneling-Microscopy Barbato G, Cameiro K, Cuppini D, Garnaes J, Gori G, Hughes G, Jenson CP, Jorgensen JF, Jusko O, Livi S, Mcquoid H, Nielsen L, Picotto GB, Wilkening G
1536 - 1539	Direct Imaging of SiO2 Thickness Variation on Si Using Modified Atomic-Force Microscope Mang KM, Khang Y, Park YJ, Kuk Y, Lee SM, Williams CC
1540 - 1546	Increasing the Value of Atomic-Force Microscopy Process Metrology Using a High-Accuracy Scanner, Tip Characterization, and Morphological Image-Analysis Schneir J, Villarrubia JS, Mcwaid TH, Tsai VW, Dixson R
1547 - 1551	Kelvin Probe Force Microscopy for Characterization of Semiconductor-Devices and Processes Tanimoto M, Vatel O
1552 - 1556	Blind Restoration Method of Scanning Tunneling and Atomic-Force Microscopy Images Dongmo S, Troyon M, Vautrot P, Delain E, Bonnet N
1557 - 1562	Blind Reconstruction of Scanning Probe Image Data Williams PM, Shakesheff KM, Davies MC, Jackson DE, Roberts CJ, Tendler SJ
1563 - 1568	Neural-Network Correction of Nonlinearities in Scanning Probe Microscope Images Hadjiiski L, Munster S, Oesterschulze E, Kassing R