865 - 868 |
Influence of preamorphization and recrystallization on indium doping profiles in silicon Duffy R, Venezia VC, Heringa A, Pawlak BJ, Hopstaken MJP, Tamminga Y, Dao T, Roozeboom F, Wang CC, Diaz CH, Griffin PB |
869 - 874 |
Useful protocol for evaluating subtle and important differences between photoresist formulations Pawloski AR, Nealey PF |
875 - 879 |
Fabrication of high-quality-factor photonic crystal microcavities in InAsP/InGaAsP membranes Srinivasan K, Barclay PE, Painter O, Chen JX, Cho AY |
880 - 887 |
In situ mass spectrometry in a 10 Torr W chemical vapor deposition process for film thickness metrology and real-time advanced process control Cho S, Henn-Lecordier L, Liu YJ, Rubloff GW |
888 - 892 |
Size and site controlled Ga nanodots on GaAs seeded by focused ion beams Lugstein A, Basnar B, Bertagnolli E |
893 - 901 |
Dependences of bottom and sidewall etch rates on bias voltage and source power during the etching of poly-Si and fluorocarbon polymer using SF6, C4F8, and O-2 plasmas Min JH, Lee GR, Lee JK, Moon SH, Kim CK |
902 - 908 |
Plasma silicon oxide-silica xerogel based planar optical waveguides Ponoth SS, Agarwal NT, Persans PD, Plawsky JL |
909 - 915 |
Batch fabrication and characterization of ultrasensitive cantilevers with submicron magnetic tips Jenkins NE, DeFlores LP, Allen J, Ng TN, Garner SR, Kuehn S, Dawlaty JM, Marohn JA |
916 - 919 |
Scaling down of ultrathin HfO2 gate dielectrics by using a nitrided Si surface Kang CS, Choi R, Cho HJ, Kim YH, Lee JC |
920 - 924 |
High precision determination of the elastic strain of InGaN/GaN multiple quantum wells Wu MF, Zhou SQ, Yao SD, Zhao Q, Vantomme A, Van Daele B, Piscopiello E, Van Tendeloo G, Tong YZ, Yang ZJ, Yu TJ, Zhang GY |
925 - 931 |
Structure-property relationships in porous GaN generated by Pt-assisted electroless etching studied by Raman spectroscopy Williamson TL, Diaz DJ, Bohn PW, Molnar RJ |
932 - 948 |
Recent advances in processing of ZnO Pearton SJ, Norton DP, Ip K, Heo YW, Steiner T |
949 - 952 |
Secondary ion mass spectrometry analysis of vertical cavity surface-emitting lasers Kim YK, Choquette KD, Baker JE, Allerman AA |
953 - 960 |
Hydrophobic/hydrophilic surface modification within buried air channels Salas-Vernis JL, Jayachandran JP, Park S, Kelleher HA, Allen SAB, Kohl PA |
961 - 965 |
Growth and characterization of compressive-strain GaInAsP/InP multiple-quantum-well laser diodes with the tensile-strain GaInP quantum barrier Wu MY, Lei PH, Tsai CL, Yang CD, Huang YH, Ho WJ, Wu MC |
966 - 970 |
Environment influence on Ti diffusion and layer degradation of a SiC/Ni2Si/TiW/Au contact structure Baeri A, Raineri V, La Via F, Puglisi V, Condorelli GG |
971 - 973 |
Reduction of ohmic contact on p-GaN with surface treatment using Cl-2 inductively coupled plasma Su SH, Tseng CT, Hau CC, Yokoyama M, Chen SM |
974 - 976 |
Enhancement-mode In0.52Al0.48As/In0.6Ga0.4As tunneling real space transfer high electron mobility transistor Chen YW, Chen YJ, Hsu WC, Hsu RT, Wu YH, Lin YS |
977 - 980 |
Fresnel diffraction mask for focus monitoring Yuito T, Watanabe H |
981 - 984 |
Room-temperature nanoimprinting on metallo-organic complexes Mele E, Pisignano D, Mazzeo M, Persano L, Gigli G, Cingolani R |
985 - 988 |
Multicolumn cell: Evaluation of the proof of concept system Haraguchi T, Sakazaki T, Satoh T, Nakano M, Hamaguchi S, Kiuchi T, Yabara H, Yasuda H |
989 - 992 |
Formation and blistering of GaAsN nanostructure layers Weng X, Ye W, Goldman RS, Mabon JC |
993 - 999 |
Influence of N2O plasma treatment on microstructure and thermal stability of WNx barriers for Cu interconnection Tsai KC, Wu WF, Chen JC, Pan TJ, Chao CG |
1000 - 1005 |
Measurements of shallow trench isolation by normal incidence optical critical dimension technique Hu JT, Korlahalli R, Shivaprasad D, Yang F, Zhang XD |
1006 - 1011 |
Characterization of material contrast and effective wavelength effects in immersion inspection Deng YF, Neureuther AR |
1012 - 1016 |
Investigation of Ge profile on SiGe islands by scanning photoelectron microscopy Cho MH, Cho YJ, Lee MK, Park SA, Roh YS, Kim YK, Jeong K, Kang SK, Ko DH, Shin HJ, Kwon KW |
1017 - 1021 |
Incorporation efficiency of carbon in GaAs using carbon tetrabromide in solid source molecular beam epitaxy Sun ZZ, Yoon SF, Tan KH, Zhang R, Jiang J |
1022 - 1029 |
Conduction and trapping mechanisms in SiO2 films grown near room temperature by multipolar electron cyclotron resonance plasma enhanced chemical vapor deposition Isai GI, Holleman J, Wallinga H, Woerlee PH |
1030 - 1036 |
Effects of O-2 and He on the properties of the trimethyl silane based low-k films Widodo J, Goh LN, Lu W, Mhaisalkar SG, Ong S, Sudijono JL, Hsia LC, Tan PY, Zeng KY |
1037 - 1043 |
Effect of developer molecular size on roughness of dissolution front in electron-beam resist Yamaguchi T, Namatsu H |
1044 - 1047 |
Characteristics of In0.52Al0.48As/InxGa1-xAsyP1-y/ In0.52Al0.48As high electron-mobility transistors Chen YW, Hsu WC, Chen YJ, Hsu RT, Wu YH, Lin YS |
1048 - 1051 |
Enhanced cold field emission from 100 oriented beta-W nanoemitters Singh JP, Tang F, Karabacak T, Lu TM, Wang GC |
1052 - 1059 |
Deep-ultraviolet resist contamination for copper/low-k dual-damascene patterning Kumar R, Singh N, Chang CK, Dong L, Wong TKS |
1060 - 1066 |
Sulfur and low-temperature SiNx passivation of self-aligned graded-base InGaAs/InP heterostructure bipolar transistors Jin Z, Prost W, Neumann S, Tegude FJ |
1067 - 1074 |
Alkylation of nanoporous silica thin films by high density plasma chemical vapor deposition of a-SIC : H Pan FM, Wu BW, Cho AT, Tsai KC, Tsai TG, Chao KJ, Chen JY, Chang L |
1075 - 1081 |
Influence of the preferred orientation and thickness of zirconium nitride films on the diffusion property in copper Chen CS, Liu CP, Yang HG, Tsao CYA |
1082 - 1085 |
Evolution of tungsten-oxide whiskers synthesized by a rapid thermal-annealing treatment Cho MH, Park SA, Yang KD, Lyo IW, Jeong K, Kang SK, Ko DH, Kwon KW, Ku JH, Choi SY, Shin HJ |
1086 - 1091 |
Improvement of the morphological stability of Ni-silicided Si0.8Ge0.2 layers by using a molybdenum interlayer Ok YW, Kim SH, Song YJ, Shim KH, Seong TY |
1092 - 1098 |
Interface bonding structure of hafniurn oxide prepared by direct sputtering of hafnium in oxygen Wong H, Ng KL, Zhan N, Poon MC, Kok CW |
1099 - 1105 |
Simulation of field-emitted electron trajectories and transport from carbon nanotubes Walker DG, Zhang W, Fisher TS |
1106 - 1111 |
Characterization of electroplated copper films for three-dimensional advanced packaging Seah CH, You GZ, Li CY, Kumar R |
1112 - 1117 |
Electron-beam lithography with aromatic self-assembled monolayers on silicon surfaces Kuller A, El-Desawy MA, Stadler V, Geyer W, Eck W, Golzhauser A |
1118 - 1122 |
Fabrication and characterization of a condenser zone plate for compact x-ray microscopy Rehbein S, Holmberg A, Johansson GA, Jansson PAC, Hertz HM |
1123 - 1126 |
Sub-100 nm organic light-emitting diodes patterned with room temperature imprint lithography Suh D, Lee HH |
1127 - 1133 |
Preparation of highly textured Mo and AIN films using a Ti seed layer for integrated high-Q film bulk acoustic resonators Lee HC, Park JY, Lee KH, Bu JU |
1134 - 1140 |
Zirconium nitride/silver nanocomposite structures for biomedical applications Aouadi SM, Debessai M, Filip P |
1141 - 1144 |
Characterization of a-Si : H resists for a vacuum-compatible photolithography process Jacobs RN, Stoltz AJ, Dinan JH, Salamanca-Riba L |
1145 - 1149 |
Effect of carbon doping on buffer leakage in AlGaN/GaN high electron mobility transistors Poblenz C, Waltereit P, Rajan S, Heikman S, Mishra UK, Speck JS |
1150 - 1159 |
Photomask Cr-MoSi etching Wu BQ |
1160 - 1162 |
Fabrication of three-dimensional microstructures using standard ultraviolet and electron-beam lithography Galas JC, Belier B, Aassime A, Palomo J, Bouville D, Aubert J |
1163 - 1173 |
Improved method for measuring photoacid generator kinetics in polymer thin films using normalized interdigitated electrode capacitance data Berger CM, Henderson CL |
1174 - 1178 |
Composite thin films of (ZrO2)(x)-(Al2O3)(1-x) for high transmittance attenuated phase shifting mask in ArF optical lithography Lai FD |
1179 - 1183 |
Oxide formation during ion bombardment of small silicon structures Kruger D, Formanek P, Pippel E, Woltersdorf J, Bugiel E, Kurps R, Weidner G |
1184 - 1190 |
Advanced techniques for the fabrication of square spiral photonic crystals by glancing angle deposition Kennedy SR, Brett MJ |
1191 - 1195 |
ZnO-based thin-film transistors of optimal device performance Bae HS, Im S |
1196 - 1201 |
Method to improve chemical-mechanical-planarization polishing rate of low-k methyl-silsesquiazane for ultralarge scale integrated interconnect application Chang TC, Tsai TM, Liu PT, Yan ST, Chang YC, Aoki H, Sze SM, Tseng TY |
1202 - 1205 |
Design of a complementary-metal-oxide-semiconductor-compatible field-emission magnetic sensor with adjustable sensitivity Garner DM, French RJ, Hui G, Fung A |
1206 - 1209 |
Improved quality and reliability of ultrathin (1.4-2.3 nm) gate oxides by radical-assisted oxidation utilizing a remote ultraviolet ozone source Song YJ, Mheen B, Kim SH, Bae HC, Kang JY, Lee YS, Lee NE, Shim KH |
1210 - 1212 |
Rapid repair of plasma ash damage in low-k dielectrics using supercritical CO2 Gorman BP, Orozco-Teran RA, Zhang Z, Matz PD, Mueller DW, Reidy RF |
1213 - 1213 |
Chiral pattern formation: Combined transmission electron microscopy and atomic force microscopy study of tetracyanoquinodimethane thin film grown by vacuum evaporation (vol 20, pg 673, 2002) Li JC, Liu WM, Xue ZQ |
1214 - 1214 |
Investigation of various copper seed layers for copper electrodeposition applicable to ultralarge-scale integration interconnection (vol 21, pg 33, 2003) Kim JJ, Kim SK, Lee CH, Kim YS |
1217 - 1217 |
Papers from the 16th International Vacuum Microelectronics Conference -7-11 July 2003 - Osaka, Japan - Preface Takai M |
1218 - 1221 |
Photoresponse of a p-type Si field emitter Mimura H, Ukeba T, Shimawaki H, Yokoo K |
1222 - 1226 |
Extraction of emission area from Fowler-Nordheim plots Forbes RG, Deane JHB, Hamid N, Sim HS |
1227 - 1233 |
Characterization of enhanced field emission from HfC-coated Si emitter arrays through parameter extraction Nicolaescu D, Sato T, Nagao M, Filip V, Kanemaru S, Itoh J |
1234 - 1239 |
Analytical model for electron field emission from capped carbon nanotubes Filip V, Nicolaescu D, Tanemura M, Okuyama F |
1240 - 1243 |
Theoretical analysis of the enhanced electric field at the triple junction Chung MS, Yoon BG, Cutler PH, Miskovsky NM |
1244 - 1249 |
Simulation study of carbon nanotube field emission display with under-gate and planar-gate structures Lan YC, Lee CT, Hu Y, Chen SH, Lee CC, Tsui BY, Lin TL |
1250 - 1257 |
Modeling of emitted current distribution and electron trajectories in the thin-film field-emission triode Garner DM |
1258 - 1260 |
Remarkably low value of work function on W(100) produced by Y-O composite layer Kawakubo T, Saito Y, Miyamoto N, Nakane H, Adachi H |
1261 - 1265 |
Electron emission from carbon black-based field emitters including diesel engine exhaust Busta H, Boldridge D, Myers R, Snider G, Korotkov A, Edwards E, Feinerman A |
1266 - 1268 |
Characteristics of nano electron source fabricated using beam assisted process Murakami K, Takai M |
1269 - 1272 |
Synthesis and field-emission testing of carbon nanoflake edge emitters Wang JJ, Zhu MY, Zhao X, Outlaw RA, Manos DM, Holloway BC, Park C, Anderson T, Mammana VP |
1273 - 1276 |
Microelectron field emitter array with focus lenses for multielectron beam lithography based on silicon on insulator wafer Minh PN, Ono T, Sato N, Mimura H, Esashi M |
1277 - 1281 |
Quadrupole-mass-spectroscopy studies on hot-filament chemical vapor deposition of carbon films with nanosized constituents Choi S, Lee S, Koh KH |
1282 - 1285 |
Growth of aligned Cu2S nanowire arrays with AAO template and their field-emission properties Wu QB, Ren S, Deng SZ, Chen J, Xu NS |
1286 - 1289 |
Carbon nanotube growth from Cu-Co alloys for field emission applications Hofmeister W, Kang WP, Wong YM, Davidson JL |
1290 - 1293 |
Formation of graphite nanocones using metal nanoparticles as plasma etching masks Park H, Choi S, Lee S, Koh KH |
1294 - 1297 |
Fabrication of low-gate-current triode field emitters with planar carbon nanoparticle cathodes Seo WJ, Choi SH, Lee SN, Koh KH |
1298 - 1302 |
Tungsten pedestal structure for nanotriode devices Blackburn AM, Hasko DG, Ahmed H, Williams DA |
1303 - 1307 |
Double-gate field emitters with planar carbon-nanoparticle cathodes: Simulation studies Bae S, Seo WJ, Choi S, Lee S, Koh KH |
1308 - 1311 |
Synthesis of very dense carbon nanotube bundles using silica supported metal catalyst Yim JH, Choi S, Lee S, Koh KH |
1312 - 1314 |
Interference fringes observed in electron emission patterns of a multiwalled carbon nanotube Hata K, Takakura A, Miura K, Ohshita A, Saito Y |
1315 - 1318 |
Field emission from carbon nanotube Mat Zhao WJ, Rochanachivapar W, Takai M |
1319 - 1326 |
Competition of nitrogen doping and graphitization effect for field electron emission from nanocrystalline diamond films Karabutov AV, Konov VI, Pereverzev VG, Vlasov II, Zavedeev EV, Pimenov SM |
1327 - 1330 |
Electron emission from heavily nitrogen-doped heteroepitaxial chemical vapor deposition diamond Okano K, Mine T, Saito I, Yamaguchi H, Yamada T, Sawabe A |
1331 - 1334 |
Efficient electron emissions from printed carbon nanotubes by surface treatments Kim KB, Song YH, Hwang CS, Chung CH, Lee JH, Choi IS, Park JH |
1335 - 1337 |
Fabrication of carbon nanotube array and its field emission property Sato H, Takegawa H, Yamaji H, Miyake H, Hiramatsu K, Saito Y |
1338 - 1341 |
Field-emission characteristics from carbon nanotube field emitter arrays grown on silicon emitters Yoshimoto T, Kamimaru D, Iwasaki H, Iwata T, Matsumoto K |
1342 - 1344 |
Improvement in electron emission from carbon nanotube cathodes after Ar plasma treatment Kanazawa Y, Oyama T, Murakami K, Takai M |
1345 - 1348 |
Relationship between field emission property and composition of carbon nanotube paste for large area cold cathode Kang SK, Choi JH, Park JH, Han JH, Yoo JB, Nam JW, Lee CK, Kim JM |
1349 - 1352 |
Schottky emitter using boron-doped diamond Bae JH, Minh PN, Ono T, Esashi M |
1353 - 1357 |
Field emission characteristics of defect-controlled polyimide tunneling cathode Baba A, Yoshida T, Asano T |
1358 - 1361 |
Planar metal-insulator-semiconductor type field emitter fabricated on an epitaxial Al/Al2O3/Si(111) structure Kim JS, Hoshi T, Sawada K, Ishida M |
1362 - 1366 |
Development of field emission displays Itoh S, Tanaka M, Tonegawa T |
1367 - 1371 |
Development of an advanced high efficiency electro-emission device Sakemura K, Negishi N, Yamada T, Satoh H, Watanabe A, Yoshikawa T, Ogasawara K, Koshida N |
1372 - 1376 |
Correlation between nanostructure and electron emission characteristics of a ballistic electron surface-emitting device Ichihara T, Baba T, Komoda T, Koshida N |
1377 - 1381 |
Fabrication of carbon-nanotube field-emitter array using polymer insulator Nishimura K, Shen ZY, Fujikawa M, Hosono A, Hashimoto N, Kawamoto S, Watanabe S, Nakata S |
1382 - 1385 |
Luminescent properties of SrGa2S4 : Sm thin-film phosphors under low-voltage excitation Iwamaru M, Nakajima H, Kominami H, Nakanishi Y, Hatanaka Y |
1386 - 1389 |
Synthesis of Zn-doped Y2O3 : Eu fine-particle phosphor by the sol-gel method Kominami H, Eguchi C, Kottaisamy M, Nakanishi Y, Hatanaka Y |
1390 - 1395 |
256X192 pixel field emitter array image sensor with high-gain avalanche rushing amorphous photoconductor target Takiguchi Y, Nanba M, Osada K, Watabe T, Okazabi S, Egami N, Tanioka K, Tanaka M, Itoh S |
1396 - 1401 |
Electron emission characteristics from a single crystalline ferroelectric material by an infrared light irradiation Takamuro D, Takao H, Sawada K, Ishida M |
1402 - 1406 |
Integration of field emitters into scanning probe microscopy sensors using focused ion and electron beams Lehrer C, Frey L, Petersen S, Ryssel H, Schafer M, Sulzbach T |
1407 - 1410 |
Optimization of silicon field-emission arrays fabrication for space applications Wang L, Stevens R, Huq E, Loader I, Kent B, Aplin K, She JC |
1411 - 1415 |
Adsorption of alkanethiol molecules onto carbon nanotube surface Roh S, Oh J, Choi Y, Sohn D, Kim W, Cho C, Yi W, Yoo J, Lee C, Kim J |
1416 - 1419 |
Conductivity change of carbon nanotube with strong electron-donating and withdrawing molecules Oh J, Roh S, Yi W, Lee H, Yoo J |
1427 - 1427 |
An international journal devoted to Microelectronics and Nanometer Structures - Processing, Measurement, and Phenomena - Preface Goodhue W |
1428 - 1431 |
Selective epitaxial growth of GaAs on Si with strained short-period superlattices by molecular beam epitaxy under atomic hydrogen irradiation Tsuji T, Yonezu H, Ohshima N |
1432 - 1435 |
Reduced interface reaction during the epitaxial Fe growth on InAs for high efficiency spin injection Yoh K, Ohno H, Sueoka K, Ramsteiner ME |
1436 - 1440 |
Sb-mediated growth of n- and p-type AlGaAs by molecular beam epitaxy Johnson SR, Sadofyev YG, Ding D, Cao Y, Chaparro SA, Franzreb K, Zhang YH |
1441 - 1443 |
Selective growth Of C-60/GaAs and the optical characteristic Ogawa M, Nishinaga J, Kida Y, Yamagata H, Aihara T, Horikoshi Y |
1444 - 1449 |
Growth of Be-doped GaInP/GaAs heterostructure bipolar transistor by all solid-source multiwafer production molecular beam epitaxy Wilk A, Zaknoune M, Godey S, Dhellemmes S, Gerard P, Chaix C, Mollot F |
1450 - 1454 |
Single-phase growth studies of GaP on Si by solid-source molecular beam epitaxy Yu XJ, Kuo PS, Ma K, Levi O, Fejer MM, Harris JS |
1455 - 1459 |
Epitaxial growth on gas cluster ion-beam processed GaSb substrates using molecular-beam epitaxy Krishnaswami K, Vangala SR, Zhu B, Goodhue WD, Allen LP, Santeufemio C, Liu X, Ospina MC, Whitten J, Sung C, Dauplaise H, Bliss D, Dallas G, Bakken D, Jones KS |
1460 - 1462 |
Molecular beam epitaxial growth of mid-infrared InGaAsSb laser diodes on indium-free GaSb substrates Pei CW, Heroux JB, Wang WI |
1463 - 1467 |
Solid-source molecular-beam epitaxy growth of GaInNAsSb/InGaAs single quantum well on InP with photoluminescence peak wavelength at 2.04 mu m Fu JX, Bank SR, Wistey MA, Yuen HB, Harris JS |
1468 - 1471 |
Molecular beam epitaxial growth of AlGaPSb and AlGaPSb/InP distributed Bragg reflectors on InP Klem JF, Serkland DK, Kim J, Wang TY |
1472 - 1474 |
Effect of buffer layer on InSb quantum wells grown on GaAs (001) substrates Mishima TD, Santos MB |
1475 - 1478 |
Investigation of radiative and nonradiative trap centers in ZnSe : Al layers grown by molecular beam epitaxy Oh DC, Makino H, Hanada T, Cho MW, Yao T, Song JS, Chang JH, Lu F |
1479 - 1483 |
Low-temperature Si growth on Si (001): Impurity incorporation and limiting thickness for epitaxy Baribeau JM, Wu X, Lockwood DJ, Tay L, Sproule GI |
1484 - 1486 |
Molecular beam epitaxy growth of ZnO using initial Zn layer and MgO buffer layer on Si(111) substrates Fujita M, Kawamoto N, Sasajima M, Horikoshi Y |
1487 - 1490 |
Effect of Ga-rich growth conditions on the optical properties of GaN films grown by plasma-assisted molecular beam epitaxy Sampath AV, Garrett GA, Collins CJ, Boyd P, Choe J, Newman PG, Shen H, Wraback M, Molnar RJ, Caissie J |
1491 - 1494 |
Probing the electronic structures of III-V-nitride semiconductors by x-ray photoelectron spectroscopy Lay TS, Kuo WT, Chen LP, Lai YH, Hung WH, Wang JS, Chi JY, Shih DK, Lin HH |
1495 - 1498 |
Similarities between Ga0.48In0.52NyP1-y and Ga0.92In0.08NyAs1-y grown on GaAs (001) substrates Hong YG, Nishikawa A, Tu CW |
1499 - 1502 |
Heterostructures for achieving large responsivity in InAs/GaAs quantum dot infrared photodetectors Chakrabarti S, Stiff-Roberts AD, Bhattacharya P, Kennerly SW |
1503 - 1507 |
Improvement on the InAs quantum dot size distribution employing high-temperature GaAs(100) substrate treatment Saucedo-Zeni N, Gorbatchev AY, Mendez-Garcia VH |
1508 - 1511 |
Temperature stabilized 1.55 mu m photoluminescence in InAs quantum dots grown on InAlGaAs/InP Zhang ZH, Cheng KY |
1512 - 1514 |
Study of structural and optical properties of quantum dots-in-a-well heterostructures Rotella P, von Winckel G, Raghavan S, Stintz A, Jiang Y, Krishna S |
1515 - 1517 |
Temperature dependence of optical properties of Ga0.3In0.7NxAs1-x quantum dots grown on GaAs (001) Nishikawa A, Hong YG, Tu CW |
1518 - 1522 |
CdSe quantum dots grown on ZnSe and Zn0.97Be0.03Se by molecular-beam epitaxy: Optical studies Zhou XC, Munoz M, Guo SP, Tamargo MC, Gu Y, Kuskovsky IL, Neumark GF |
1523 - 1525 |
Photoconductive characteristics in a trench-type InGaAs quantum-wire field effect transistor Jang KY, Sugaya T, Hahn CK, Ogura M, Komori K, Shinoda A, Yonei K |
1526 - 1528 |
Polarization control of vertical cavity surface emitting laser structure by using self-organized quantum wires grown on (775)B-oriented GaAs substrate by molecular beam epitaxy Ohno Y, Shimomura S, Hiyamizu S, Takasuka Y, Ogura M, Komori K |
1529 - 1533 |
Analysis of atomic structure in InAs quantum dashes grown on AlGaAsSb metamorphic buffers Balakrishnan G, Huang SH, Dawson LR, Huffaker DL |
1534 - 1538 |
Studies of oxide desorption from GaAs substrates via Ga2O3 to Ga2O conversion by exposure to Ga flux Wasilewski ZR, Baribeau JM, Beaulieu M, Wu X, Sproule GI |
1539 - 1543 |
Real-time stress evolution during growth of InxAl1-xAs/GaAs metamorphic buffer layers Lynch C, Beresford R, Chason E |
1544 - 1548 |
Influence of N-2 background pressure on the incorporation of arsenic during molecular beam epitaxy growth of GaAs Dieing T, Usher BF |
1549 - 1553 |
Flux profile modeling: Monte Carlo simulation and numerical computation Venkat R, Pemmireddy BR, Vijayagopal R, Cheng H, Bresnahan R |
1554 - 1557 |
Material properties and performance of metamorphic optoelectronic integrated circuits grown by molecular beam epitaxy on GaAs substrates Hoke WE, Leoni RE, Whelan CS, Kennedy TD, Torabi A, Marsh PF, Zhang Y, Xu C, Hsieh KC |
1558 - 1561 |
Molecular-beam epitaxy growth of quantum cascade lasers on (111)B substrates for second harmonic generation Marcadet X, Ortiz V, Bengloan JY, Dhillon S, Calligaro M, Sirtori C |
1562 - 1564 |
GaInNAs(Sb) vertical-cavity surface-emitting lasers at 1.460 mu m Wistey MA, Bank SR, Yuen HB, Goddard LL, Harris JS |
1565 - 1569 |
Comparison of As- and P-based metamorphic buffers for high performance InP heterojunction bipolar transistor and high electron mobility transistor applications Lubyshev D, Fastenau JM, Fang XM, Wu Y, Doss C, Snyder A, Liu WK, Lamb MSM, Bals S, Song C |
1570 - 1574 |
Metamorphic 6.00 A heterojunction bipolar transistors on InP by molecular-beam epitaxy Lange MD, Cavus A, Monier C, Sandhu RS, Block TR, Gambin VF, Sawdai DJ, Gutierrez-Aitken AL |
1575 - 1579 |
Correlating growth conditions with photoluminescence and lasing properties of mid-IR antimonide type II "W" structures Canedy CL, Boishin GI, Bewley WW, Kim CS, Vurgaftman I, Kim M, Lindle JR, Meyer JR, Whitman LJ |
1580 - 1583 |
Terahertz magneto-photoconductive characterization of hydrogenic barrier donors in GaAs/AlGaAs epitaxial thin films Naweed A, Goodhue WD, Gorveatt WJ, Giles R, Waldman J, Menon V |
1584 - 1587 |
Positron annihilation study of vacancies in GaInNAs Ptak AJ, Kurtz S, Weber MH, Lynn KG |
1588 - 1592 |
Use of transmission electron microscopy in the characterization of GaInNAs(Sb) quantum well structures grown by molecular beam epitaxy Gugov T, Gambin V, Wistey M, Yuen H, Bank S, Harris JS |
1593 - 1597 |
Combined x-ray diffraction/scanning tunneling microscopy study of segregation and interfacial bonding in type-II heterostructures Zhong M, Steinshnider J, Weimer M, Kaspi R |
1598 - 1601 |
Compositional analysis of graded AlxGa(1-x)As layers by x-ray energy dispersive spectrometry Mahalingam K, Wheeler R, Taferner WT, Eyink KG, Fenstermaker ST, Solomon JS |