화학공학소재연구정보센터

Journal of Vacuum Science & Technology B

Journal of Vacuum Science & Technology B, Vol.22, No.3 Entire volume, number list
ISSN: 1071-1023 (Print) 

In this Issue (148 articles)

865 - 868 Influence of preamorphization and recrystallization on indium doping profiles in silicon
Duffy R, Venezia VC, Heringa A, Pawlak BJ, Hopstaken MJP, Tamminga Y, Dao T, Roozeboom F, Wang CC, Diaz CH, Griffin PB
869 - 874 Useful protocol for evaluating subtle and important differences between photoresist formulations
Pawloski AR, Nealey PF
875 - 879 Fabrication of high-quality-factor photonic crystal microcavities in InAsP/InGaAsP membranes
Srinivasan K, Barclay PE, Painter O, Chen JX, Cho AY
880 - 887 In situ mass spectrometry in a 10 Torr W chemical vapor deposition process for film thickness metrology and real-time advanced process control
Cho S, Henn-Lecordier L, Liu YJ, Rubloff GW
888 - 892 Size and site controlled Ga nanodots on GaAs seeded by focused ion beams
Lugstein A, Basnar B, Bertagnolli E
893 - 901 Dependences of bottom and sidewall etch rates on bias voltage and source power during the etching of poly-Si and fluorocarbon polymer using SF6, C4F8, and O-2 plasmas
Min JH, Lee GR, Lee JK, Moon SH, Kim CK
902 - 908 Plasma silicon oxide-silica xerogel based planar optical waveguides
Ponoth SS, Agarwal NT, Persans PD, Plawsky JL
909 - 915 Batch fabrication and characterization of ultrasensitive cantilevers with submicron magnetic tips
Jenkins NE, DeFlores LP, Allen J, Ng TN, Garner SR, Kuehn S, Dawlaty JM, Marohn JA
916 - 919 Scaling down of ultrathin HfO2 gate dielectrics by using a nitrided Si surface
Kang CS, Choi R, Cho HJ, Kim YH, Lee JC
920 - 924 High precision determination of the elastic strain of InGaN/GaN multiple quantum wells
Wu MF, Zhou SQ, Yao SD, Zhao Q, Vantomme A, Van Daele B, Piscopiello E, Van Tendeloo G, Tong YZ, Yang ZJ, Yu TJ, Zhang GY
925 - 931 Structure-property relationships in porous GaN generated by Pt-assisted electroless etching studied by Raman spectroscopy
Williamson TL, Diaz DJ, Bohn PW, Molnar RJ
932 - 948 Recent advances in processing of ZnO
Pearton SJ, Norton DP, Ip K, Heo YW, Steiner T
949 - 952 Secondary ion mass spectrometry analysis of vertical cavity surface-emitting lasers
Kim YK, Choquette KD, Baker JE, Allerman AA
953 - 960 Hydrophobic/hydrophilic surface modification within buried air channels
Salas-Vernis JL, Jayachandran JP, Park S, Kelleher HA, Allen SAB, Kohl PA
961 - 965 Growth and characterization of compressive-strain GaInAsP/InP multiple-quantum-well laser diodes with the tensile-strain GaInP quantum barrier
Wu MY, Lei PH, Tsai CL, Yang CD, Huang YH, Ho WJ, Wu MC
966 - 970 Environment influence on Ti diffusion and layer degradation of a SiC/Ni2Si/TiW/Au contact structure
Baeri A, Raineri V, La Via F, Puglisi V, Condorelli GG
971 - 973 Reduction of ohmic contact on p-GaN with surface treatment using Cl-2 inductively coupled plasma
Su SH, Tseng CT, Hau CC, Yokoyama M, Chen SM
974 - 976 Enhancement-mode In0.52Al0.48As/In0.6Ga0.4As tunneling real space transfer high electron mobility transistor
Chen YW, Chen YJ, Hsu WC, Hsu RT, Wu YH, Lin YS
977 - 980 Fresnel diffraction mask for focus monitoring
Yuito T, Watanabe H
981 - 984 Room-temperature nanoimprinting on metallo-organic complexes
Mele E, Pisignano D, Mazzeo M, Persano L, Gigli G, Cingolani R
985 - 988 Multicolumn cell: Evaluation of the proof of concept system
Haraguchi T, Sakazaki T, Satoh T, Nakano M, Hamaguchi S, Kiuchi T, Yabara H, Yasuda H
989 - 992 Formation and blistering of GaAsN nanostructure layers
Weng X, Ye W, Goldman RS, Mabon JC
993 - 999 Influence of N2O plasma treatment on microstructure and thermal stability of WNx barriers for Cu interconnection
Tsai KC, Wu WF, Chen JC, Pan TJ, Chao CG
1000 - 1005 Measurements of shallow trench isolation by normal incidence optical critical dimension technique
Hu JT, Korlahalli R, Shivaprasad D, Yang F, Zhang XD
1006 - 1011 Characterization of material contrast and effective wavelength effects in immersion inspection
Deng YF, Neureuther AR
1012 - 1016 Investigation of Ge profile on SiGe islands by scanning photoelectron microscopy
Cho MH, Cho YJ, Lee MK, Park SA, Roh YS, Kim YK, Jeong K, Kang SK, Ko DH, Shin HJ, Kwon KW
1017 - 1021 Incorporation efficiency of carbon in GaAs using carbon tetrabromide in solid source molecular beam epitaxy
Sun ZZ, Yoon SF, Tan KH, Zhang R, Jiang J
1022 - 1029 Conduction and trapping mechanisms in SiO2 films grown near room temperature by multipolar electron cyclotron resonance plasma enhanced chemical vapor deposition
Isai GI, Holleman J, Wallinga H, Woerlee PH
1030 - 1036 Effects of O-2 and He on the properties of the trimethyl silane based low-k films
Widodo J, Goh LN, Lu W, Mhaisalkar SG, Ong S, Sudijono JL, Hsia LC, Tan PY, Zeng KY
1037 - 1043 Effect of developer molecular size on roughness of dissolution front in electron-beam resist
Yamaguchi T, Namatsu H
1044 - 1047 Characteristics of In0.52Al0.48As/InxGa1-xAsyP1-y/ In0.52Al0.48As high electron-mobility transistors
Chen YW, Hsu WC, Chen YJ, Hsu RT, Wu YH, Lin YS
1048 - 1051 Enhanced cold field emission from 100 oriented beta-W nanoemitters
Singh JP, Tang F, Karabacak T, Lu TM, Wang GC
1052 - 1059 Deep-ultraviolet resist contamination for copper/low-k dual-damascene patterning
Kumar R, Singh N, Chang CK, Dong L, Wong TKS
1060 - 1066 Sulfur and low-temperature SiNx passivation of self-aligned graded-base InGaAs/InP heterostructure bipolar transistors
Jin Z, Prost W, Neumann S, Tegude FJ
1067 - 1074 Alkylation of nanoporous silica thin films by high density plasma chemical vapor deposition of a-SIC : H
Pan FM, Wu BW, Cho AT, Tsai KC, Tsai TG, Chao KJ, Chen JY, Chang L
1075 - 1081 Influence of the preferred orientation and thickness of zirconium nitride films on the diffusion property in copper
Chen CS, Liu CP, Yang HG, Tsao CYA
1082 - 1085 Evolution of tungsten-oxide whiskers synthesized by a rapid thermal-annealing treatment
Cho MH, Park SA, Yang KD, Lyo IW, Jeong K, Kang SK, Ko DH, Kwon KW, Ku JH, Choi SY, Shin HJ
1086 - 1091 Improvement of the morphological stability of Ni-silicided Si0.8Ge0.2 layers by using a molybdenum interlayer
Ok YW, Kim SH, Song YJ, Shim KH, Seong TY
1092 - 1098 Interface bonding structure of hafniurn oxide prepared by direct sputtering of hafnium in oxygen
Wong H, Ng KL, Zhan N, Poon MC, Kok CW
1099 - 1105 Simulation of field-emitted electron trajectories and transport from carbon nanotubes
Walker DG, Zhang W, Fisher TS
1106 - 1111 Characterization of electroplated copper films for three-dimensional advanced packaging
Seah CH, You GZ, Li CY, Kumar R
1112 - 1117 Electron-beam lithography with aromatic self-assembled monolayers on silicon surfaces
Kuller A, El-Desawy MA, Stadler V, Geyer W, Eck W, Golzhauser A
1118 - 1122 Fabrication and characterization of a condenser zone plate for compact x-ray microscopy
Rehbein S, Holmberg A, Johansson GA, Jansson PAC, Hertz HM
1123 - 1126 Sub-100 nm organic light-emitting diodes patterned with room temperature imprint lithography
Suh D, Lee HH
1127 - 1133 Preparation of highly textured Mo and AIN films using a Ti seed layer for integrated high-Q film bulk acoustic resonators
Lee HC, Park JY, Lee KH, Bu JU
1134 - 1140 Zirconium nitride/silver nanocomposite structures for biomedical applications
Aouadi SM, Debessai M, Filip P
1141 - 1144 Characterization of a-Si : H resists for a vacuum-compatible photolithography process
Jacobs RN, Stoltz AJ, Dinan JH, Salamanca-Riba L
1145 - 1149 Effect of carbon doping on buffer leakage in AlGaN/GaN high electron mobility transistors
Poblenz C, Waltereit P, Rajan S, Heikman S, Mishra UK, Speck JS
1150 - 1159 Photomask Cr-MoSi etching
Wu BQ
1160 - 1162 Fabrication of three-dimensional microstructures using standard ultraviolet and electron-beam lithography
Galas JC, Belier B, Aassime A, Palomo J, Bouville D, Aubert J
1163 - 1173 Improved method for measuring photoacid generator kinetics in polymer thin films using normalized interdigitated electrode capacitance data
Berger CM, Henderson CL
1174 - 1178 Composite thin films of (ZrO2)(x)-(Al2O3)(1-x) for high transmittance attenuated phase shifting mask in ArF optical lithography
Lai FD
1179 - 1183 Oxide formation during ion bombardment of small silicon structures
Kruger D, Formanek P, Pippel E, Woltersdorf J, Bugiel E, Kurps R, Weidner G
1184 - 1190 Advanced techniques for the fabrication of square spiral photonic crystals by glancing angle deposition
Kennedy SR, Brett MJ
1191 - 1195 ZnO-based thin-film transistors of optimal device performance
Bae HS, Im S
1196 - 1201 Method to improve chemical-mechanical-planarization polishing rate of low-k methyl-silsesquiazane for ultralarge scale integrated interconnect application
Chang TC, Tsai TM, Liu PT, Yan ST, Chang YC, Aoki H, Sze SM, Tseng TY
1202 - 1205 Design of a complementary-metal-oxide-semiconductor-compatible field-emission magnetic sensor with adjustable sensitivity
Garner DM, French RJ, Hui G, Fung A
1206 - 1209 Improved quality and reliability of ultrathin (1.4-2.3 nm) gate oxides by radical-assisted oxidation utilizing a remote ultraviolet ozone source
Song YJ, Mheen B, Kim SH, Bae HC, Kang JY, Lee YS, Lee NE, Shim KH
1210 - 1212 Rapid repair of plasma ash damage in low-k dielectrics using supercritical CO2
Gorman BP, Orozco-Teran RA, Zhang Z, Matz PD, Mueller DW, Reidy RF
1213 - 1213 Chiral pattern formation: Combined transmission electron microscopy and atomic force microscopy study of tetracyanoquinodimethane thin film grown by vacuum evaporation (vol 20, pg 673, 2002)
Li JC, Liu WM, Xue ZQ
1214 - 1214 Investigation of various copper seed layers for copper electrodeposition applicable to ultralarge-scale integration interconnection (vol 21, pg 33, 2003)
Kim JJ, Kim SK, Lee CH, Kim YS
1217 - 1217 Papers from the 16th International Vacuum Microelectronics Conference -7-11 July 2003 - Osaka, Japan - Preface
Takai M
1218 - 1221 Photoresponse of a p-type Si field emitter
Mimura H, Ukeba T, Shimawaki H, Yokoo K
1222 - 1226 Extraction of emission area from Fowler-Nordheim plots
Forbes RG, Deane JHB, Hamid N, Sim HS
1227 - 1233 Characterization of enhanced field emission from HfC-coated Si emitter arrays through parameter extraction
Nicolaescu D, Sato T, Nagao M, Filip V, Kanemaru S, Itoh J
1234 - 1239 Analytical model for electron field emission from capped carbon nanotubes
Filip V, Nicolaescu D, Tanemura M, Okuyama F
1240 - 1243 Theoretical analysis of the enhanced electric field at the triple junction
Chung MS, Yoon BG, Cutler PH, Miskovsky NM
1244 - 1249 Simulation study of carbon nanotube field emission display with under-gate and planar-gate structures
Lan YC, Lee CT, Hu Y, Chen SH, Lee CC, Tsui BY, Lin TL
1250 - 1257 Modeling of emitted current distribution and electron trajectories in the thin-film field-emission triode
Garner DM
1258 - 1260 Remarkably low value of work function on W(100) produced by Y-O composite layer
Kawakubo T, Saito Y, Miyamoto N, Nakane H, Adachi H
1261 - 1265 Electron emission from carbon black-based field emitters including diesel engine exhaust
Busta H, Boldridge D, Myers R, Snider G, Korotkov A, Edwards E, Feinerman A
1266 - 1268 Characteristics of nano electron source fabricated using beam assisted process
Murakami K, Takai M
1269 - 1272 Synthesis and field-emission testing of carbon nanoflake edge emitters
Wang JJ, Zhu MY, Zhao X, Outlaw RA, Manos DM, Holloway BC, Park C, Anderson T, Mammana VP
1273 - 1276 Microelectron field emitter array with focus lenses for multielectron beam lithography based on silicon on insulator wafer
Minh PN, Ono T, Sato N, Mimura H, Esashi M
1277 - 1281 Quadrupole-mass-spectroscopy studies on hot-filament chemical vapor deposition of carbon films with nanosized constituents
Choi S, Lee S, Koh KH
1282 - 1285 Growth of aligned Cu2S nanowire arrays with AAO template and their field-emission properties
Wu QB, Ren S, Deng SZ, Chen J, Xu NS
1286 - 1289 Carbon nanotube growth from Cu-Co alloys for field emission applications
Hofmeister W, Kang WP, Wong YM, Davidson JL
1290 - 1293 Formation of graphite nanocones using metal nanoparticles as plasma etching masks
Park H, Choi S, Lee S, Koh KH
1294 - 1297 Fabrication of low-gate-current triode field emitters with planar carbon nanoparticle cathodes
Seo WJ, Choi SH, Lee SN, Koh KH
1298 - 1302 Tungsten pedestal structure for nanotriode devices
Blackburn AM, Hasko DG, Ahmed H, Williams DA
1303 - 1307 Double-gate field emitters with planar carbon-nanoparticle cathodes: Simulation studies
Bae S, Seo WJ, Choi S, Lee S, Koh KH
1308 - 1311 Synthesis of very dense carbon nanotube bundles using silica supported metal catalyst
Yim JH, Choi S, Lee S, Koh KH
1312 - 1314 Interference fringes observed in electron emission patterns of a multiwalled carbon nanotube
Hata K, Takakura A, Miura K, Ohshita A, Saito Y
1315 - 1318 Field emission from carbon nanotube Mat
Zhao WJ, Rochanachivapar W, Takai M
1319 - 1326 Competition of nitrogen doping and graphitization effect for field electron emission from nanocrystalline diamond films
Karabutov AV, Konov VI, Pereverzev VG, Vlasov II, Zavedeev EV, Pimenov SM
1327 - 1330 Electron emission from heavily nitrogen-doped heteroepitaxial chemical vapor deposition diamond
Okano K, Mine T, Saito I, Yamaguchi H, Yamada T, Sawabe A
1331 - 1334 Efficient electron emissions from printed carbon nanotubes by surface treatments
Kim KB, Song YH, Hwang CS, Chung CH, Lee JH, Choi IS, Park JH
1335 - 1337 Fabrication of carbon nanotube array and its field emission property
Sato H, Takegawa H, Yamaji H, Miyake H, Hiramatsu K, Saito Y
1338 - 1341 Field-emission characteristics from carbon nanotube field emitter arrays grown on silicon emitters
Yoshimoto T, Kamimaru D, Iwasaki H, Iwata T, Matsumoto K
1342 - 1344 Improvement in electron emission from carbon nanotube cathodes after Ar plasma treatment
Kanazawa Y, Oyama T, Murakami K, Takai M
1345 - 1348 Relationship between field emission property and composition of carbon nanotube paste for large area cold cathode
Kang SK, Choi JH, Park JH, Han JH, Yoo JB, Nam JW, Lee CK, Kim JM
1349 - 1352 Schottky emitter using boron-doped diamond
Bae JH, Minh PN, Ono T, Esashi M
1353 - 1357 Field emission characteristics of defect-controlled polyimide tunneling cathode
Baba A, Yoshida T, Asano T
1358 - 1361 Planar metal-insulator-semiconductor type field emitter fabricated on an epitaxial Al/Al2O3/Si(111) structure
Kim JS, Hoshi T, Sawada K, Ishida M
1362 - 1366 Development of field emission displays
Itoh S, Tanaka M, Tonegawa T
1367 - 1371 Development of an advanced high efficiency electro-emission device
Sakemura K, Negishi N, Yamada T, Satoh H, Watanabe A, Yoshikawa T, Ogasawara K, Koshida N
1372 - 1376 Correlation between nanostructure and electron emission characteristics of a ballistic electron surface-emitting device
Ichihara T, Baba T, Komoda T, Koshida N
1377 - 1381 Fabrication of carbon-nanotube field-emitter array using polymer insulator
Nishimura K, Shen ZY, Fujikawa M, Hosono A, Hashimoto N, Kawamoto S, Watanabe S, Nakata S
1382 - 1385 Luminescent properties of SrGa2S4 : Sm thin-film phosphors under low-voltage excitation
Iwamaru M, Nakajima H, Kominami H, Nakanishi Y, Hatanaka Y
1386 - 1389 Synthesis of Zn-doped Y2O3 : Eu fine-particle phosphor by the sol-gel method
Kominami H, Eguchi C, Kottaisamy M, Nakanishi Y, Hatanaka Y
1390 - 1395 256X192 pixel field emitter array image sensor with high-gain avalanche rushing amorphous photoconductor target
Takiguchi Y, Nanba M, Osada K, Watabe T, Okazabi S, Egami N, Tanioka K, Tanaka M, Itoh S
1396 - 1401 Electron emission characteristics from a single crystalline ferroelectric material by an infrared light irradiation
Takamuro D, Takao H, Sawada K, Ishida M
1402 - 1406 Integration of field emitters into scanning probe microscopy sensors using focused ion and electron beams
Lehrer C, Frey L, Petersen S, Ryssel H, Schafer M, Sulzbach T
1407 - 1410 Optimization of silicon field-emission arrays fabrication for space applications
Wang L, Stevens R, Huq E, Loader I, Kent B, Aplin K, She JC
1411 - 1415 Adsorption of alkanethiol molecules onto carbon nanotube surface
Roh S, Oh J, Choi Y, Sohn D, Kim W, Cho C, Yi W, Yoo J, Lee C, Kim J
1416 - 1419 Conductivity change of carbon nanotube with strong electron-donating and withdrawing molecules
Oh J, Roh S, Yi W, Lee H, Yoo J
1427 - 1427 An international journal devoted to Microelectronics and Nanometer Structures - Processing, Measurement, and Phenomena - Preface
Goodhue W
1428 - 1431 Selective epitaxial growth of GaAs on Si with strained short-period superlattices by molecular beam epitaxy under atomic hydrogen irradiation
Tsuji T, Yonezu H, Ohshima N
1432 - 1435 Reduced interface reaction during the epitaxial Fe growth on InAs for high efficiency spin injection
Yoh K, Ohno H, Sueoka K, Ramsteiner ME
1436 - 1440 Sb-mediated growth of n- and p-type AlGaAs by molecular beam epitaxy
Johnson SR, Sadofyev YG, Ding D, Cao Y, Chaparro SA, Franzreb K, Zhang YH
1441 - 1443 Selective growth Of C-60/GaAs and the optical characteristic
Ogawa M, Nishinaga J, Kida Y, Yamagata H, Aihara T, Horikoshi Y
1444 - 1449 Growth of Be-doped GaInP/GaAs heterostructure bipolar transistor by all solid-source multiwafer production molecular beam epitaxy
Wilk A, Zaknoune M, Godey S, Dhellemmes S, Gerard P, Chaix C, Mollot F
1450 - 1454 Single-phase growth studies of GaP on Si by solid-source molecular beam epitaxy
Yu XJ, Kuo PS, Ma K, Levi O, Fejer MM, Harris JS
1455 - 1459 Epitaxial growth on gas cluster ion-beam processed GaSb substrates using molecular-beam epitaxy
Krishnaswami K, Vangala SR, Zhu B, Goodhue WD, Allen LP, Santeufemio C, Liu X, Ospina MC, Whitten J, Sung C, Dauplaise H, Bliss D, Dallas G, Bakken D, Jones KS
1460 - 1462 Molecular beam epitaxial growth of mid-infrared InGaAsSb laser diodes on indium-free GaSb substrates
Pei CW, Heroux JB, Wang WI
1463 - 1467 Solid-source molecular-beam epitaxy growth of GaInNAsSb/InGaAs single quantum well on InP with photoluminescence peak wavelength at 2.04 mu m
Fu JX, Bank SR, Wistey MA, Yuen HB, Harris JS
1468 - 1471 Molecular beam epitaxial growth of AlGaPSb and AlGaPSb/InP distributed Bragg reflectors on InP
Klem JF, Serkland DK, Kim J, Wang TY
1472 - 1474 Effect of buffer layer on InSb quantum wells grown on GaAs (001) substrates
Mishima TD, Santos MB
1475 - 1478 Investigation of radiative and nonradiative trap centers in ZnSe : Al layers grown by molecular beam epitaxy
Oh DC, Makino H, Hanada T, Cho MW, Yao T, Song JS, Chang JH, Lu F
1479 - 1483 Low-temperature Si growth on Si (001): Impurity incorporation and limiting thickness for epitaxy
Baribeau JM, Wu X, Lockwood DJ, Tay L, Sproule GI
1484 - 1486 Molecular beam epitaxy growth of ZnO using initial Zn layer and MgO buffer layer on Si(111) substrates
Fujita M, Kawamoto N, Sasajima M, Horikoshi Y
1487 - 1490 Effect of Ga-rich growth conditions on the optical properties of GaN films grown by plasma-assisted molecular beam epitaxy
Sampath AV, Garrett GA, Collins CJ, Boyd P, Choe J, Newman PG, Shen H, Wraback M, Molnar RJ, Caissie J
1491 - 1494 Probing the electronic structures of III-V-nitride semiconductors by x-ray photoelectron spectroscopy
Lay TS, Kuo WT, Chen LP, Lai YH, Hung WH, Wang JS, Chi JY, Shih DK, Lin HH
1495 - 1498 Similarities between Ga0.48In0.52NyP1-y and Ga0.92In0.08NyAs1-y grown on GaAs (001) substrates
Hong YG, Nishikawa A, Tu CW
1499 - 1502 Heterostructures for achieving large responsivity in InAs/GaAs quantum dot infrared photodetectors
Chakrabarti S, Stiff-Roberts AD, Bhattacharya P, Kennerly SW
1503 - 1507 Improvement on the InAs quantum dot size distribution employing high-temperature GaAs(100) substrate treatment
Saucedo-Zeni N, Gorbatchev AY, Mendez-Garcia VH
1508 - 1511 Temperature stabilized 1.55 mu m photoluminescence in InAs quantum dots grown on InAlGaAs/InP
Zhang ZH, Cheng KY
1512 - 1514 Study of structural and optical properties of quantum dots-in-a-well heterostructures
Rotella P, von Winckel G, Raghavan S, Stintz A, Jiang Y, Krishna S
1515 - 1517 Temperature dependence of optical properties of Ga0.3In0.7NxAs1-x quantum dots grown on GaAs (001)
Nishikawa A, Hong YG, Tu CW
1518 - 1522 CdSe quantum dots grown on ZnSe and Zn0.97Be0.03Se by molecular-beam epitaxy: Optical studies
Zhou XC, Munoz M, Guo SP, Tamargo MC, Gu Y, Kuskovsky IL, Neumark GF
1523 - 1525 Photoconductive characteristics in a trench-type InGaAs quantum-wire field effect transistor
Jang KY, Sugaya T, Hahn CK, Ogura M, Komori K, Shinoda A, Yonei K
1526 - 1528 Polarization control of vertical cavity surface emitting laser structure by using self-organized quantum wires grown on (775)B-oriented GaAs substrate by molecular beam epitaxy
Ohno Y, Shimomura S, Hiyamizu S, Takasuka Y, Ogura M, Komori K
1529 - 1533 Analysis of atomic structure in InAs quantum dashes grown on AlGaAsSb metamorphic buffers
Balakrishnan G, Huang SH, Dawson LR, Huffaker DL
1534 - 1538 Studies of oxide desorption from GaAs substrates via Ga2O3 to Ga2O conversion by exposure to Ga flux
Wasilewski ZR, Baribeau JM, Beaulieu M, Wu X, Sproule GI
1539 - 1543 Real-time stress evolution during growth of InxAl1-xAs/GaAs metamorphic buffer layers
Lynch C, Beresford R, Chason E
1544 - 1548 Influence of N-2 background pressure on the incorporation of arsenic during molecular beam epitaxy growth of GaAs
Dieing T, Usher BF
1549 - 1553 Flux profile modeling: Monte Carlo simulation and numerical computation
Venkat R, Pemmireddy BR, Vijayagopal R, Cheng H, Bresnahan R
1554 - 1557 Material properties and performance of metamorphic optoelectronic integrated circuits grown by molecular beam epitaxy on GaAs substrates
Hoke WE, Leoni RE, Whelan CS, Kennedy TD, Torabi A, Marsh PF, Zhang Y, Xu C, Hsieh KC
1558 - 1561 Molecular-beam epitaxy growth of quantum cascade lasers on (111)B substrates for second harmonic generation
Marcadet X, Ortiz V, Bengloan JY, Dhillon S, Calligaro M, Sirtori C
1562 - 1564 GaInNAs(Sb) vertical-cavity surface-emitting lasers at 1.460 mu m
Wistey MA, Bank SR, Yuen HB, Goddard LL, Harris JS
1565 - 1569 Comparison of As- and P-based metamorphic buffers for high performance InP heterojunction bipolar transistor and high electron mobility transistor applications
Lubyshev D, Fastenau JM, Fang XM, Wu Y, Doss C, Snyder A, Liu WK, Lamb MSM, Bals S, Song C
1570 - 1574 Metamorphic 6.00 A heterojunction bipolar transistors on InP by molecular-beam epitaxy
Lange MD, Cavus A, Monier C, Sandhu RS, Block TR, Gambin VF, Sawdai DJ, Gutierrez-Aitken AL
1575 - 1579 Correlating growth conditions with photoluminescence and lasing properties of mid-IR antimonide type II "W" structures
Canedy CL, Boishin GI, Bewley WW, Kim CS, Vurgaftman I, Kim M, Lindle JR, Meyer JR, Whitman LJ
1580 - 1583 Terahertz magneto-photoconductive characterization of hydrogenic barrier donors in GaAs/AlGaAs epitaxial thin films
Naweed A, Goodhue WD, Gorveatt WJ, Giles R, Waldman J, Menon V
1584 - 1587 Positron annihilation study of vacancies in GaInNAs
Ptak AJ, Kurtz S, Weber MH, Lynn KG
1588 - 1592 Use of transmission electron microscopy in the characterization of GaInNAs(Sb) quantum well structures grown by molecular beam epitaxy
Gugov T, Gambin V, Wistey M, Yuen H, Bank S, Harris JS
1593 - 1597 Combined x-ray diffraction/scanning tunneling microscopy study of segregation and interfacial bonding in type-II heterostructures
Zhong M, Steinshnider J, Weimer M, Kaspi R
1598 - 1601 Compositional analysis of graded AlxGa(1-x)As layers by x-ray energy dispersive spectrometry
Mahalingam K, Wheeler R, Taferner WT, Eyink KG, Fenstermaker ST, Solomon JS