677 - 685 |
Intermediate-layer lithography method for producing metal micropatterns Liu XC, Luo C |
686 - 690 |
Properties of Fe-doped, thick, freestanding GaN crystals grown by hydride vapor phase epitaxy Polyakov AY, Smirnov NB, Govorkov AV, Vdovin VI, Markov AV, Shlensky AA, Prebble E, Hanser D, Zavada JM, Pearton SJ |
691 - 696 |
Comprehensive investigation on emitter ledge length of InGaP/GaAs heterojunction bipolar transistors Fu SI, Liu RC, Cheng SY, Lai PH, Tsai YY, Hung CW, Chen TP, Liu WC |
697 - 702 |
Crystallographic wing tilt and thermal-stress distribution of GaN laterally overgrown on maskless V-grooved sapphire substrate by metal-organic chemical vapor deposition Xing ZG, Wang J, Wang Y, Wang XH, Zhou ZT, Chen H, Zhou JM |
703 - 714 |
Experimental investigation of micro-mesoscale Knudsen compressor performance at low pressures Han YL, Muntz EP |
715 - 720 |
Etch mechanisms of hybrid low-k material (SiOCH with porogen) in fluorocarbon based plasma Eon D, Damon M, Chevolleaua T, David T, Vallier L, Joubert O |
721 - 724 |
Fabrication of GaN suspended photonic crystal membranes and resonant nanocavities on Si(111) Rosenberg A, Bussmann K, Kim M, Carter MW, Mastro MA, Holm RT, Henry RL, Caldwell JD, Eddy CR |
725 - 729 |
Manufacturing method for the fabrication of sub-50 nm current-perpendicular-to-plane spin valve sensors Han GC, Li KB, Zheng YK, Qiu JJ, Luo P, An LH, Guo ZB, Liu ZY, Wu YH |
730 - 733 |
Fabrication of suspended single crystal diamond devices by electrochemical etch Wang CF, Hu EL, Yang J, Butler JE |
734 - 738 |
Improved performance of a dual-passivated heterojunction bipolar transistor Cheng SY, Fu SI, Liu WC |
739 - 744 |
Profile control of novel non-Si gates using BCl3/N-2 plasma Shamiryan D, Paraschiv V, Eslava-Fernandez S, Demand M, Baklanov M, Beckx S, Boullart W |
745 - 753 |
Nanoscale resist morphologies of dense gratings using electron-beam lithography Mohammad MA, Dew SK, Westra K, Li P, Aktary M, Lauw Y, Kovalenko A, Stepanova M |
754 - 759 |
Epitaxial growth of Sc2O3 films on GaN (0001) by pulsed laser deposition Liu C, Chor EF, Tan LS, Du A |
760 - 766 |
Low-damage fabrication of high aspect nanocolumns by using neutral beams and ferritin-iron-core mask Kubota T, Baba T, Saito S, Yamasaki S, Kumagai S, Matsui T, Uraoka Y, Fuyuki T, Yamashita I, Samukawa S |
767 - 778 |
Poly-Si/TiN/HfO2 gate stack etching in high-density plasmas Le Gouil A, Joubert O, Cunge G, Chevolleau T, Vallier L, Chenevier B, Matko I |
779 - 784 |
Study of photoresist etching and roughness formation in electron-beam generated plasmas Orf BJ, Walton SG, Leonhardt D, Oehrlein GS |
785 - 790 |
UV nanoimprint materials: Surface energies, residual layers, and imprint quality Schmitt H, Frey L, Ryssel H, Rommel M, Lehrer C |
791 - 795 |
Formation and morphology of InGaN nanoisiands on GaN(0001) Gangopadhyay S, Schmidt T, Einfeldt S, Yamaguchi T, Hommel D, Falta J |
796 - 800 |
Sn quantum dots embedded in SiO2 formed by low energy ion implantation Zhao JP, Meng Y, Huang DX, Chu WK, Rabalais JW |
801 - 807 |
Mask material effects in cryogenic deep reactive ion etching Sainiemi L, Franssila S |
808 - 812 |
Spontaneous formation of Si nanocones vertically aligned to Si wafers Tsuji Y, Nakamura S, Noda S |
813 - 816 |
Process for scanning near-field microwave microscope probes with integrated ultratall coaxial tips Wang YQ, Bettermann AD, van der Weide DW |
817 - 821 |
Electron emission from SrTiO3-coated silicon-tip arrays Bian HJ, Chen XF, Pan JS, Sun CQ, Zhu W |
822 - 828 |
Embedded vertically grown carbon nanotubes for field emission applications Abdi Y, Koohshorkhi J, Mohajerzadeh S, Darbari S, Sanaee Z |
829 - 832 |
Analysis of the driving characteristic of carbon nanotube triode with high frequency Chai WQ, Lou CG, Wang Q, Lei W, Zhang XB |
833 - 838 |
Ordered silicon nanostructures by ion beam induced glancing angle deposition Patzig C, Rauschenbach B, Erfurth W, Milenin A |
839 - 844 |
Low bias reactive ion etching of GaAs with a SiCl4/N-2/O-2 time-multiplexed process Golka S, Schartner S, Schrenk W, Strasser G |
845 - 852 |
Characteristics of atomic-layer-deposited thin HfxZr1-xO2 gate dielectrics Triyoso DH, Hegde RI, Schaeffer JK, Gregory R, Wang XD, Canonico M, Roan D, Hebert EA, Kim K, Jiang J, Rai R, Kaushik V, Samavedam SB, Rochat N |
853 - 856 |
Position measurement method for alignment in UV imprint using a high index mold and "electronic" moire technique Suehira N, Terasaki A, Okushima S, Seki J, Ono H, Ina H |
857 - 861 |
Characterization and control of unconfined lateral diffusion under stencil masks Racz Z, Seabaugh A |
862 - 867 |
Nanopattern transfer to SiO2 by ion track lithography and highly selective HF vapor etching Skupinski M, Jensen J, Johansson A, Possnert G, Boman M, Hjort K, Razpet A |
868 - 872 |
Novel spin-on hard mask with Si-containing bottom antireflective coating for nanolithography Choi SJ |
873 - 876 |
Function of quantum-confinement effect in the AlGaN/AlN/GaN heterostructure with an AlN interfacial layer Kong YC, Chu RM, Zheng YD, Zhou CH, Gu SL, Zhang R, Han P, Shi Y, Jiang RL |
877 - 880 |
Fabrication of nanbstructures using a C-methylcalix[4]resorcinarene dielectric spacer Fleischer M, Panteleit F, Wharam DA |
881 - 885 |
High-adhesive back side metallization of ultrathin wafers Felmetsger VV |
886 - 892 |
Analyses of chamber wall coatings during the patterning of ultralow-k materials with a metal hard mask: Consequences on cleaning strategies Chevolleau T, Darnon M, David T, Posseme N, Torres J, Joubert O |
893 - 898 |
Nanosized tungsten carbide for NOx reduction Rumaiz AK, Lin HY, Baldytchev I, Shah SI |
899 - 901 |
Defect-free two-dimensional-photonic crystal structures on a nonlinear optical polymer patterned by nanoimprint lithography Okinaka M, Inoue SI, Tsukagoshi K, Aoyagi Y |
902 - 905 |
High gain AlGaAs/GaAs heterojunction bipolar transistor fabricated on SiGe/Si substrate Lew KL, Yoon SF, Loke WK, Tanoto H, Dohrman CL, Isaacson DM, Fitzgerald EA |
906 - 912 |
Restoration and pore sealing of plasma damaged porous organosilicate low k dielectrics with phenyl containing agents Liu J, Kim W, Bao J, Shi H, Baek W, Ho PS |
913 - 915 |
In0.68Ga0.32As/Al0.64In0.36As/InP 4.5 mu m quantum cascade lasers grown by solid phosphorus molecular beam epitaxy Chen J, Malis O, Sergent AM, Sivco DL, Weimann N, Cho AY |
916 - 921 |
Nanosoldering of carbon nanotubes on metal electrodes with an atomic force microscope Lee S, Park JY, Cho YS, Park YD, Kuk Y, Chung JW |
922 - 925 |
Focused ion beam tomography of a microelectronic device with sub-2-nm resolution Yeoh TS, Ives NA, Presser N, Stupian GW, Leung MS, McCollum JL, Hawley FW |
926 - 930 |
High quality of 830 nm material grown by solid source molecular beam epitaxy for laser device printing applications Hernandez IC, McElhinney M, Zeng L, Mishournyi VA |
931 - 934 |
Fabrication of local microvacuum package incorporating Si field emitter array and Ti getter Noda D, Hatakeyama M, Nishijyou K, Sawada K, Ishida M |
935 - 939 |
Fabrication and material properties of NiTi nanofluid Chang H, Hsu YC |
940 - 944 |
Novelty and versatility of self-catalytic nanowire growth: A case study with InN nanowires He MQ, Mohammad SN |
945 - 947 |
Effect of surface pretreatment and substrate orientation on the characteristics of InAs quantum dots on Si and SiO2 substrates Yoon I, Yi C, Kirn T, Brown AS, Seabaugh A |
954 - 954 |
Papers from the 24th North American Conference on Molecular Beam Epitaxy - 8-11 October 2006 Durham, North Carolina - Preface Millunchick JM |
955 - 959 |
Effects of temperature, nitrogen ions, and antimony on wide depletion width GaInNAs Ptak AJ, Friedman DJ, Kurtz S |
960 - 963 |
Impact of arsenic species (As-2/As-4) on the relaxation and morphology of step-graded InAsxP1-x on InP substrates Zhang WM, Yi CY, Brown A |
964 - 968 |
Epitaxial overgrowth of GaN nanocolumns Averett KL, Van Nostrand JE, Albrecht JD, Chen YS, Yang CC |
969 - 973 |
Kinetics of gallium adlayer adsorption/desorption on polar and nonpolar GaN surfaces Choi S, Kim TH, Everitt HO, Brown A, Losurdo M, Brun G, Moto A |
974 - 977 |
Direct-write composition patterning of InGaN by focused thermal beam during molecular-beam epitaxy Chen X, Schaff WJ, Eastman LF |
978 - 982 |
Thermodynamic analysis of cation incorporation during molecular beam epitaxy of nitride films using metal-rich growth conditions Hoke WE, Torabi A, Mosca JJ, Kennedy TD |
983 - 986 |
Promising new valved source for Ga or In evaporation Sacks RN, Bichrt C |
987 - 990 |
Chemical beam epitaxy of GaAsN/GaAs multiquantum well solar cell Freundlich A, Fotkatzikis A, Bhusal L, Williams L, Alemu A, Zhu W, Coaquira JAH, Feltrin A, Radhakrishnan G |
991 - 994 |
Molecular beam epitaxy growth of antimonide type-II "W" high-power interband cascade lasers and long-wavelength infrared photodiodes Kim CS, Canedy CL, Aifer EH, Kim M, Bewley WW, Tischler JG, Larrabee DC, Nolde JA, Warner JH, Vurgaftman I, Jackson EM, Meyer JR |
995 - 998 |
Intersubband transitions in molecular-beam-epitaxy-grown wide band gap II-VI semiconductors Shen A, Lu H, Tamargo MC, Charles W, Yokomizo I, Song CY, Liu HC, Zhang SK, Zhou X, Alfano RR, Franz KJ, Gmachl C |
999 - 1003 |
Anomalous x-ray diffraction study of disorders in epitaxial films of the Heusler alloy, Co2MnGe Collins BA, Zhong YC, Chu YS, He L, Tsui F |
L15 - L18 |
Field emission from GaN and (Al,Ga)N/GaN nanorod heterostructures Deb P, Westover T, Kim H, Fisher T, Sands T |
L19 - L21 |
Deposition of zinc oxide layers by high-power impulse magnetron sputtering Konstantinidis S, Hemberg A, Dauchot JP, Hecq M |
1004 - 1008 |
Magnetoresistance of fully epitaxial MnAs/GaAs lateral spin valves Holub M, Saha D, Bhattacharyaa P |
1009 - 1013 |
Reproducible reflection high energy electron diffraction signature's for improvement of AlN using in situ growth regime characterization Burnham SD, Namkoong G, Lee KK, Doolittle WA |
1014 - 1018 |
Real time optical monitoring of molecular beam epitaxy of InN on SiC substrates Losurdo M, Kim TH, Choi S, Wu P, Giangregorio MM, Bruno G, Brown A |
1019 - 1023 |
In situ spectroscopic ellipsometry to monitor surface plasmon resonant group-III metals deposited by molecular beam epitaxy Wu PC, Losurdo M, Kim TH, Choi O, Bruno G, Brown AS |
1024 - 1028 |
GdGaO: A gate dielectric for GaAs metal-oxide-semiconductor field-effect transistors Holland M, Stanley CR, Reid W, Thayne I, Paterson GW, Long AR, Longo P, Scott J, Craven AJ, Gregory R |
1029 - 1032 |
Epitaxial calcium oxide films deposited on gallium nitride surfaces Losego MD, Mita S, Collazo R, Sitar Z, Maria JP |
1033 - 1038 |
Thin, crystalline MgO on hexagonal 6H-SIC(0001) by molecular beam epitaxy for functional oxide integration Goodrich TL, Cai Z, Losego MD, Maria JP, Ziemer KS |
1039 - 1043 |
Integration of functional epitaxial oxides into silicon: From high-K application to nancistructures Osten HJ, Kuhne D, Laha A, Czernohorsky M, Bugiel E, Fissel A |
1044 - 1048 |
Growth by molecular beam epitaxy of self-assembled InAs quantum dots on InAlAs and InGaAs lattice-matched to InP Simmonds PJ, Beere HE, Li HW, See P, Shields AJ, Ritchie DA |
1049 - 1052 |
rf oxygen plasma assisted molecular beam epitaxy growth of BiFeO3 thin films on SrTiO3 (001) Kabelac J, Ghosh S, Dobal P, Katiyar R |
1053 - 1057 |
Epitaxial growth and strain relaxation of BaTiO3 thin films on SrTiO3 buffered (001) Si by molecular beam epitaxy Niu F, Wessels BW |
1058 - 1062 |
Unintentional calcium incorporation in Ga(Al, In, N)As Hurst JB, Lewis SD, Oye MM, Holmes AL, Ptak AJ, Reedy RC |
1063 - 1065 |
Effect of Al composition on filtering of threading dislocations by AlxIn1-x/AlyIn1-ySb heterostructures grown on GaAs (001) Edirisooriya M, Mishima TD, Santos MB |
1066 - 1071 |
Optical monitoring of molecular beam epitaxy growth of AlN/GaN using single-wavelength laser interferometry: A simple method of tracking real-time changes in growth rate Griffiths CL, Weeks KJ |
1072 - 1076 |
Kinetic Monte Carlo simulation of InAs quantum dot growth on nonlithographically patterned substrates Guo W, Guico RS, Xu JM, Beresford R |
1077 - 1082 |
Excitation dependent photoluminescence measurements of the nonradiative lifetime and quantum efficiency in GaAs Johnson SR, Ding D, Wang JB, Yu SQ, Zhang YH |
1083 - 1086 |
Midinfrared InGaAsSb quantum well lasers with digitally grown tensile-strained AlGaAsSb barriers Li W, Shao H, Moscicka D, Torfi A, Wang WI |
1087 - 1089 |
Optical properties of molecular-beam-epitaxy-grown InGaMnAs thin films Peiris FC, Hungerford JI, Maksimov O, Samarth N |
1090 - 1092 |
Molecular-beam epitaxy of phosphor-free 1.3 mu m InAlGaAs multiple-quantum-well lasers on InP (100) Li W, Moscicka D, Torfi A, Wang WI |
1093 - 1097 |
Fabrication and optical characterization of highly ordered InAs/GaAs quantum dots on nonlithographically patterned substrates Guico RS, Tzolov M, Guo W, Cloutier SG, Beresford R, Xu J |
1098 - 1102 |
Molecular-beam epitaxy growth of device-compatible GaAs on silicon substrates with thin (similar to 80 nm) Si1-xGex step-graded buffer layers for high-kappa III-V metal-oxide-semiconductor field effect transistor applications Oye MM, Shahrjerdi D, Ok I, Hurst JB, Lewis SD, Dey S, Kelly DQ, Joshi S, Mattord TJ, Yu X, Wistey MA, Harris JS, Holmes AL, Lee JC, Banerjee SK |
1103 - 1107 |
Study of intersubband transitions of ZnxCd1-xSe/Znx' Cdy' Mg1-x'-y' Se multiple quantum wells grown by molecular beam epitaxy for midinfrared device applications Lu H, Shen A, Tamargo MC, Charles W, Yokomizo I, Munoz M, Gong Y, Neumark GF, Franz KJ, Gmachl C, Song CY, Liu HG |
1108 - 1112 |
DX-like centers in InAs/GaAs QDIPs observed by polarization-dependent Fourier transform infrared spectroscopy Zhao ZY, Yi C, Stiff-Roberts AD, Hoffman AJ, Wasserman D, Gmachl C |
1113 - 1116 |
Optical studies of molecular beam epitaxy grown GaAsSbN/GaAs single quantum well structures Nunna K, Iyer S, Wu L, Bharatan S, Li J, Bajaj KK, Wei X, Senger RT |