1 - 5 |
Nitrogen-doped titanium oxide films as visible light photocatalyst by vapor deposition Yang MC, Yang TS, Wong MS |
6 - 10 |
Effects of H-2 in indium-molybdenum oxide films during high density plasma evaporation at room temperature Sun SY, Huang JL, Lii DF |
11 - 17 |
Property change in ZrNxOy thin films: effect of the oxygen fraction and bias voltage Vaz F, Carvalho P, Cunha L, Rebouta L, Moura C, Alves E, Ramos AR, Cavaleiro A, Goudeau P, Riviere JP |
18 - 23 |
The properties of tin-doped indium oxide films prepared by pulsed magnetron sputtering from powder targets Zhou Y, Kelly PJ |
24 - 30 |
Cermet coatings for solar Stirling space power Jaworske DA, Raack T |
31 - 37 |
Gold-alumina cermet photothermal films Woods BW, Thompson DW, Woollam JA |
38 - 46 |
Advances in multichannel ellipsometric techniques for in-situ and real-time characterization of thin films Collins RW, An I, Chen C, Ferlauto AS, Zapien JA |
47 - 53 |
Interface engineering during plasma-enhanced chemical vapor deposition of porous/dense SiN1.3 optical multilayers Amassian A, Vernhes R, Klemberg-Sapieha JE, Desjardins P, Martinu L |
54 - 58 |
Structures and electrochromic properties of Ta0.1W0.9Ox thin films deposited by pulsed laser ablation Yang D, Xue L |
59 - 64 |
Electrophosphorescence emission in organic light-emitting diodes based on (Sm plus Eu) complexes Reyes R, Cremona M, Teotonio EES, Brito HF, Malta OL |
65 - 69 |
Luminescent properties of rare earth-activated Y1-XGdXVO4 phosphor thin films Minami T, Miyata T, Suzuki Y, Mochizuki Y |
70 - 74 |
Substrate pretreatment for improvements in structural and mechanical properties of zinc oxide coatings on glass West GT, Kelly PJ |
75 - 79 |
Ultraviolet detecting properties of ZnO-based thin film transistors Bae HS, Im S |
80 - 85 |
Electrical and optical properties of TCO-Cu2O heterojunction devices Tanaka H, Shimakawa T, Miyata T, Sato H, Minami T |
86 - 91 |
Growth and characterization of thick cBN coatings on silicon and tool substrates Bewilogua K, Keunecke M, Weigel K, Wiemann E |
92 - 98 |
Deposition of Ti-B-N (single and multilayer) and Zr-B-N coatings by chemical vapor deposition techniques on cutting tools Holzschuh H |
99 - 104 |
Investigation of the growth mechanism and structure of nanocrystalline diamond films by rapid thermal annealing Kulisch W, Popov C, Boycheva S, Beshkov G, Vorlicek V, Gibson PN, Georgiev G |
XI - XI |
Proceedings of the 31st International Conference on Metallurgical Coatings and Thin Films, San Diego, California, April 19-23, 2004 -Preface Matthews A, Gall D, Fenker M, Pauleau Y |
105 - 111 |
Processing and thermal properties of highly oriented diamond thin films Wolter SD, Borca-Tasciuc D, Chen G, Prater JT, Sitar Z |
112 - 114 |
Use of amorphous hydrogenated carbon as high-pressure cell for investigating trapped noble gases as a function of pressure Oliveira MH, Barbiere PF, Lacerda RG, Marques FC |
115 - 119 |
Growth and morphology of aligned carbon nanotube layers Bartsch K, Leonhardt A |
120 - 126 |
Characterization and formation of nanocrystalline diamonds in a-C/N films by filtered cathodic vacuum arc plasma Hsieh WJ, Shih PS, Lin JH, Lin CC, Chen US, Huang SC, Chang YS, Shih HC |
127 - 130 |
Preparation of Ni-filled carbon nanotubes for key potential applications in nanotechnology Tyagi PK, Singh MK, Misra A, Palnitkar U, Misra DS, Titus E, Ali N, Cabral G, Gracio J, Roy M, Kulshreshtha SK |
131 - 134 |
Growth of chromium carbide capped-carbon nanotip using bias-assisted microwave plasma chemical vapor deposition Hsu CH, Shi SC, Chen CF |
135 - 141 |
Coating of SiC surface by thin carbon films using the carbide-derived carbon process Zinovev AV, Elam JW, Moore JF, Hryn JN, Auciello O, Carlisle JA, Pellin MJ |
142 - 148 |
Effect of substrate biasing on structural and field-emissive properties of carbon nanotubes synthesized by ICP-CVD method Park CK, Kim JP, Kim YD, Uhm HS, Park JS |
149 - 153 |
Nucleation and growth behavior during initial stage in sublimation epitaxy of SiC films on 6H-SiC(0001) substrate Seo SH, Song JS, Oh MH, Park JS, Wang YZ |
154 - 160 |
Optimisation of the new time-modulated CVD process using the Taguchi method Ali N, Neto F, Mei S, Cabral G, Kousar Y, Titus E, Ogwu AA, Misra DS, Gracio J |
161 - 166 |
Cutting force and wear evaluation in peripheral milling by CVD diamond dental tools Polini R, Allegri A, Guarino S, Quadrini F, Sein H, Ahmed W |
167 - 172 |
Temperature effect of nitrided stainless steel coatings deposited by reactive DC-magnetron sputtering Terwagne G, Colaux J, Mitchell DR, Short KT |
173 - 177 |
RF plasma deposition of thin SixGeyCz : H films using a combination of organometallic source materials Rapiejko C, Gazicki-Lipman M, Klimek L, Szymanowski H, Strojek M |
178 - 183 |
Effect of carrier gas on the structure and electrical properties of low dielectric constant SiCOH film using trimethylsilane prepared by plasma enhanced chemical vapor deposition Cheng YL, Wang Y, Lan JK, Chen HC, Lin JH, Wu Y, Liu PT, Wu Y, Feng MS |
184 - 189 |
Dielectric properties of AlNx thin films prepared by RF magnetron sputtering of Al using a N2/Ar sputtering gas mixture Gould RD, Awan SA |
190 - 193 |
Adhesion strength of multi-layered diamond films on WC-Co alloy substrate Takeuchi S, Kojima M, Takano S, Kanda K, Murakawa M |
194 - 200 |
On the evaluation of stresses during nanoindentation with sharp indenters Schwarzer N, Pharr GM |
201 - 205 |
Measurement of thin film elastic constants by X-ray diffraction Faurie D, Renault PO, Le Bourhis E, Villain P, Goudeau P, Badawi F |
206 - 213 |
Observation of fracture and plastic deformation during indentation and scratching inside the scanning electron microscope Rabe R, Breguet JM, Schwaller P, Stauss S, Haug FJ, Patscheider J, Michler J |
214 - 220 |
Evaluation of young modulus of CVD coatings by different techniques Bellan C, Dhers J |
221 - 226 |
Evidence of plastic damage in thin films around buckling structures Coupeau C, Goudeau P, Belliard L, George M, Tamura N, Cleymand F, Colin J, Perrin B, Grilhe J |
227 - 232 |
Coating elastic-plastic properties determined by means of nanoindentations and FEM-supported evaluation algorithms Bouzakis KD, Michailidis N |
233 - 238 |
Toughness measurement of ceramic thin films by two-step uniaxial tensile method Zhang S, Sun D, Fu YQ, Du HJ |
239 - 247 |
Determination of mechanical properties of graded coatings using nanoindentation Chudoba T, Schwarzer N, Linss V, Richter F |
248 - 253 |
A comparative study of the mechanical properties of PVD coatings evaluated by new techniques and conventional methods Kamiya S, Nagasawa H, Yamanobe K, Hanyu H, Saka M |
254 - 262 |
The inclined impact test, an efficient method to characterize coatings' cohesion and adhesion properties Bouzakis KD, Asimakopoulos A, Michailidis N, Kompogiannis S, Maliaris G, Giannopoulos G, Pavlidou E, Erkens G |
263 - 267 |
Scuffing resistance after tribosynthesis of a modified surface layer Hershberger J, Ajayi OO, Bello Y, Fenske GR |
268 - 273 |
Thermal reliability of electroless Ni-P-W coating during the aging treatment Tien SK, Duh JG |
274 - 281 |
Corrosion resistance of ZrNxOy thin films obtained by rf reactive magnetron sputtering Ariza E, Rocha LA, Vaz F, Cunha L, Ferreira SC, Carvalho P, Rebouta L, Alves E, Goudeau P, Riviere JP |
282 - 289 |
The effect of Au thickness and annealing conditions on SiO2 formation in the Au/Si system Julies BA, Adams D, Mayer JW |
290 - 294 |
The magnetic properties of Fe-Co-Pt alloys films Lai YC, Chang YH, Chen YK |
295 - 303 |
Production of AIN films: ion nitriding versus PVD coating Figueroa U, Salas O, Oseguera J |
304 - 308 |
Interfacial synthesis of electrically conducting polyaniline nanofiber composites Hopkins AR, Sawall DD, Villahermosa RM, Lipeles RA |
309 - 314 |
The thermal stability of Cu/FSG structure with amorphous and crystalline tantalum nitride diffusion barriers Chang CC, Chen JS |
315 - 321 |
Search for new materials in sputtered V1-xCx films Aouni A, Weisbecker P, Loi TH, Bauer-Grosse E |
322 - 326 |
Electrical properties and crystal structures of nitrogen-doped Ge2Sb2Te5 thin film for phase change memory Kim SM, Shin MJ, Choi DJ, Lee KN, Hong SK, Park YJ |
327 - 332 |
X-ray scattering study in homoepitaxial growth of sputter-deposited SrTiO3 films Lee HY, Hsu CH, Hsieh YW, Liu HJ |
333 - 338 |
The influence of thermal treatment on the microstructure and hardness in electroless Ni-P-W deposit Tien SK, Duh JG, Chen YI |
339 - 344 |
The role of hcp-AlN on hardness behavior of Ti1-xAlxN nanocomposite during annealing Santana AE, Karimi A, Derflinger VH, Schutze A |
345 - 349 |
High-density MIM capacitors with HfO2 dielectrics Perng TH, Chien CH, Chen CW, Lehnen P, Chang CY |
350 - 355 |
Structural evolution of nanocrystalline Pd-Mg bilayers under deuterium absorption and desorption cycles Checchetto R, Brusa RS, Bazzanella N, Karwasz GP, Spagolla M, Miotello A, Mengucci P, Di Cristoforo A |
356 - 360 |
Metal-induced crystallization of amorphous Si1-xGex by rapid thermal annealing Yu CH, Yeh PH, Cheng SL, Chen LJ, Cheng LW |
361 - 365 |
LiCoO2 cathode material coated with nano-crystallized ZnO for Li-ion batteries Fang T, Duh JG, Sheen SR |
366 - 371 |
Characterizing metallurgical reaction of Sn-Pb solder with Ni/Cu under-bump metallization by electron microscopy Hsiao LY, Duh JG |
372 - 376 |
Boron-carbide barrier layers in scandium-silicon multilayers Jankowski AF, Saw CK, Walton CC, Hayes JP, Nilsen J |
377 - 382 |
Study on etching profile of nanoporous silica Chen CW, Chang TC, Liu PT, Tsai TM, Wu HH, Tseng TY |
383 - 387 |
Study on the effect of electron beam curing on low-K porous organosilicate glass (OSG) material Chang TC, Tsai TM, Liu PT, Chen CW, Tseng TY |
388 - 392 |
Cu-penetration induced breakdown mechanism for a-SiCN Chen CW, Liu PT, Chang TC, Yang JH, Tsai TM, Wu HH, Tseng TY |
393 - 397 |
Structural characteristics and interfacial reactions of low dielectric constant porous polysilazane for Cu metallization Wang JH, Liu PT, Chang TS, Chang TC, Chen LJ |
398 - 403 |
AFM of ion-etched cross-sections: a method for analysing the morphology of dense hard coatings Jobin M, Burdet B, Santana AE, Bergmann E |
404 - 409 |
X-ray characterization of oriented beta-tantalum films Kohli S, McCurdy PR, Rithner CD, Dorhout PK, Dummer AM, Brizuela F, Menoni CS |
410 - 415 |
Raman analysis of Si-C-N films grown by reactive magnetron sputtering Liang EJ, Zhang JW, Leme J, Moura C, Cunha L |
416 - 419 |
Aerosol-assisted chemical vapour deposition of sodium fluoride thin films Binions R, Carmalt CJ, Parkin IP |
420 - 424 |
Photothermal molecular sensing by using metal thin-film nanograting for chemical and biomedical applications Okamoto K, Zhang ZY, Wei DT, Scherer A |
425 - 430 |
Comparative study of self-assembled ZnO nanostructures in polystyrene-acrylic acid) diblock copolymers - [PS](m)/[PAA](n) - on Si and SiO2/Si surfaces Ali HA, Iliadis AA |
431 - 437 |
New metal layers for integrated circuit manufacture: experimental and modeling studies Iwamoto N, Truong N, Lee E |
438 - 443 |
Mechanism of high density plasma chemical vapor deposition phosphosilicate glass process without in-situ plasma chamber clean Lan JK, Wang YL |
444 - 449 |
Ferroelectric thin films on silicon carbide for next-generation nonvolatile memory and sensor devices Ostling M, Koo SM, Zetterling CM, Khartsev S, Grishin A |
450 - 454 |
Precision bi-directional motion of a linear mechanical shuttle with an electrothermal microengine Kolesar ES, Jayachandran JA, Odom WE, Ruff MD, Cox LA, Htun T, Stacy TE, Yetto JM |
455 - 459 |
Electrical and piezoresistive properties of TaN-Cu nanocomposite thin films Wang CM, Hsieh JH, Li C |
460 - 465 |
Thermal stability and bonding configuration of fluorine-modified low-k SiOC : H composite films JangJian SK, Liu CP, Wang YL, Hwang WS, Tseng WT |
466 - 471 |
Microstructural and tribological investigations of CrN coated, wet-stripped and recoated functional substrates used for cutting and forming tools Rebole R, Martinez A, Rodriguez R, Fuentes GG, Spain E, Watson N, Avelar-Batista JC, Housden J, Montala F, Carreras LJ, Tate TJ |
472 - 477 |
Corrosion and erosion properties of silicate and phosphate coatings on magnesium Ma Y, Nie X, Northwood DO, Hu H |
478 - 482 |
The growth of SiGe quantum rings in Au thin films on epitaxial SiGe on silicon He JH, Chueh YL, Wu WW, Lee SW, Chen LJ, Chou LJ |
483 - 486 |
Self-forming silicide/SiGe-based tube structure on Si(001) substrates Chen HC, Liao KF, Lee SW, Chen LJ |
487 - 490 |
The impact of scaling on metal thickness for advanced back end of line interconnects Chen HC, Fan SC, Lin JH, Cheng YL, Jeng SP, Wu CM |
491 - 494 |
Orientation of metal films deposited by sputtering using Ar/N-2 gas mixtures Kawamura M, Abe Y, Sasaki K |
495 - 499 |
NbS2 thin films by atmospheric pressure chemical vapour deposition and the formation of a new 1T polytype Carmalt CJ, Manning TD, Parkin IP, Peters ES, Hector AL |
500 - 504 |
X-ray reflectivity study of the structural characteristics of BaTiO3/LaNiO3 superlattice Liang YC, Wu TB, Lee HY, Liu HJ |
505 - 512 |
Elastic and plastic work of indentation as a characteristic of wear behavior for cutting tools with nitride PVD coatings Fox-Rabinovich GS, Veldhuis SC, Scvortsov VN, Shuster LS, Dosbaeva GK, Migranov MS |
513 - 517 |
Autocorrelation function analysis of phase formation in the initial stage of interfacial reactions of multilayered titanium-silicon thin films Yang TH, Cheng SL, Chen LJ |