1 - 9 |
Characterisation of r.f. sputtered tungsten disulfide and oxysulfide thin films Martin-Litas I, Vinatier P, Levasseur A, Dupin JC |
10 - 15 |
Mechanism of electrical conduction in plasma polymerized furfural thin films Mathai CJ, Anantharaman MR, Venkitachalam S, Jayalekshmi S |
16 - 23 |
Structural study of anodic films formed on aluminum in nitric acid electrolyte Yakovleva NM, Anicai L, Yakovlev AN, Dima L, Khanina EY, Buda M, Chupakhina EA |
24 - 30 |
Infrared characterisation of evaporated SiO thin films Perez G, Sanz JM |
31 - 37 |
The effect of heat treatment on the microstructure of electroless Ni-P coatings containing SiC particles Chen CK, Feng HM, Lin HC, Hon MH |
38 - 40 |
Nitrogen in diamond films grown by direct current arcjet plasma process using gas recycling Zhang HD, Song JH, Tian JZ, Tang W, Lu FX |
41 - 48 |
Kinetics, thermodynamics and microstructure of tungsten rods grown by thermal laser CVD Bjorklund KL, Lu J, Heszler P, Boman M |
49 - 53 |
Structural characterization of semi-strained layer (GaAs)(1-x)(Si-2)(x)/GaAs multilayers grown by magnetron sputtering Rosendo E, Rodriguez AG, Navarro-Contreras H, Vidal MA, Asomoza R, Kudriavtsev Y |
54 - 61 |
Effect of N-2 addition on growth and properties of titanium nitride films obtained by atmospheric pressure chemical vapor deposition Huang HH, Hon MH |
62 - 65 |
Microstructure control of YMnO3 thin films on Si (100) substrates Yoo DC, Lee JY, Kim IS, Kim YT |
66 - 71 |
Effect of bottom electrodes on microstructures and electrical properties of sol-gel derived Pb(Zr0.53Ti0.47)O-3 thin films Wang ZJ, Chu JR, Maeda R, Kokawa H |
72 - 79 |
Comparison of hafnium oxide films grown by atomic layer deposition from iodide and chloride precursors Kukli K, Ritala M, Sajavaara T, Keinonen J, Leskela M |
80 - 84 |
Photo-induced surface charge separation in Cr-implanted TiO2 thin film Sumita T, Yamaki T, Yamamoto S, Miyashita A |
85 - 91 |
Field emission of nanostructured amorphous SiCN films deposited by reactive magnetron sputtering of SiC in CH4/N-2 atmosphere Lin HY, Chen YC, Lin CY, Tong YP, Hwa LG, Chen KH, Chen LC |
92 - 96 |
High rate deposition of transparent conducting oxide thin films by vacuum arc plasma evaporation Minami T, Ida S, Miyata T |
97 - 105 |
Phase modulated spectroscopic ellipsometry of dielectric multilayer beam combiner Bhattacharyya D, Sahoo NK, Thakur S, Das NC |
106 - 113 |
Oxidation process in pulsed laser ablation of Si with various ambients Masuda A, Usui S, Yamanaka Y, Yonezawa Y, Minamikawa T, Suzuki M, Morimoto A, Kumeda M, Shimizu T |
114 - 121 |
Effect of annealing on the interface structure of cross-beam pulsed laser deposited Co/Cu multilayers Prokert F, Noetzel J, Schell N, Wieser E, Gorbunov A |
122 - 128 |
Interfacial and structural characteristics of CeO2 films on silicon with a nitrided interface formed by nitrogen-ion-beam bombardment Kang JF, Xun K, Liu XY, Han RQ, Wang YY, Yu DP, Lian GJ, Xiong GC, Wu SC |
129 - 135 |
Microstructural characteristics of cold-sprayed nanostructured WC-Co coatings Lima RS, Karthikeyan J, Kay CM, Lindemann J, Berndt CC |
136 - 144 |
Correlation between microstructure and barrier properties of TiN thin films used Cu interconnects Moriyama M, Kawazoe T, Tanaka M, Murakami M |
145 - 152 |
Mechanical and tribological properties of Ar incorporated diamond-like carbon films Zhang W, Tanaka A, Wazumi K, Koga Y |
153 - 159 |
Effect of C+ implantation on the structure and tribological properties of three metal/SiO2 systems Lu JJ, Xu T, Zhang PY, Yang SR, Qi SK, Xue QJ |
160 - 168 |
Low temperature plasma immersion ion implantation of nitrogen on a mould steel Rossi S, Massiani Y, Bertassi E, Torregrosa F, Fedrizzi L |
169 - 173 |
Determination of the diffusivity of point defects in passive films on carbon steel Cheng YF, Yang C, Luo JL |
174 - 183 |
Indentation deformation and fracture of thin polystyrene films Li M, Palacio ML, Carter CB, Gerberich WW |
184 - 189 |
Characteristics of the CdZnS thin film doped by indium diffusion Lee JH, Song WC, Yang KJ, Yoo YS |
190 - 196 |
A novel method of fabricating ZnO/diamond/Si multilayers for surface acoustic wave (SAW) device applications Seo SH, Shin WC, Park JS |
197 - 200 |
Luminescence properties of transparent hybrid thin film covalently linked with lanthanide complexes Li HR, Fu LS, Lin J, Zhang HJ |
201 - 207 |
Blue double layer devices obtained by spin-coating Jousseaume V, Maindron T, Wang Y, Dodelet JP, Lu J, Hlil AR, Hay AS, D'Iorio M |
208 - 211 |
Hf1-xSixO2 deposition by metal organic chemical vapor deposition using the Hf(NEt2)(4)/SiH(NEt2)(3)/O-2 gas system Ohshita Y, Ogura A, Ishikawa M, Hoshino A, Hiiro S, Suzuki T, Machida H |
212 - 217 |
Efficient emission from a europium complex containing dendron-substituted diketone ligands Jiang XZ, Jen AKY, Phelan GD, Huang DY, Londergan TM, Dalton LR, Register RA |
218 - 223 |
Optical characteristics of (La, Ce)B-6 films deposited on silicon substrates by e-beam evaporation process Kafadaryan EA, Petrosyan SI, Badalyan GR, Harutyunyan SR, Kuzanyan AS |
224 - 232 |
Plasma-enhanced chemical vapor deposition of SiOx/SiNx Bragg reflectors Gottschalch V, Schmidt R, Rheinlander B, Pudis D, Hardt S, Kvietkova J, Wagner G, Franzheld R |
233 - 241 |
Spectroscopic ellipsometry of the optical functions of tris (8-hydroxyquinoline) aluminum (Alq(3)) Djurisic AB, Kwong CY, Guo WL, Lau TW, Li EH, Liu ZT, Kwok HS, Lam LSM, Chan WK |
242 - 247 |
Sol-gel fabrication of thick multilayers applied to Bragg reflectors and microcavities Rabaste S, Bellessa J, Brioude A, Bovier C, Plenet JC, Brenier R, Marty O, Mugnier J, Dumas J |
248 - 253 |
Preparation of SnO2 films with high sensitivity and selectivity to C2H5OH by oxygen radical assisted electron beam evaporation for micro-machined gas sensors Mo YW, Okawa Y, Nakai T, Tajima M, Natukawa K |
254 - 259 |
Improvement of the superconducting properties of YBCO thin films upon annealing of CeO2/Al2O3 substrate Spankova M, Vavra I, Chromik S, Gazi S, Strbik V, Kus P, Machajdik D, Benacka S |
260 - 263 |
Selectivity enhancement of indium-doped SnO2 gas sensors Salehi A |
264 - 270 |
Orientation effects in chemical solution derived Pb(Zr-0.3,Ti-0.7)O-3 thin films on ferroelectric properties Kim SH, Park DY, Woo HJ, Lee DS, Ha J, Hwang CS, Shim IB, Kingon AI |
271 - 278 |
Fabrication and characteristics of SnO2 gas sensor array for volatile organic compounds recognition Lee DS, Kim YT, Huh JS, Lee DD |
279 - 283 |
Preparation of thin Ureasil films with strong photoluminescence based on incorporated europium-thenoyltrifluoroacetone-bipyridine complexes Moleski R, Stathatos E, Bekiari V, Lianos P |
284 - 293 |
Structural electrical and optical properties of undoped and indium doped ZnO thin films prepared by the pyrosol process at different temperatures Tokumoto MS, Smith A, Santilli CV, Pulcinelli SH, Craievich AF, Elkaim E, Traverse A, Briois V |
294 - 301 |
Photo-stimulated current spectroscopy and its application in detecting aluminum implantation-induced deep traps in GaN Xu XL, He HY, Liu HT, Shi CS, Ge WK, Luo EZ, Sundaravel B, Wilson IH |