1 - 1 |
Polycrystalline semiconductors VIII - Preface Strunk HP, Werner JH |
2 - 7 |
Theoretical description of hopping transport in disordered materials Baranovskii SD, Rubel O, Thomas P |
8 - 13 |
Lateral variations of optoelectronic quality of Cu(In1-xGax)Se-2 in the submicron-scale Gutay L, Bauer GH |
14 - 18 |
A multi-diode model for spatially inhomogeneous solar cells Grabitz PO, Rau U, Werner JH |
19 - 25 |
Nanocrystalline silicon films grown by low energy plasma enhanced chemical vapor deposition for optoelectronic applications Binetti S, Acciarri M, Bollani M, Fumagalli L, von Kanel H, Pizzini S |
26 - 30 |
Large grain polycrystalline Si thin films by nucleation-controlled chemical vapor deposition using intermittent source gas supply Yamazaki T, Uraoka Y, Fuyuki T |
31 - 34 |
Structural and optical properties of AgIn5S8 films prepared by pulsed laser deposition Bodnar IV, Gremenok VF |
35 - 39 |
Effects of laser-ablated impurity on aligned ZnO nanorods grown by chemical vapor deposition Hirate T, Sasaki S, Li WC, Miyashita H, Kimpara T, Satoh T |
40 - 48 |
Electrodeposition of semiconductors Lincot D |
49 - 53 |
Electrochemical deposition of nanocrystalline PbSe layers onto p-Si (100) wafers Ivanou DK, Streltsov EA, Fedotov AK, Mazanik AV |
54 - 57 |
Cathodoluminescent behaviour of sprayed ZnS specimens Ebothe J, El Hichou A, Troyon M |
58 - 62 |
Excimer laser induced crystallization of amorphous silicon on flexible polymer substrates Imparato A, Minarini C, Rubino A, Tassini P, Villani F, Della Sala D, Amendola E, Kunst M, Neitzert HC, Bellone S |
63 - 66 |
Pulsed laser crystallization of very thin silicon films Sameshima T, Watakabe H, Andoh N, Higashi S |
67 - 71 |
Pulsed laser crystallization of silicon-germanium films Sameshima I, Watakabe H, Kanno H, Sadoh T, Miyao M |
72 - 76 |
Phase segregation in laser crystallized polycrystalline SiGe thin films Weizman M, Nickel NH, Sieber I, Bohne W, Rohrich J, Strub E, Yan B |
77 - 80 |
Laser crystallized multicrystalline silicon thin films on glass Andra G, Bergmann J, Falk F |
81 - 84 |
Solid phase post-treatment of polysilicon films by a continuous argon laser Michaud JF, Rogel R, Mohammed-Brahim T, Sarret M, Bonnaud O |
85 - 88 |
Production solutions in excimer laser thin film crystallization Brune J, Nikolaus B, Simon F |
89 - 92 |
Influence of laser annealing on hydrogen bonding in compensated polycrystalline silicon thin films Saleh R, Nickel NH, Maydell KV |
93 - 96 |
Electronic transport in P-doped laser-crystallized polycrystalline silicon Maydell KV, Brehme S, Nickel NH, Fuhs W |
97 - 101 |
Electrical property of coincidence site lattice grain boundary in location-controlled Si island by excimer-laser crystallization Ishihara R, He M, Rana V, Hiroshima Y, Inoue S, Shimoda T, Metselaar JW, Beenakker CIM |
102 - 106 |
Influence of metal induced crystallization parameters on the performance of polycrystalline silicon thin film transistors Pereira L, Barquinha P, Fortunato E, Martins R |
107 - 112 |
Aluminum-induced crystallization of amorphous silicon: Influence of temperature profiles Schneider J, Heimburger R, Klein J, Muske M, Gall S, Fuhs W |
113 - 117 |
Thin-film polycrystalline silicon solar cells on ceramic substrates by aluminium-induced crystallization Gordon I, Van Gestel D, Van Nieuwenhuysen K, Carnel L, Beaucarne G, Poortmans J |
118 - 121 |
Crystallization of silicon films by rapid joule heating method Andoh N, Sameshima T, Kitahara K |
122 - 125 |
Crystallization of Si films on glass substrate using thermal plasma jet Higashi S, Kaku H, Taniguchi H, Murakami H, Miyazaki S |
126 - 131 |
Hydrogen diffusion and induced-crystallization in intrinsic and doped hydrogenated amorphous silicon films Kail F, Hadjadj A, Cabarrocas PRI |
132 - 136 |
Recombination at silicon dangling bonds Boehme C, Friedrich F, Ehara T, Lips K |
137 - 141 |
Structural defects and photoluminescence of epitaxial Si films grown at low temperatures Petter K, Sieber I, Rau B, Brehme S, Lips K, Fuhs W |
142 - 146 |
Simulation of carbon containing complexes at silicon-silicon grain boundaries in cluster approximation Pushkarchuk AL, Saad AM, Fedotov AK, Kuten SA |
147 - 151 |
Defect passivation in chemical vapour deposited fine-grained polycrystalline silicon by plasma hydrogenation Carnel L, Gordon I, Van Nieuwenhuysen K, Van Gestel D, Beaucarne G, Poortmans J |
152 - 156 |
Effect of hydrogen passivation on polycrystalline silicon thin films Honda S, Mates T, Ledinsky M, Oswald J, Fejfar A, Kocka J, Yamazaki T, Uraoka Y, Fuyuki T |
157 - 161 |
Nonradiative recombination and band bending of p-Si(100) surfaces during electrochemical deposition of polycrystalline ZnO Rappich J, Fahoume M |
162 - 169 |
Amorphous and nanocrystalline silicon-based multi-junction solar cells Yang J, Yan BJ, Guha S |
170 - 173 |
Role of buffer layer on the performances of amorphous silicon solar cells with incorporated nanoparticles produced by plasma enhanced chemical vapor deposition at 27.12 MHz Raniero L, Zhang S, Aguas H, Ferreira I, Igreja R, Fortunato E, Martins R |
174 - 178 |
Correlation between structural properties and performances of microcrystalline silicon solar cells Veneri PD, Mercaldo LV, Tassini P, Privato C |
179 - 187 |
Multicrystalline silicon for solar cells Moller HJ, Funke C, Rinio M, Scholz S |
188 - 192 |
Investigation of defect structures in multi-crystal line silicon by laser scattering tomography Naumann M, Kirscht F |
193 - 198 |
Investigation of CuInZnSe2 thin films for solar cell applications Gremenok VF, Zaretskaya EP, Siarheyeva VM, Bente K, Schmitz W, Zalesski VB, Moller HJ |
199 - 201 |
Preparation and photosensitivity investigation of n-GaSe/p-CuIn3Se5 heterostructures Bodnar IV, Victorov IA, Kushner TL, Rud' VY, Rud' VY |
202 - 204 |
Modification of electrical properties of CdSxSe1-x films by hard irradiation and nanostructuring Saad AM, Fedotov AK, Mazanik AV, Tarasik MI, Yanchenko AM, Posedko AS, Survilo LY, Trofimov YV, Kurilovich NF |
205 - 211 |
Recent advances in ZnO transparent thin film transistors Fortunato E, Barquinha P, Pimentel A, Goncalves A, Marques A, Pereira L, Martins R |
212 - 215 |
Polycrystalline intrinsic zinc oxide to be used in transparent electronic devices Pimentel A, Fortunato E, Goncalves A, Marques A, Aguas H, Pereira L, Ferreira I, Martins R |
216 - 220 |
Thermal degradation of low temperature poly-Si TFT Fuyuki T, Kitajima K, Yano H, Hatayama T, Uraoka Y, Hashimoto S, Morita Y |
221 - 226 |
Short channel effects in polysilicon thin film transistors Fortunato G, Valletta A, Gaucci P, Mariucci L, Brotherton SD |
227 - 231 |
Top-grate microcrystalline silicon TFTs processed at low temperature (< 200 degrees C) Saboundji A, Coulon N, Gorin A, Lhermite H, Mohammed-Brahim T, Fonrodona M, Bertomeu J, Andreu J |
232 - 236 |
Stable p-channel polysilicon thin film transistors fabricated by laser doping technique Di Gaspare A, Mariucci L, Pecora A, Fortunato G |
237 - 241 |
Improved electrical stability in asymmetric fingered polysilicon thin film transistors Cuscuna M, Mariucci L, Fortunato G, Bonfiglietti A, Pecora A, Valletta A |
242 - 246 |
Channel doping effects in poly-Si thin film transistors Valletta A, Mariucci L, Bonfiglietti A, Fortunato G, Brotherton SD |
247 - 251 |
The effect of generation-recombination mechanisms on the transient behavior of polycrystalline silicon transistors Papaioannou GJ, Voutsas A, Exarchos M, Kouvatsos D |
252 - 254 |
Activation of boron and phosphorus atoms implanted in polycrystalline silicon films at low temperatures Andoh N, Sameshima T, Andoh Y |
255 - 259 |
Inter-grain coupling effects on Coulomb oscillations in dual-gated nanocrystalline silicon point-contact transistors Khalafalla MAH, Durrani ZAK, Mizuta H, Ahmed H, Oda S |
260 - 267 |
Polycrystalline GaN for light emitter and field electron emitter applications Hasegawa S, Nishida S, Yamashita T, Asahi H |
268 - 270 |
Amorphous silicon-based PINIP structure for color sensor Zhang S, Raniero L, Fortunato E, Ferreira I, Aguas H, Martins R |
271 - 276 |
Role of annealing environment on the performances of large area ITO films produced by rf magnetron sputtering Canhola P, Martins N, Raniero L, Pereira S, Fortunato E, Ferreira I, Martins R |
277 - 282 |
Preparation and characterization of indium tin oxide thin films for their application as gas sensors Vaishnav VS, Patel PD, Patel NG |
283 - 287 |
Fabrication of deep single trenches from N-type macroporous silicon Gautier G, Ventura L, Pordie T, Rogel R, Jerisian R |