1 - 9 |
Multi-technique characterization of tantalum oxynitride films prepared by reactive direct current magnetron sputtering Venkataraj S, Kittur H, Drese R, Wuttig M |
10 - 19 |
Single crystal CrN/ScN superlattice soft X-ray mirrors: Epitaxial growth, structure, and properties Birch J, Joelsson I, Eriksson F, Ghafoor N, Hultman L |
20 - 24 |
The growth of silicon nanowires by electroless plating technique of Ni catalysts on silicon substrate Hsu JF, Huang BR |
25 - 32 |
Structural study of vapour phase deposited 3,4,9,10-perylene tetracarboxylicacid diimide: Comparison between single crystal and ultra thin films grown on Pt(100) Guillermet O, Mossoyan-Deneux M, Giorgi M, Glachant A, Mossoyan JC |
33 - 44 |
Effects of thermal treatment on structures of Cu/atomic-layer-deposited TaN films/Si stacks Wu YY, Eizenberg M |
45 - 51 |
Influence of plasma pulsing on the deposition kinetics and film structure in low pressure oxygen/hexamethyldisiloxane radiofrequency plasmas Bousquet A, Granier A, Goullet A, Landesman JP |
52 - 57 |
Ni-Cr thin film resistor fabrication for GaAs monolithic microwave integrated circuits Vinayak S, Vyas HP, Muraleedharan K, Vankar V |
58 - 62 |
In situ observation of heteroepitaxial beta-FeSi2 during electron-beam irradiation Han M, Bennett JC, Zhang Q, Tanaka M, Takeguchi M, Furuya K |
63 - 68 |
Growth of SnO2 thin films by atomic layer deposition and chemical vapour deposition: A comparative study Sundqvist J, Lu J, Ottosson M, Harsta A |
69 - 75 |
Synthesis of UV-curable organic-inorganic hybrid urethane acrylates and properties of cured films Xu JW, Pang WM, Shi WF |
76 - 80 |
Effects of etchant gas on the formation of carbon nanotip arrays grown by plasma-enhanced hot filament chemical vapor deposition Dang C, Wang BB |
81 - 86 |
Correlation of elastic modulus, hardness and density for sputtered TiAlBN thin films Rebholz C, Leyland A, Matthews A, Charitidis C, Logothetidis S, Schneider D |
87 - 96 |
Substrate related structural, electronic and electrochemical properties of evaporated CeOx ion storage layers Siokou A, Ntais S, Dracopoulos V, Papaefthimiou S, Leftheriotis G, Yianoulis P |
97 - 102 |
An infrared study of the surface chemistry of titanium nitride atomic layer deposition on silica from TiCl4 and NH3 Snyder MQ, Mccool BA, DiCarlo J, Tripp CP, DeSisto WJ |
103 - 109 |
Novel dendritic light-emitting materials containing polyhedral oligomeric silsesquioxanes core Chen KB, Chang YP, Yang SH, Hsu CS |
110 - 119 |
X-ray diffraction analysis of the anisotropic nature of the structural imperfections in a sputter-deposited TiO2/Ti3Al bilayer Zhao YH, Welzel U, van Lier J, Mittemeijer EJ |
120 - 126 |
Electroless deposition of gold and platinum for metallization of the intrapore space in porous gallium nitride Diaz DJ, Williamson TL, Guo XY, Sood A, Bohn PW |
127 - 131 |
Preparation and characterization of a layered perovskite-type organic-inorganic hybrid compound (C8NH6-CH2CH2NH3)(2)CuCl4 Zheng YY, Wu G, Deng M, Chen HZ, Wang M, Tang BZ |
132 - 137 |
Multicolor luminescence of undoped zinc sulfide nanocrystalline thin films at room temperature Bhattacharjee B, Lu CH |
138 - 144 |
On the nucleation of the cubic phase in boron nitride films Ye J, Oechsner H |
145 - 149 |
Atomic layer deposition of B2O3 thin films at room temperature Putkonen M, Niinisto L |
150 - 155 |
Electrical properties of CdTe/CdS solar cells investigated with conductive atomic force microscopy Moutinho HR, Dhere RG, Jiang CS, Al-Jassim MM, Kazmerski LL |
156 - 164 |
Electronic and geometric structure of electro-optically active organic films and associated interfaces Ivanco J, Haber T, Resel R, Netzer FP, Ramsey MG |
165 - 173 |
Ordering and dewetting in spin-coated films of a liquid crystalline main chain polymer Sapich B, Vix ABE, Rabe JP, Stumpe J, Wilbert G, Zentel R |
174 - 181 |
Sol-gel coatings with phosphonate functionalities for surface modification of magnesium alloys Khramov AN, Balbyshev VN, Kasten LS, Mantz RA |
182 - 187 |
Surface modification of polystyrene by low energy hydrogen ion beam Xu XD, Kwok RWM, Lau WM |
188 - 192 |
Effects of plasma pretreatment on silicon nitride barrier films on polycarbonate substrates Chen TN, Wuu DS, Wu CC, Chiang CC, Lin HB, Chen YP, Horng RH |
193 - 197 |
Etch rate and surface morphology of polycrystalline beta-silicon carbide using chlorine trifluoride gas Habuka H, Oda S, Fukai Y, Fukae K, Takeuchi T, Aihara M |
198 - 203 |
An investigation of the growth and removal of protective antimony caps for antimonide epilayers Alcock SG, Everard MJ, Nicklin CL, Taylor JSG, Norris CA, Bennett SL |
204 - 211 |
Electrochemical behavior of single layer CrN, TiN, TiAlN coatings and nanolayered TiAlN/CrN multilayer coatings prepared by reactive direct current magnetron sputtering Grips VKW, Barshilia HC, Selvi VE, Kalavati, Rajam KS |
212 - 222 |
Impact of plasma-sprayed metal particles on hot and cold glass surfaces McDonald A, Lamontagne M, Moreau C, Chandra S |
223 - 230 |
Rheological analysis of creep in hydrogenated amorphous carbon films Lemoine P, Quinn JP, Maguire P, Papakonstantinou P, Dougan N |
231 - 239 |
Sliding friction and wear property of a-C and a-CNx coatings against SiC balls in water Zhou F, Adachi K, Kato K |
240 - 249 |
Some consequences of the partial crystallographic coherence between nanocrystalline domains in Ti-Al-N and Ti-Al-Si-N coatings Rafaja D, Poklad A, Klemm V, Schreiber G, Heger D, Sima M, Dopita M |
250 - 253 |
Characterization of double floating guard ring type InP-InGaAs avalanche photodiodes with Au/Zn low resistance ohmic contacts Kim MD, Baek JM, Kim TG, Kim SG, Chung KS |
254 - 257 |
Effect of buffer layer on minority carrier lifetime and series resistance of bifacial heterojunction silicon solar cells analyzed by impedance spectroscopy Garcia-Belmonte G, Garcia-Canadas J, Mora-Sero I, Bisquert J, Voz C, Puigdollers J, Alcubilla R |
258 - 266 |
High coloration performance of electrochromic devices assembled with electrolytes based on a branched boronate ester polymer and lithium perchlorate salt Pennarun PY, Jannasch P, Papaefthimiou S, Skarpentzos N, Yianoulis P |
267 - 271 |
Temperature dependence of the direct allowed transitions band gap and optical constants of polycrystalline alpha-In2Se3 thin films Qasrawi AF |
272 - 277 |
Non-linear dielectric properties of vacuum deposited nanocrystalline polyaniline thin films Misra SCK, Yadav M, Mathur P |
278 - 286 |
Non-destructive X-ray study of the interphases in Mo/Si and Mo/B4C/Si/B4C multilayers Maury H, Jonnard P, Andre JM, Gautier J, Roulliay M, Bridou F, Delmotte F, Ravet MF, Jerome A, Holliger P |
287 - 291 |
On dielectric spectra of thin copper phthalocyanine films Jarosz G, Signerski R, Brehmer L |
292 - 295 |
Photodetecting and electronic properties of poly(2-methoxy-5-(2'-ethylhexyloxy)-1,4-phenylenevinylene)-ethyl viologen dibromide blended thin film diodes Qi DF, Varahramyan K, Selmic S |
296 - 301 |
Room temperature synthesized GaAs quantum dot embedded in SiO2 composite film Lee S, Shin DW, Kim WM, Cheong BK, Lee TS, Lee KS, Cho S |
302 - 305 |
Array of organic thin film transistors integrated with organic light emitting diodes on a plastic substrate Ryu GS, Choe KB, Song CK |
306 - 309 |
Effect of total gas velocity on the growth of ZnO films by metal-organic chemical vapor deposition Zhu JJ, Yao R, Liu CH, Lee IH, Zhu LL, Ju JW, Baek JH, Lin BX, Fu ZX |
310 - 315 |
Carrier transport and optical properties in GaAs far-infrared/terahertz mirror structures Ye HB, Zhang YH, Shen WZ |
316 - 322 |
In situ hot stage transmission electron microscopy observations of nanocrystal formation in a Co65Si15B14Fe4Ni2 amorphous magnetic alloy Li HF, Ramanujan RV |
323 - 328 |
Electrical properties of Al2O3 films for TFEL-devices made with sol-gel technology Vanbesien K, De Visschere P, Smet PF, Poelman D |
329 - 333 |
The preparation of polyaniline intercalated MoO3 thin film and its sensitivity to volatile organic compounds Wang JZ, Matsubara I, Murayama N, Woosuck S, Izu N |
334 - 340 |
X-ray diffraction studies of the structure and orientations of thiophene and fluorenone based molecule Porzio W, Pasini M, Destri S, Giovanella U, Fontaine P |
341 - 343 |
Shear mode coupling and properties dispersion in 8 GHz range AlN thin film bulk acoustic wave (BAW) resonator Martin F, Jan ME, Belgacem B, Dubois MA, Muralt P |
344 - 349 |
The influence of the edge effect of the mask on the strain and the morphology of SiGe film grown at the patterned Si substrate by molecular beam epitaxy Yang HB, Zhang XJ, Jiang ZM, Lu XD, Bai LH, Yang XJ, Fan YL, Hu DZ, Sun YQ, Huang WN |
350 - 354 |
Nanoporous organosilicate films as antireflection coatings Biswas K, Gangopadhyay S, Kim HC, Miller RD |
355 - 360 |
Radio Frequency sputtered Si1-xGex and Si1-xGexOy thin films for uncooled infrared detectors Rana MM, Butler DP |