3865 - 3870 |
Structural and microstructural characterization of Bi2Te3 films deposited by the close space vapor transport method using scanning electron microscopy and X-ray diffraction techniques Cruz-Gandarilla F, Vigil-Galan O, Cabanas-Moreno JG, Sastre-Hernandez J, Roy F |
3871 - 3877 |
Doping optimization and surface modification of aluminum doped zinc oxide films as transparent conductive coating Inamdar D, Agashe C, Kadam P, Mahamuni S |
3878 - 3883 |
Growth mechanism investigation of SnO2 thin films deposited by aerosol pyrolysis for biosensor applications: Importance of the thickness Stambouli V, Manesse M, Ferrieu F, Rapenne L, Roussel H, Chaudouet P, Szunerits S |
3884 - 3891 |
The selective growth of rutile thin films using radio-frequency magnetron sputtering Kawashima N, Zhu QY, Gerson AR |
3892 - 3895 |
Structure and morphology of laser-ablated Pb thin films Gontad F, Lorusso A, Perrone A |
3896 - 3903 |
Structural, mechanical, and tribological properties of fluorinated mesoporous silica films: Effect of functional moiety and surfactant template concentrations Kessman AJ, DeFusco EE, Hoover AW, Sierros KA, Cairns DR |
3904 - 3909 |
Thermal, morphological and optical investigations of Cu(DAB)(2) thin films produced by matrix-assisted pulsed laser evaporation and laser-induced forward transfer for sensor development Constantinescu C, Morintale E, Ion V, Moldovan A, Luculescu C, Dinescu M, Rotaru P |
3910 - 3913 |
Effect of oxygen on structural stability of nitrogen-doped germanium telluride films with and without silicon nitride layer Kim KH, Choi SJ, Kyoung YK, Lee JH |
3914 - 3917 |
Semiconductor thin films directly from minerals study of structural, optical, and transport characteristics of Cu2O thin films from malachite mineral and synthetic CuO Balasubramaniam KR, Kao VM, Ravichandran J, Rossen PB, Siemons W, Ager JW |
3918 - 3921 |
On the nu SiO infrared absorption of polysiloxane films Chazalviel JN, Rodrigues UP |
3922 - 3926 |
Growth of stoichiometric TiO2 thin films on Au(100) substrates by molecular beam epitaxy Calloni A, Ferrari A, Brambilla A, Ciccacci F, Duo L |
3927 - 3930 |
Low-temperature growth of Ge1-xSnx thin films with strain control by molecular beam epitaxy Lin H, Chen R, Huo YJ, Kamins TI, Harris JS |
3931 - 3935 |
Investigation of inter-diffusion in bilayer GeTe/SnSe phase change memory films Devasia A, MacMahon D, Raoux S, Campbell KA, Kurinec SK |
3936 - 3945 |
Initial stages of the ion-beam assisted epitaxial GaN film growth on 6H-SiC(0001) Neumann L, Gerlach JW, Rauschenbach B |
3946 - 3951 |
t-Butyl group-substituted triphenylamine-containing orange-red fluorescent emitters for organic light-emitting diodes Lee KH, Kim CS, Kim YK, Yoon SS |
3952 - 3959 |
Under-surface observation of thin-film alumina on NiAl(100) with scanning tunneling microscopy Wang CT, Lin CW, Hsia CL, Chang BW, Luo MF |
3960 - 3964 |
The adsorption of O on (001) and (111) CdTe surfaces: A first-principles study Wang JL, Tang G, Wu XS, Gu MQ |
3965 - 3970 |
Comparative study of surface morphology of copper phthalocyanine ultra thin films deposited on Si (111) native and RCA-cleaned substrates Krzywiecki M, Grzadziel L, Bodzenta J, Szuber J |
3971 - 3974 |
High-quality parallel patterning of carbon nanotube thin films by a pulsed laser beam Joo M, Lee M |
3975 - 3986 |
Intrinsic work function of molecular films Ivanco J |
3987 - 3993 |
Magnetically actuated peel test for thin films Ostrowicki GT, Sitaraman SK |
3994 - 3998 |
Temperature dependence of SiO2 film growth with plasma-enhanced atomic layer deposition Kobayashi A, Tsuji N, Fukazawa A, Kobayashi N |
3999 - 4002 |
Optical emission spectroscopy as a process control tool during plasma enhanced chemical vapor deposition of microcrystalline silicon thin films Du CC, Wei TC, Chang CH, Lee SL, Liang MW, Huang JR, Wu CH, Shirakura A, Morisawa R, Suzuki T |
4003 - 4007 |
High-efficiency white organic light-emitting devices with a non-doped yellow phosphorescent emissive layer Zhao J, Yu JS, Hu X, Hou MH, Jiang YD |
4008 - 4015 |
Multi-layer deposition of conformal, transparent, conducting oxide films for device applications Nie WY, Li Y, Zhou W, Liu JW, Carroll DL |
4016 - 4020 |
Mechanisms of current conduction in Pt/BaTiO3/Pt resistive switching cell Pan RK, Zhang TJ, Wang JY, Wang JZ, Wang DF, Duan MG |
4021 - 4025 |
A gradual annealing of amorphous sputtered indium tin oxide: Crystalline structure and electrical characteristics Legeay G, Castel X |
4026 - 4030 |
Study of optical losses of Nd3+ doped silicon rich silicon oxide for laser cavity Pirasteh P, Charrier J, Dumeige Y, Boucher YG, Debieu O, Gourbilleau F |
4031 - 4035 |
Solution-processed zinc tetrabenzoporphyrin thin-films and transistors Shea PB, Yamada H, Ono N, Kanicki J |
4036 - 4040 |
Influence of the electro-optical properties of an alpha-Si:H single layer on the performances of a pin solar cell Crupi I, Ruggeri FS, Grasso A, Ruffino F, Catania G, Piro AM, Di Marco S, Mirabella S, Simone F, Priolo F |
4041 - 4045 |
Indium tin oxide coatings properties as a function of the deposition atmosphere Tului M, Bellucci A, Bellini S, Albolino A, Migliozzi G |
4046 - 4056 |
Reorganization of Langmuir-Blodgett layers of silica nanoparticles induced by the low energy, high fluence ion irradiation Lugomer S, Zolnai Z, Toth AL, Barsony I, Maksimovic A, Nagy N |
4057 - 4062 |
Nanocrystalline chemically modified CdIn2O4 thick films for H2S gas sensor Chaudhari GN, Alvi M, Wankhade HG, Bodade AB, Manorama SV |
4063 - 4067 |
Hydrogen activity tuning of Pt-doped WO3 photonic crystal Xie ZY, Xu H, Rong F, Sun LG, Zhang SZ, Gu ZZ |
4068 - 4073 |
Study on the antimony tin oxide as a hole injection layer for polymer light emitting diodes Song IS, Heo SW, Ku JR, Moon DK |
4074 - 4079 |
Microstructural evolution in nanostructured gold films Karoutsos V, Toudas M, Delimitis A, Grammatikopoulos S, Poulopoulos P |
4080 - 4088 |
Toughness enhancement in TiAlN-based quarternary alloys Sangiovanni DG, Chirita V, Hultman L |
4089 - 4091 |
Dependence of magnetic properties on the Fe2+ ion in Ba-doped BiFeO3 multiferroic films Yu BF, Li MY, Wang J, Hu ZQ, Liu XL, Zhu YD, Zhao XZ |