Thin Solid Films

Thin Solid Films, Vol.517, No.18 Entire volume, number list

ISSN: 0040-6090 (Print)

In this Issue (39 articles)

5395 - 5398	Properties of indium tin oxide films deposited on unheated polymer substrates by ion beam assisted deposition Yu ZN, Li YQ, Xia F, Zhao ZW, Xue W
5399 - 5403	Passivation of pinhole defect microelectrode arrays in ultrathin silica films immobilized on gold substrates Macech P, Pemberton JE
5404 - 5408	Low resistive diamond like carbon film development technique Panosyan ZR, Darbasyan AT, Meliksetyan VA, Voskanyan SS, Voskanyan AS, Sahakyan AA, Gzraryan RV
5409 - 5414	Characterization of thin TiO2 films prepared by plasma enhanced chemical vapour deposition for optical and photocatalytic applications Sobczyk-Guzenda A, Gazicki-Lipman M, Szymanowski H, Kowalski J, Wojciechowski P, Halamus T, Tracz A
5415 - 5418	Influence of the growth conditions on the stoichiometry and on the optical properties of titanium oxide thin films prepared by reactive sputtering Perez-Pacheco A, Prieto C, Castaneda-Guzman R, Garcia-Lopez J
5419 - 5424	Characterization of size-quantized PbTe thin films synthesized by an electrochemical co-deposition method Erdogan IY, Oznuluer T, Bulbul F, Demir U
5425 - 5430	Effect of film thickness and agglomerate size on the superwetting and fog-free characteristics of TiO2 films Law WS, Lam SW, Gan WY, Scott J, Amal R
5431 - 5434	Direct current electrical conduction mechanism in plasma polymerized thin films of tetraethylorthosilicate Zaman M, Bhuiyan AH
5435 - 5441	Electrosynthesis and characterisation of poly(safranine T) electroactive polymer films Pauliukaite R, Selskiene A, Malinauskas A, Brett CMA
5442 - 5445	Optical properties of tungsten oxide thin films by non-reactive sputtering Acosta M, Gonzalez D, Riech I
5446 - 5452	Electrical characteristics of mixed Zr-Si oxide thin films prepared by ion beam induced chemical vapor deposition at room temperature Ferrer FJ, Frutos F, Garcia-Lopez J, Jimenez C, Yubero F
5453 - 5458	Correlating Raman-spectroscopy and high-resolution transmission-electron-microscopy studies of amorphous/nanocrystalline multilayered silicon thin films Gajovic A, Gracin D, Juraic K, Sancho-Parramon J, Ceh M
5459 - 5463	Monoparticulate films of polyaniline Tosheva L, Gospodinova N, Vidal L, Mihai I, Defaux M, Ivanov DA, Doyle AM
5464 - 5467	Characterization of copper oxide nanolayers deposited by direct current magnetron sputtering Rastkar AR, Niknam AR, Shokri B
5468 - 5473	The structure of Si-SiO2 layers with high excess Si content prepared by magnetron sputtering Baran N, Bulakh B, Venger Y, Korsunska N, Khomenkova L, Stara T, Goldstein Y, Savir E, Jedrzejewski J
5474 - 5481	Scanning tunneling microscopy investigations of electropolymerized tetra-arylporphyrin complexes Drouet S, Ballut S, Rault-Berthelot J, Turban P, Paul-Roth C
5482 - 5488	Study of defects and thermal stability of ultrathin Cu films on Ta(110) and Ta(100) by thermal helium desorption spectrometry Venugopal V, Thijsse BJ
5489 - 5495	Ultraviolet-induced surface modification of polyurethane films in the presence of oxygen or acrylic acid vapours Weibel DE, Michels AF, Horowitz F, Cavalheiro RD, Mota GVD
5496 - 5501	Adhesion study of pulsed laser deposited hydroxyapatite coating on laser surface nitrided titanium Man HC, Chiu KY, Cheng FT, Wong KH
5502 - 5507	Electron doping into the surface of SrTiO3 single crystal by using a field effect transistor structure having a polyvinyl alcohol gate insulator layer Sakai M, Seo K, Ohkawa Y, Okuda T
5508 - 5511	Effects of (NH4)(2)S-x treatment on the electrical and optical properties of indium tin oxide/conducting polymer electrodes Lin YJ, Liu BY, Chin YM
5512 - 5515	Ab initio supercell calculations of the (0001) alpha-Cr2O3 surface with a partially or totally Al-substituted external layer Sun JZ, Stirner T
5516 - 5522	Nanostructural, electrical, and tribological properties of composite Au-MoS2 coatings Lince JR, Kim HI, Adams PM, Dickrell DJ, Dugger MT
5523 - 5529	Enhancement of the photoelectrochemical response of poly(terthiophenes) by CdS(ZnS) core-shell nanoparticles Santos MJL, Ferreira J, Radovanovic E, Romano R, Alves OL, Girotto EM
5530 - 5536	Determination of optical constants of thin films from transmittance trace Bhattacharyya SR, Gayen RN, Paul R, Pal AK
5537 - 5542	Characterizations of gallium-doped ZnO films on glass substrate prepared by atmospheric pressure metal-organic chemical vapor deposition Huang YC, Li ZY, Chen HH, Uen WY, Lan SM, Liao SM, Huang YH, Ku CT, Chen MC, Yang TN, Chiang CC
5543 - 5547	Low temperature atomic layer deposition of high-k dielectric stacks for scaled metal-oxide-semiconductor devices Bethge O, Abermann S, Henkel C, Bertagnolli E
5548 - 5552	Reactively sputtered ZrN for application as reflecting back contact in Cu(In,Ga)Se-2 solar cells Schleussner S, Kubart T, Torndahl T, Edoff M
5553 - 5556	Retardance of chalcogenide thin films grown by the oblique-angle-deposition technique Martin-Palma RJ, Zhang F, Lakhtakia A, Cheng A, Xu J, Pantano CG
5557 - 5562	Magnetic instability of giant magnetoresistance spin-valves due to electromigration-induced inter-diffusion Jiang J, Bae S, Ryu H
5563 - 5568	Electrical, optical, and structural properties of InZnSnO electrode films grown by unbalanced radio frequency magnetron sputtering Park HK, Jeong JA, Park YS, Kim HK, Cho WJ
5569 - 5572	Amorphous carbon-silicon heterojunctions by pulsed Nd:YAG laser deposition Yap SS, Yow HK, Tou TY
5573 - 5575	Transparent organic bistable memory devices using a low resistance transparent electrode Yook KS, Lee JY
5576 - 5579	Estimation of oxidation states of AlOx barriers in a tunneling junction by inelastic electron tunneling spectroscopy Horikiri K, Morizumi M, Shiiki K
5580 - 5583	A theoretical investigation on the contrast limitations of dual electrochromic systems Padilla J
5584 - 5588	Binuclear aluminum complex as an efficient orange emitter in single-layer electroluminescent devices Liu XM, Xia H, Ma YG, Mu Y
5589 - 5592	Direct comparison of the electrical properties in metal/oxide/nitride/oxide/silicon and metal/aluminum oxide/nitride/oxide/silicon capacitors with equivalent oxide thicknesses An HM, Seo YJ, Kim HD, Kim KC, Kim JG, Cho WJ, Koh JH, Sung YM, Kim TG
5593 - 5596	Diffusion barrier capability of Zr-Si films for copper metallization with different substrate bias voltage Wang Y, Cao F, Shao L, Ding MH
5597 - 5600	Characterization of self-assembled monolayers by using a near-field microwave scanning microprobe Babajanyan A, Melikyan H, Sargsyan T, Kim S, Kim J, Lee K, Friedman B