163 - 166 |
Reflectivity of Gradient-Index Multi-Coated Films Prepared by the Sol-Gel Process Nishide T, Shinoda M, Mizukami F |
167 - 171 |
Structural, Optical and Magnetic-Properties of Cd0.77Mn0.23Te Thin-Films Chandra S, Malhotra LK, Rastogi AC |
172 - 183 |
The Effect of Substrate Surface-Temperature on the Morphology and Quality of Diamond Films Produced by the Oxyacetylene Combustion Method Bang K, Ghajar AJ, Komanduri R |
184 - 190 |
Phase Segregation in Vapor-Deposited Co-Cr Magnetic Thin-Films, Observed by X-Ray-Absorption Fine-Structure Spectroscopy Kizler P, Hagemeyer A, Hibst H |
191 - 194 |
Ir and Dielectric Studies of Plasma-Polymerized M-Xylene Thin-Films Islam O, Bhuiyan AH, Ahmed S |
195 - 198 |
UV Photoelectron Yield Spectroscopy of Chalcopyrite Structure Cu-in-Se Thin-Films Kohiki S, Nishitani M, Negami T, Wada T, Monjushiro H, Watanabe I, Yokoyama Y |
199 - 206 |
Photoacoustic Characterization of Thermal Transport-Properties in Thin-Films and Microstructures Rohde M |
207 - 212 |
A Parametric Study of Pulsed-Laser Deposited Niobium Diselenide Thin-Film Growth Day AE, Zabinski JS |
213 - 217 |
Pyrite Film Formation by H2S Reactive Annealing of Iron Pimenta G, Kautek W |
218 - 227 |
A New Route for the Deposition of SiO2 Sol-Gel Coatings Marage P, Langlet M, Joubert JC |
228 - 241 |
Plasma-Jet Behavior and Modeling Associated with the Plasma Spray Process Pfender E |
242 - 247 |
Applicability of the Tougaard Ratio-D in the Analysis of Nanometric TiO2 Overlayers Johansson LS, Juhanoja J |
248 - 257 |
Multiple Layer Coating Scheme to Protect Polymer-Films from Atomic Oxygen Erosion Mutikainen R |
258 - 265 |
Electrical and Structural-Properties of Thin Gold-Films on Glass Substrates Hecht D, Stark D |
266 - 270 |
Electronic Transport and Localized States Distribution in Thin Coronene Layers Mycielski W, Staryga E, Kasica H, Lipinski A |
271 - 275 |
Influence of an Internal Electric-Field in a Sample on the Secondary-Electron Emission Phenomenon Olesik J, Calusinski B |
276 - 279 |
Selective Laser Oxidation of Thin Metal-Film as an Effect of Different Thermal Regimes Barborica A, Chitica N, Dinescu M, Mihailescu IN, Ursu I |
280 - 284 |
Electrochemical Properties of Hexadecanoyltetrathiafulvalene Langmuir-Blodgett-Films Goldenberg LM, Cooke G, Pearson C, Monkman AP, Bryce MR, Petty MC |
285 - 289 |
Nanothin Films of Tubular Oligopeptides - Monolayers and Langmuir-Blodgett-Films of Beta(4.4)-Helices with Surface-Pressure-Dependent Orientation Romer DU, Lorenzi GP, Weisenhorn AL |
290 - 294 |
Space Charge-Limited Currents in Thin-Film Solid Dielectrics with Nonuniform Deep-Trap Distributions - Numerical-Solutions Bak GW, Lipinski A |
295 - 301 |
Characterization of Obliquely Deposited Tungsten/Silicon Multilayers Majkova E, Luby S, Jergel M, Senderak R, George B, Vaezzadeh M, Ghanbaja J |
302 - 311 |
The Crossover from Strong to Intermediate Substrate Regimes in Multilayer Adsorption Kruk M, Patrykiejew A, Sokolowski S |
312 - 317 |
Resistivity and Magnetoresistance-Elastoresistance of Polycrystalline Ni-Si Thin-Films Belumarian A, Serbanescu MD, Manaila R, Teodorescu V, Ivanov I |