Thin Solid Films

Thin Solid Films, Vol.264, No.2 Entire volume, number list

ISSN: 0040-6090 (Print)

In this Issue (30 articles)

IX - X	Preface Fuchs H
135 - 140	Nanostructures in Industrial Materials Reihs K
141 - 147	The Influence of Experimental Parameters on Contrast Formation in Magnetic Force Microscopy Krause F, Kaisinger F, Starke H, Persch G, Hartmann U
148 - 152	AFM and TEM Investigations of Polypropylene/Polyurethane Blends Reifer D, Windeit R, Kumpf RJ, Karbach A, Fuchs H
153 - 158	Application of Atomic-Force Microscopy for Microindentation Testing Petzold M, Landgraf J, Futing M, Olaf JM
159 - 164	Characterization of a Cantilever with an Integrated Deflection Sensor Linnemann R, Gotszalk T, Hadjiiski L, Rangelow IW
165 - 168	The Atomic-Force Microscope as a Near-Field Probe for Ultrasound Rabe U, Dvorak M, Arnold W
169 - 171	Application of the Needle Sensor for Microstructure Measurements and Atomic-Force Microscopy Grunewald U, Bartzke K, Antrack T
172 - 175	1 MHz Quartz Length Extension Resonator as a Probe for Scanning Near-Field Acoustic Microscopy Michels A, Meinen F, Murdfield T, Gohde W, Fischer UC, Beckmann E, Fuchs H
176 - 183	Force Microscopic Investigation of Human Teeth in Liquids Sollbohmer O, May KP, Anders M
184 - 193	Membrane Characterization by Means of Pneumatic Scanning Force Microscopy Kamusewitz H, Keller M, Paul D
194 - 204	Organic Film Formation Investigated by Atomic-Force Microscopy on the Nanometer-Scale Gesang T, Hoper R, Dieckhoff S, Schlett V, Possart W, Hennemann OD
205 - 211	AFM for the Imaging of Large and Steep Submicroscopic Features, Artifacts and Scraping with Asymmetric Cantilever Tips Kaupp G, Schmeyers J, Pogodda U, Haak M, Marquardt T, Plagmann M
212 - 216	Lattice-Resolution AFM on the Layered Dichalcogenide WSe2 in the Sliding Regime Schimmel T, Kuppers J, Luxsteiner M
217 - 222	An Ultra-High-Resolution Control Unit for a Scanning Tunneling Microscope Heuell P, Cuzdi S, Kulakov MA, Bullemer B
223 - 225	Thermovoltages in Vacuum Tunneling Investigated by Scanning-Tunneling-Microscopy Hoffmann DH, Rettenberger A, Grand JY, Lauger K, Leiderer P, Dransfeld K, Moller R
226 - 229	Probing of Oscillating Surfaces by a Scanning Acoustic Tunneling Microscope Hesjedal T, Chilla E, Frohlich HJ
230 - 235	Kinetic Processes in Metal Epitaxy Studied with Variable-Temperature STM - Ag/Pt(111) Brune H, Roder H, Bromann K, Kern K
236 - 239	Scanning-Tunneling-Microscopy on Quenched Si(111) Surfaces Teufel L, Heuell P, Kulakov MA, Bullemer B
240 - 245	Adsorption of Self-Assembled Monolayers of Mercaptan on Gold Rohwerder M, Deweldige K, Vago E, Viefhaus H, Stratmann M
246 - 249	Structure and Dynamics of 2-Dimensional Adlayers of a 2-Pyridone Smectogen Studied by STM Heinz R, Rabe JP, Meister WV, Hoffmann S
250 - 254	Near-Field Optics - Light for the World of Nano-Scale Science Pohl DW
255 - 258	Optical Near-Field Characterization of Submicron Structured Silicon Films Bruckl H, Pagnia H, Sotnik N, Wilbertz C
259 - 263	Patterning of an Electron-Beam Resist with a Scanning Tunneling Microscope Operating in Air Kragler K, Gunther E, Leuschner R, Falk G, Vonseggern H, Saemannischenko G
264 - 267	Scanning Near-Field Optical Lithography Wegscheider S, Kirsch A, Mlynek J, Krausch G
268 - 272	Modification of Thin Gold-Films with a Scanning Force Microscope Schumacher HW, Kracke B, Damaschke B
273 - 276	Calculation of STM Profiles for Nanometrology Sbosny H, Koenders L, Hietschold M
277 - 281	Normalized Differential Conductivity and Surface-Density of States in Simulated Tunneling Spectroscopy Zhang Z, Bullemer B
282 - 290	Multivariate Estimation of the Systematic-Error of Scanning Probe Microscopes Rothe H
291 - 297	Application of Neural Networks to a Scanning Probe Microscopy System Hadjiiski L, Linnemann R, Stopka M, Oesterschulze E, Rangelow I, Kassing R