Thin Solid Films

Thin Solid Films, Vol.517, No.23 Entire volume, number list

ISSN: 0040-6090 (Print)

In this Issue (53 articles)

6217 - 6217	The Sixth Symposium on Thin Films for Large Area Electronics E-MRS 2008 Spring Meeting Preface Schropp REI, Cabarrocas PRI
6218 - 6224	Non-intrusive plasma diagnostics for the deposition of large area thin film silicon Howling AA, Strahm B, Hollenstein C
6225 - 6229	Interpretation of the hydrogen evolution during deposition of microcrystalline silicon by chemical transport Pham N, Hadjadj A, Cabarrocas PRI, Jbara O, Kail F
6230 - 6233	Real-time evaluation of thickness, optical properties and stoichiometry of SiOx gas barrier coatings on polymers Gioti M, Logothetidis S, Schroeder J, Steiniger G
6234 - 6238	An atomic-scale study of hydrogenated silicon cluster deposition on a crystalline silicon surface Ning N, Rinaldi SM, Vach H
6239 - 6242	Characterization of amorphous and nanostructured Si films by differential scanning calorimetry Roura P, Farjas J, Cabarrocas PRI
6243 - 6247	Atomic force microscopy study of TiO2 sol-gel films thermally treated under NH3 atmosphere Trapalis C, Todorova N, Anastasescu M, Anastasescu C, Stoica M, Gartner M, Zaharescu M, Stoica T
6248 - 6251	Model calculation of phototransport properties of minority carriers of fully crystalline undoped mu c-Si:H Ram SK, Kumar S, Cabarrocas PRI
6252 - 6255	Discharge characteristics of plasma display panels with Si-doped MgO protective layers Ram SK, Barik UK, Sarkar S, Biswas P, Singh V, Dwivedi HK, Kumar S
6256 - 6259	Enhanced infrared response of ultra thin amorphous silicon photosensitive devices with Ag nanoparticles Luo PQ, Moulin E, Sukmanowski J, Royer FX, Dou XM, Stiebig H
6260 - 6263	A Monte Carlo investigation of growth and characterization of heteroepitaxial thin films Fazouan N, Atmani E, Rouhani MD, Esteve A
6264 - 6270	X-ray textural and microstructural characterisations by using the Combined Analysis Approach for the optical optimisation of micro- and nano-structured thin films Morales M, Chateigner D, Lutterotti L
6271 - 6274	N-type PTCDI-C13H27 thin-film transistors deposited at different substrate temperature Puigdollers J, Della Pirriera M, Marsal A, Orpella A, Cheylan S, Voz C, Alcubilla R
6275 - 6279	On the influence of silicon oxide nanoparticles on the optical and surface properties of hybrid (inorganic-organic) barrier materials Laskarakis A, Logothetidis S, Georgiou D, Amberg-Schwab S, Weber U
6280 - 6282	Ultraviolet light effect on electrical properties of a flexible organic thin film transistor Lucas B, El Amrani A, Chakaroun M, Ratier B, Antony R, Moliton A
6283 - 6286	Pentacene TFTs with parylene passivation layer Simeone D, Cipolloni S, Mariucci L, Rapisarda M, Minotti A, Pecora A, Cuscuna M, Maiolo L, Fortunato G
6287 - 6289	Optical properties of SnO2:F films deposited by atmospheric pressure CVD Remes Z, Vanecek M, Yates HM, Evans P, Sheel DW
6290 - 6293	Structural and electrical properties of Al doped ZnO thin films deposited at room temperature on poly(vinilidene fluoride) substrates Oliveira C, Rebouta L, de Lacerda-Aroso T, Lanceros-Mendez S, Viseu T, Tavares CJ, Tovar J, Ferdov S, Alves E
6294 - 6297	Electrical and optical properties of 12CaO center dot 7Al(2)O(3) electride doped indium tin oxide thin film deposited by RF magnetron co-sputtering Tai PH, Jung CH, Kang YK, Yoon DH
6298 - 6300	High density plasma treatment of polyimide substrate to improve structural and electrical properties of Ga-doped ZnO films Kwon SI, Lee SJ, Jung TH, Park SB, Park JH, Song WC, Kang IN, Lim DG
6301 - 6304	Polarization dependence of the optical response in SnO2 and the effects from heavily F doping Canestraro CD, Roman LS, Persson C
6305 - 6309	Effect of the annealing temperature on transparency and conductivity of ZnO:Al thin films Ben Ayadi Z, El Mir L, Djessas K, Alaya S
6310 - 6314	Deposition of low-resistivity gallium-doped zinc oxide films by low-temperature radio-frequency magnetron sputtering Tseng JY, Chen YT, Yang MY, Wang CY, Li PC, Yu WC, Hsu YF, Wang SF
6315 - 6319	Reliability analysis of transparent conductive tracks embossed in ZnO and Al-ZnO sol-gel materials Rao J, Winfield RJ, O'Brien S, Crean GM
6320 - 6322	Thin films of In2O3 by atomic layer deposition using In(acac)(3) Nilsen O, Balasundaraprabhu R, Monakhov EV, Muthukumarasamy N, Fjellvag H, Svensson BG
6323 - 6326	Sol-gel synthesis, comparative characterisation, and reliability analyses of undoped and Al-doped zinc oxide thin films Copuroglu M, O'Brien S, Crean GM
6327 - 6330	Chemical deposition of Al2O3 thin films on Si substrates Vitanov P, Harizanova A, Ivanova T, Dimitrova T
6331 - 6333	Excitation mechanism of europium ions embedded into TiO2 nanocrystalline matrix Podhorodecki A, Zatryb G, Sitarek P, Misiewicz J, Kaczmarek D, Domaradzki J, Borkowska A, Prociow EL
6334 - 6336	The role of the HfO2-TiN interface in capacitance-voltage nonlinearity of Metal-Insulator-Metal capacitors Wenger C, Lukosius M, Weidner G, Mussig HJ, Pasko S, Lohe C
6337 - 6340	Improvement of on/off ratio in ZnO thin-film transistor by using growth interruptions during metalorganic chemical vapor deposition Jo J, Choi H, Yun J, Kim H, Seo O, Lee B
6341 - 6344	Stability of indium-oxide thin-film transistors by reactive ion beam assisted deposition Vygranenko Y, Wang K, Chaji R, Vieira M, Robertson J, Nathan A
6345 - 6348	Surface-induced time-dependent instability of ZnO based thin-film transistors Kim KT, Lee K, Oh MS, Park CH, Im S
6349 - 6352	The effect of thermal annealing sequence on amorphous InGaZnO thin film transistor with a plasma-treated source-drain structure Shin HS, Du Ahn B, Kim KH, Park JS, Kim HJ
6353 - 6357	Effective channel length and parasitic resistance determination in non self-aligned low temperature polycrystalline silicon thin film transistors Valletta A, Rapisarda M, Mariucci L, Pecora A, Fortunato G, Caligiore C, Fontana E, Tramontana F, Leonardi S
6358 - 6363	Solid phase epitaxy on N-type polysilicon films formed by aluminium induced crystallization of amorphous silicon Tuzun O, Slaoui A, Roques S, Focsa A, Jomard F, Ballutaud D
6364 - 6366	Back gate influence on front channel operation of p-channel double gate polysilicon TFTs Michalas L, Papaioannou GJ, Kouvatsos DN, Voutsas AT
6367 - 6370	Thermal dependence of low-frequency noise in polysilicon thin film transistors Pichon L, Cretu B, Boukhenoufa A
6371 - 6374	Analysis of self-heating related instability in n-channel polysilicon thin film transistors fabricated on polyimide Maiolo L, Cuscuna M, Mariucci L, Minotti A, Pecora A, Simeone D, Valletta A, Fortunato G
6375 - 6378	On the study of p-channel thin-film transistors fabricated by SLS ELA crystallization techniques Exarchos MA, Moschou DC, Papaioannou GJ, Kouvatsos DN, Arapoyanni A, Voutsas AT
6379 - 6382	Negative bias-temperature stress in non-self-aligned p-channel polysilicon TFTs Mariucci L, Gaucci P, Valletta A, Cuscuna M, Maiolo L, Pecora A, Fortunato G
6383 - 6385	Ambipolar microcrystalline silicon thin-film transistors Chan KY, Kirchhoff J, Gordijn A, Knipp D, Stiebig H
6386 - 6391	Electronic and structural properties of the amorphous/crystalline silicon interface Kleider JP, Chouffot R, Gudovskikh AS, Cabarrocas PRI, Labrune M, Ribeyron PJ, Bruggemann R
6392 - 6395	Correlation of structural and optoelectronic properties of thin film silicon prepared at the transition from microcrystalline to amorphous growth Reynolds S, Carius R, Finger F, Smirnov V
6396 - 6400	Surface photovoltage investigation of recombination at the a-Si/c-Si heterojunction Korte L, Laades A, Lauer K, Stangl R, Schaffarzik D, Schmidt M
6401 - 6404	Ultra-high quality surface passivation of crystalline silicon wafers in large area parallel plate reactor at 40 MHz Damon-Lacoste J, Fesquet L, Olibet S, Ballif C
6405 - 6408	Low-temperature growth of nano-structured silicon thin films on ITO initiated by metal catalysts Alet PJ, Palacin S, Cabarrocas PRI
6409 - 6413	Deposition and characterization of PEDOT/ZnO layers onto PET substrates Garganourakis M, Logothetidis S, Pitsalidis C, Georgiou D, Kassavetis S, Laskarakis A
6414 - 6417	Effect of oxygen pressure of SiOx buffer layer on the electrical properties of GZO film deposited on PET substrate Ahn BD, Ko YG, Oh SH, Song JH, Kim HJ
6418 - 6421	Amorphous silicon twin photodiode structure for differential current measurements Caputo D, de Cesare G, Nascetti A
6422 - 6425	On the fabrication and characterization of amorphous silicon ultra-violet sensor array Caputo D, de Cesare G, Nascetti A, Tucci M
6426 - 6429	a-Si:H p-i-n structures with extreme i-layer thickness Fantoni A, Fernandes M, Vieira M, Casteleiro C, Schwarz R
6430 - 6434	Synthesis of monodisperse CdS nanowires and their photovoltaic applications Xi LF, Tan WXW, Chua KS, Boothroyd C, Lam YM
6435 - 6439	Large area double p-i-n heterostructure for signal multiplexing and demultiplexing in the visible range Vieira M, Louro P, Fernandes M, Vieira MA, Fantoni A, Barata M