| D1 - D3 |
Electrochemical glucose detection using nickel-implanted boron-doped diamond electrodes
Ohnishi K, Einaga Y, Notsu H, Terashima C, Rao TN, Park SG, Fujishima A |
| E9 - E12 |
Impedance study of nickel cathode reactivation by vanadium during hydrogen evolution in alkaline water
Abouatallah RM, Kirk DW, Graydon JW |
| F1 - F3 |
Structural stability of hydrogen forming gas annealed (Ba,Sr)RUO3 oxide electrodes
Choi ES, Yoon SG |
| F4 - F6 |
An efficient model for accurate capacitance-voltage characterization of high-k gate dielectrics using a mercury probe
Garros X, Leroux C, Autran JL |
| J5 - J7 |
Effect of pd coating on hydrogen permeation of Ni-barium cerate mixed conductor
Zhang G, Dorris S, Balachandran U, Liu M |
| A43 - A46 |
Ideally pseudocapacitive behavior of amorphous hydrous cobalt-nickel oxide prepared by anodic deposition
Hu CC, Cheng CY |
| A47 - A50 |
A novel concept for the synthesis of an improved LiFePO4 lithium battery cathode
Croce F, Epifanio AD, Hassoun J, Deptula A, Olczac T, Scrosati B |
| A51 - A54 |
Current oscillations during CO electro-oxidation on smooth platinum
Azevedo DC, Pinheiro ALN, Gonzalez ER |
| A55 - A58 |
Microstrain and capacity fade in spinel manganese oxides
Shin YJ, Manthiram A |
| A59 - A61 |
Viscosity changes of Li battery electrolytes and their long-term effect on the frequency of EQCM electrodes
Kwon K, Evans JW |
| C33 - C34 |
Cathodic micro-arc Electrodeposition of thick ceramic coatings
Yang XZ, He YD, Wang DR, Gao W |
| C35 - C37 |
Ex situ characterization of electrochemically generated Cu nanostructures
Maupai S, Stratmann M, Dakkouri AS |
| C38 - C40 |
Electrodeposition of nanosized germanium from GeBr4 and GeCl4 in an ionic liquid
Endres F |
| C41 - C43 |
Control of the (111) orientation in copper interconnection layer
Hara T, Sakata K, Yoshida Y |
| C44 - C47 |
Superconformal deposition by surfactant-catalyzed chemical vapor deposition
Josell D, Wheeler D, Moffat TP |
| G11 - G14 |
Effective strategy for porous organosilicate to suppress oxygen ashing damage
Liu PT, Chang TC, Mor YS, Chen CW, Tsai TM, Chu CJ, Pan FM, Sze SM |
| G15 - G17 |
Layer inversion of Ni(Pt)Si on mixed phase Si films
Lee PS, Pey KL, Mangelinck A, Ding J, Osipowicz T, See A |
