6285 - 6286 |
Resistively Switching Chalcogenides Waser R, Wuttig M |
6287 - 6305 |
Resistive Switching in Mott Insulators and Correlated Systems Janod E, Tranchant J, Corraze B, Querre M, Stoliar P, Rozenberg M, Cren T, Roditchev D, Phuoc VT, Besland MP, Cario L |
6306 - 6325 |
Physics of the Switching Kinetics in Resistive Memories Menzel S, Bottger U, Wimmer M, Salinga M |
6326 - 6342 |
Oxygen Diffusion in SrTiO3 and Related Perovskite Oxides De Souza RA |
6343 - 6359 |
Microscopic Complexity in Phase-Change Materials and its Role for Applications Deringer VL, Dronskowski R, Wuttig M |
6360 - 6368 |
Formation and Movement of Cationic Defects During Forming and Resistive Switching in SrTiO3 Thin Film Devices Lenser C, Koehl A, Slipukhina I, Du HC, Patt M, Feyer V, Schneider CM, Lezaic M, Waser R, Dittmann R |
6369 - 6373 |
Atomic Structure of Antiphase Nanodomains in Fe-Doped SrTiO3 Films Du HC, Jia CL, Mayer J, Barthel J, Lenser C, Dittmann R |
6374 - 6381 |
Redox Reactions at Cu,Ag/Ta2O5 Interfaces and the Effects of Ta2O5 Film Density on the Forming Process in Atomic Switch Structures Tsuruoka T, Valov I, Tappertzhofen S, van den Hurk J, Hasegawa T, Waser R, Aono M |
6382 - 6389 |
Resistive Switching of a Quasi-Homogeneous Distribution of Filaments Generated at Heat-Treated TiO2 (110)-Surfaces Rogala M, Bihlmayer G, Speier W, Klusek Z, Rodenbucher C, Szot K |
6390 - 6398 |
Low-Temperature Transport in Crystalline Ge1Sb2Te4 Volker H, Jost P, Wuttig M |
6399 - 6406 |
Disorder-Induced Localization in Crystalline Pseudo-Binary GeTe-Sb2Te3 Alloys between Ge3Sb2Te6 and GeTe Jost P, Volker H, Poitz A, Poltorak C, Zalden P, Schafer T, Lange FRL, Schmidt RM, Hollander B, Wirtssohn MR, Wuttig M |
6407 - 6413 |
Crystallization Properties of the Ge2Sb2Te5 Phase-Change Compound from Advanced Simulations Ronneberger I, Zhang W, Eshet H, Mazzarello R |
6414 - 6423 |
Realization of Boolean Logic Functionality Using Redox-Based Memristive Devices Siemon A, Breuer T, Aslam N, Ferch S, Kim W, van den Hurk J, Rana V, Hoffmann-Eifert S, Waser R, Menzel S, Linn E |