The design of a combined topography-adhesion-stiffness imaging mode in a scanning force microscope (SFM) based on a digital control system is presented. The digital control system provides for the flexibility in designing the shape of the loading-unloading force waveform and enables a fast rate (up to 1 kHz) of applying the loading-unloading waveform with a pre-defined maximum loading force. Furthermore, flexibility in optimizing the imaging conditions and analyzing the resulting force-displacement data is achieved. The limiting factor for the data acquisition speed appears to be the viscous drag of the working medium exerted onto the SFM cantilever. It is shown that subtracting a no-contact, zero-deflection baseline can compensate for the effects of the viscous drag. The performance of the digital adhesion mapping control system is illustrated by analyzing several different samples: a rigid silicon grid; a molecularly thin block copolymer film; and a thin, heterogeneous polymer film. The remaining problems are related to the cross-talk between the topography and stiffness-related slope.