Materials Research Bulletin, Vol.44, No.6, 1256-1260, 2009
Growth and electrical performance of Pb(Mg1/3Nb2/3)O-3-PbTiO3-Pb(Fe1/2Nb1/2)O-3 single crystals
For the first time, we have grown ferroelectric single crystals Pb(Mg1/3Nb2/3)O-3-PbTiO3-Pb(Fe1/2Nb1/2)O-3 (PMN-PT-PFN) from the melt by the simple slow cooling process. The chemical composition of the single crystals PMN-PT-PFN (0.59/0.31/0.10) is near the morphotropic phase boundary (MPB). X-ray diffraction (XRD) was used to study phase structure of the as-grown crystals, energy dispersive X-ray spectrometer" (EDS) and electron probe micro-analyzer (EPMA) were employed to confirm the chemical composition and element distribution of the as-grown crystals, respectively. The ferroelectric, dielectric and piezoelectric properties of the as-grown PMN-PT-PFN (0.59/0.31/0.10)single crystal oriented along the (001) axis were measured. which showed that the remnant polarization (P-r), coercive electric fields (E-c), the Curie temperature (T-c) and the piezoelectric coefficient (d(33)) were 50.2 mu C/cm(2), 13.9 kV/cm, 158 degrees C and about 1800 pC/N, respectively. All the results indicated that the PMN-FT-PFN (0.59/0.31/0.10) single crystals are promising for applying to field of high frequency. (C) 2009 Elsevier Ltd. All rights reserved.
Keywords:Electronic materials;Crystal growth;X-ray diffraction;Dielectric properties;Ferroelectricity