화학공학소재연구정보센터
Process Control and Quality, Vol.11, No.5, 433-439, 2000
Statistical process control for short run manufacturing systems
A Shewhart (X) over bar control chart is developed to monitor the process mean for large production runs. It has not been considered appropriate to monitor the process mean using the Shewhart (X) over bar control chart for small production runs. In this paper we propose the design of (X) over bar control chart to monitor the process mean for small production runs. For various combinations of the number of samples and the size of each sample, control coefficients of (X) over bar control chart are computed by numerical methods. Using these results, the (X) over bar control chart for small production runs is developed to monitor the process mean correctly. Finally, the design procedure of the (X) over bar control chart for small production runs and the results of misusing the Shewhart (X) over bar control chart are illustrated by an example.