We have deposited Cu-In-S films by an innovative modulated flux deposition (MFD) procedure performed in a static physical evaporation chamber in compositional ranges as diverse as: (in] ranging 10-70%, [Cu] = 2-43% and [S] = 20-50%. We propose optical absorption (A% = 100-R%-T%) in the near-IR (about 0.5 eV or 2500 nm) as a non-contact measurement which could be indirectly correlated with chemical composition. The films, characterized by spectrophotometry (A%) and sheet resistance (R) by four-terminal sensing measurement, were classified in compositional groups by the use of the two-dimensional parameter (R, A%). Interestingly, the optical absorption A% was linearly correlated with Cu content in our compositional range while R presents a jump back related with the variation of S concentration. The independence of R and A% in this case is discussed in terms of different conduction mechanisms. (C) 2008 Elsevier B.V. All rights reserved.