The current-voltage characteristics in the temperature range 170 divided by 305 K at the direct polarization of CaS-CdTe:Mn heterojunction were studied. The tunneling process of carriers determines the electrical current through the junction. The ratio of the diffusion coefficient and surface recombination velocity in the CdTe:Mn film from the interface of junction was determined from the spectral characteristics of short circuit current and absorption. The non-equilibrium carriers generated in the CdTe:Mn film at the interface of heterojunction at the temperature of 293 K recombine through two recombination levels. At low temperatures (T<170 K) the concentration of carriers decreases and only one recombination level appears with the short recombination lifetime. (C) 2008 Elsevier B.V. All rights reserved.