RuO2-CeO2 composite thin films are deposited on various Si substrates by a radiofrequency magnetron sputtering technique. Compacted polycrystalline pellets of the nanostructured CeO2-RuO2 composite system are used as standard samples for comparative electrical analyses. All films and composite samples are analyzed by X-ray diffraction and transmission electron microscopy. Electrical measurements of radiofrequency sputtering of thin films are performed as a function of the RuO2 fraction and of the temperature (between 25 and 400 degrees C). A nonlinear variation in the electrical conductivity of the RuO2-CeO2 composite thin films as a function of the RuO2 volume fraction (phi) is observed and discussed. It is interpreted in terms of a power law (in (phi - phi c)(m)), where m and phi c are parameters characteristic of the distribution of the conducting phase in a composite medium. (C) 2009 Elsevier B.V. All rights reserved.