In this paper, we report results of the optical properties of thermally deposited As2-xS3-xSbx thin films with x = 0.02, 0.07, 0.1 and 0.15. We have characterized the deposited films by Fourier Transform Infrared. Raman and X-ray photoelectron spectroscopy (XPS). The relationship between the structural and optical properties and the compositional variation were investigated. It was found that the optical bandgap decreases with increase in Sb content. The XPS core level spectra show a decrease in As2S3 percentage with increase in Sb content. This is confirmed from the shifting of the Raman peak from AsS3 vibrational mode towards SbS3 vibrational mode. (C) 2010 Elsevier B.V. All rights reserved.