In this study, the etching characteristics of ALD deposited Al2O3 thin film in a BCl3/N-2 plasma were investigated. The experiments were performed by comparing the etch rates and the selectivity of Al2O3 over SiO2 as functions of the input plasma parameters, such as the gas mixing ratio, the DC-bias voltage, the RF power, and the process pressure. The maximum etch rate was obtained at 155.8 nm/min under a 15 mTorr process pressure, 700 W of RF power, and a BCl3 (6 sccm)/N-2 (14 sccm) plasma. The highest etch selectivity was 1.9. We used X-ray photoelectron spectroscopy (XPS) to investigate the chemical reactions on the etched surface. Auger electron spectroscopy (AES) was used for the elemental analysis of the etched surfaces. (C) 2010 Elsevier B.V. All rights reserved.