Epitaxially strained SrRuO3 films were grown on SrTiO3, DyScO3, and NdGaO3 oxide substrates using liquid-delivery metal-organic chemical vapour deposition. Temperature dependent resistivity measurements showed a shift in the Curie temperature (T-C) of the ferromagnetic phase transition which is suggested to be caused by the incorporated elastic lattice strain in the films. T-C increased with tensile and decreased with compressive strain, which was inferred from high resolution x-ray diffraction measurements of the in-plane and out-of-plane lattice parameters. (C) 2011 Elsevier B.V. All rights reserved.