Thin films of ferroelectric relaxor Pb1-3x/2LaxZr0.2Ti0.8O3, x=0.22 have been integrated in an oxidic heterostructure for electro-optical investigations. The quadratic electro-optic behavior and optical properties have been studied by means of variable angle spectroscopic ellipsometry method in reflection mode. Birefringence values up to delta Delta=0.17 degrees have been obtained for quadratic compositions at lambda=540 nm and 65 degrees angle of incidence. Structural, chemical and morphologic properties of Pb1-3x/2LaxZr0.2Ti0.8O3 (x=0.22) thin films have been investigated by x-ray diffraction and atomic force microscopy techniques. The dielectric and ferroelectric behavior has been investigated using dielectric spectroscopy and a ferroelectric test system. (C) 2011 Elsevier BM. All rights reserved.