Reduced graphene oxide (rGO) and reduced graphite oxide (rGtO) were analyzed by X-ray photoelectron spectroscopy. rGO and rGtO were prepared by photochemical, electrochemical, hydrazine-assisted, and thermal reduction of graphene oxide (GO) and graphite oxide (GtO). The number of CH defects increased for the photochemical and electrochemical reduction, whereas a direct increase in the number of C=C bonds was observed for thermal and hydrazine-assisted reduction. Cyclic voltammograms showed that the electrochemical capacitance of rGtO increased with the number of CH defects.