Applied Surface Science, Vol.291, 87-92, 2014
Electrical gating and rectification in graphene three-terminal junctions
Graphene was grown on semiinsulating silicon carbide at 1800 degrees C and atmospheric argon pressure. The all carbon T- and Y-shape three terminal junction devices were fabricated using electron beam lithography. All devices featured the negative rectification effect. The exact properties of the devices like the curvature of the output voltage response can be tuned by changing the branch width in the T- and Y-shape devices. Beside the rectification a switching behavior is demonstrated with the same three terminal junctions. (C) 2013 Elsevier B.V. All rights reserved.