A theory for staircase voltammetry (SCV) on randomly rough electrode is developed under reversible charge transfer conditions. An elegant general expression for the statistically averaged current that relates single potential step current transient to the multipotential step (staircase) current response is obtained using properties of Heaviside unit step function. Theory emphasizes the use of power spectrum to characterize the surface geometric disorder. Explicit expression for the roughness averaged current is obtained for finite fractal electrode. The result for linear scan voltammetry (LSV) is obtained by collecting current value at a specific time on each potential step. The characteristic peak current and peak potential in LSV, are dependent on fractal dimension (D-H), topothesy length (l(tau)) and finest length scale of fractality (e). Roughness can induce significant (similar to 15 mV) peak potential shift. Emergent anomalous Randles-Sevcik behavior is observed for intermediate scan rates that depends not only on DH but also on l and l(tau). The inner (v(i)) and outer (v(o)) crossover scan rates proportional to diffusion coefficient (D) and potential step size (Delta E) are pi Delta ED/l(tau)(2) and pi Delta ED/l(2), respectively. Classical Randles Sevcik behavior is observed beyond two crossover scan rates. 2013 Elsevier Ltd. All rights reserved.