We present pulsed evaporative transient thermometry, a metrology technique that utilizes the transient thermal response from pulsed heating on isolated microstructures to obtain temporally-resolved heat capacity and heat transfer conductance. We demonstrated the approach with two model systems, copper microwires and alumina nanoporous membranes. Temporal resolutions as high as 0.2 s were achieved where peaks in heat transfer conductance were observed corresponding to the thin film evaporation stage. The metrology technique can also be extended to various other micro and nanostructures, which can provide increased understanding of thin film evaporation for the realization of advanced phase-change based thermal management solutions. (C) 2013 Elsevier Ltd. All rights reserved.