Journal of Crystal Growth, Vol.364, 128-132, 2013
Study on twin boundaries and Te particles in CdMnTe crystals for nuclear detector application
Electron backscatter diffraction (EBSD) and Raman scattering were used to characterize twins and Te particles in CdMnTe crystals grown by the vertical Bridgman method. The size, concentration and phase structure of Te particles, as well as the orientation of twins were studied. {111} twins decorated with Te particles were identified by low and high magnitude EBSD mapping. Three type crystal phases of Te particles were observed, including hexagonal, monoclinic and high-pressure rhombohedral phase. Most of Te particles were preferentially oriented with the {110}(CdMnTe)//{11 (2) over bar0}(Te). The A1 (Te) and E (Te) modes in CdMnTe Raman scattering spectroscopy were found with red-shift than single Te phase due to the tensile stress effect. (C) 2012 Elsevier B.V. All rights reserved.
Keywords:Characterization;Crystal structure;Defects;Bridgman technique;Semiconducting cadmium compounds