We investigated the growth and properties of CuAlO2 single crystals grown by a flux self-removal method. In this method, the flux crept up the wall of an alumina crucible completely during the slow cooling process, leaving flux-free CuAlO2 crystals on the bottom of the crucible. The resulting CuAlO2 crystals had typical dimensions of 0.5-5 mm in the ab-plane and 10-300 mu m along the c-axis. The crystals had a hexagonal structure with a=b=2.857(1) angstrom and c=16.939(2) angstrom. Their resistivity was anisotropic with a c-axis resistivity (rho(c)) about similar to 17 times higher than the ab-plane resistivity (rho(ab)). However, both rho(ab) and rho(c) showed thermally activated behavior with the same activation energy of similar to 0.6 eV. The CuAlO2 crystals had direct and indirect bandgaps of 3.40 eV and 2.22 eV, respectively. (C) 2013 Elsevier B.V. All rights reserved.