Journal of Crystal Growth, Vol.378, 41-43, 2013
As flux dependence on RHEED transients during InAs quantum dot growth
We study the role of As during InAs quantum dots (QDs) growth by molecular beam epitaxy using reflection high-energy electron diffraction (RHEED). We observe that the RHEED intensity transient onset and the transition to the saturation region occur at less InAs thickness under higher As-4 flux. From the RHEED transients, we find that the diffusion time does not depend on the As-4 flux while the diffusion barrier does. The diffusion length of In adatoms can be reduced by increasing the diffusion barrier using higher As-4 flux, allowing us to grow InAs QDs at higher densities. (c) 2013 Elsevier B.V. All rights reserved.
Keywords:Diffusion;Reflection high energy electron diffraction;Molecular beam epitaxy;Semiconducting III-V materials