The multiferroic thin films of Lu1-xBixFeO3 (LBFOx, 0 <= x <= 0.10) were firstly prepared on LaNiO3 coating silicon substrates by the sol-gel method. Structural and morphological characterization of the LBFOx thin films was investigated by X-ray diffraction and atomic force microscopy, respectively. The remnant polarization of Bi-doped LuFeO3 thin film at room temperature reached to 3.1 and 3.6 mu C/cm(2) for x=0.05 and 0.10 at the electric field of 700 kV/cm, respectively. The ferroelectric polarization measurements indicate that the potential role of Bi doping in increasing the value of the polarization of LuFeO3 film, and the mechanisms for the U shaped frequency loss tangent curves was discussed. (C) 2013 Elsevier B.V. All rights reserved.