화학공학소재연구정보센터
Materials Science Forum, Vol.378-3, 30-35, 2001
Fundamental parameters versus learnt profiles using the Rietveld program BGMN
The mathematical algorithms used in our fundamental parameter Rietveld program BGMN are capable for describing learnt profile peak shapes, too. We describe this method using a D 5000 goniometer plus Goebel mirror as an exemplary geometric set-up. In detail, the three steps 1. determination of size/strain parameters of standard specimen Y2O3 Using raytraced profiles on a conventional XRD 3000 TT diffractometer 2. learning Y2O3 profiles on the D 5000 diffractometer 3. measurement of the unknown CeO2 sample on the D 5000 diffractometer are explained. This method is recommended as an alternative for solving the problems in description of parallel beam optics or OED.