Materials Science Forum, Vol.389-3, 203-206, 2002
Aluminum doping of epitaxial silicon carbide grown by hot-wall CVD; Effect of process parameters
Intentional p-type doping of SiC has been performed by using trimethylaluminum as dopant source. A comprehensive investigation of the aluminum incorporation dependency on temperature, pressure, C/Si ratio and growth rate in a horizontal hot-wall CVD reactor has been made. The incorporation mechanism for 4H and 6H-SiC both for Si- and C-face material is presented.