Materials Science Forum, Vol.404-7, 535-540, 2002
In-situ analysis of microstress and texture development during tensile deformation of MMCs at room temperature and at elevated temperatures using synchrotron radiation
Due to the high photon flux synchrotron radiation, enables in - situ strain, stress, texture and profile analysis during deformation at elevated temperature, which demands short data acquisition times. Here, in - situ analysis was performed on the MMC AlSi25Cu4Mg1, which contains silicon particles, and on the MMC AA 6061 + Al(2)O(3) using white high energy synchrotron radiation. The experiments revealed the tensile load stress - elastic strain response of the aluminum matrix and the embedded silicon res. alumina hard phase particles. The strain and texture development of AlSi25Cu4Mg1 during tensile deformation differs significantly from AA 6061 + Al(2)O(3).