Materials Science Forum, Vol.433-4, 471-476, 2002
Identification and annealing of common intrinsic defect centers
Intrinsic defects are studied by an ab initio method. With the help of calculated hyperfine parameters we analyse models for recent vacancy-related spin resonance centers and for the EI6-center that has been tentatively assigned to a silicon antisite. The annealing behaviour of centers, which we identify as isolated vacancies, is qualitatively explained in terms of a hierarchy of annealing mechanisms.