A new technique for investigating 3D grain growth in polycrystalline materials using white x-ray microdiffraction with micron point-to-point spatial resolution is presented. This technique utilizes focused polychromatic x-rays at the Advanced Photon Source, differential aperture depth-profiling, CCD measurements, and automated analysis of spatially-resolved Laue patterns to measure local lattice structure and orientation. 3D thermal grain growth studies of hot-rolled aluminum have been initiated to demonstrate the capabilities of this method. Complete 3D grain orientation maps were obtained from a hot-rolled aluminum polycrystal. The sample was then annealed to induce grain growth, cooled to room temperature, and re-mapped to measure the thermal migration of all grain boundaries within the same volume region. Initial observations reveal significant grain growth above 360degreesC, involving movement of both low- and high-angle boundaries. Systematic measurements have been obtained of the as-rolled grain structure and of the microstructural evolution after annealing at successively higher temperatures. Small second-phase precipitates have been identified. Such measurements will provide the detailed 3D experimental link needed for testing theories and computer models of 3D grain growth in bulk materials.