화학공학소재연구정보센터
Materials Science Forum, Vol.475-479, 4029-4034, 2005
A simple method of the electric/magnetic field observation by a conventional transmission electron microscope
A novel method to observe the electrostatic field distribution with a conventional transmission electron microscope has been developed. The method allows measurements of a potential difference less than 1 V/mu m. This method can be performed in any kind of conventional transmission electron microscope and applied to the observation of the electric/magnetic field at the level of a specimen.