화학공학소재연구정보센터
Journal of Colloid and Interface Science, Vol.177, No.2, 561-567, 1996
Adsorption of Cu(II) on the (0001) Plane of Mica - A REFLEXAFS and XPS Study
Using reflection extended X-ray absorption fine structure spectroscopy (REFLEXAFS) and X-ray photoelectron spectroscopy (XPS) it has been established that Cu(II) in low concentration in aqueous media can be chemisorbed onto the (0001) surface of muscovite mica. From the XPS studies it is suggested that the Cu species is in a similar bonding environment to the copper in copper hydroxide. A depth profile of the reacted mica surface was also carried out using XPS and this suggests that there had been no diffusion of the Cu into the mica surface. REFLEXAFS studies of the reacted mica surface provided information about shells of O, Al/Si, and Cu surrounding a central Cu absorber. The best-fit bond distances are as follows : O-Cu, 1.98 Angstrom; Cu-Cu, 2.64 Angstrom; Al/Si-Cu, 3.09 Angstrom. This provides direct evidence for Cu being bound to the surface at aluminate or silicate groups and suggests that the Cu species adsorbed onto the surface are similar to the copper species found in copper hydroxide, plancheite, and shattuckite. It is proposed that Cu is chemisorbed at atomic imperfections, such as steps and kinks, on the mica surface.