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Solid-State Electronics, Vol.70, 106-113, 2012
Quantum simulation of an ultrathin body field-effect transistor with channel imperfections
An efficient program for the all-quantum simulation of nanometer field-effect transistors is elaborated. The model is based on the Landauer-Buttiker approach. Our calculation of transmission coefficients employs a transfer-matrix technique involving the arbitrary precision (multiprecision) arithmetic to cope with evanescent modes. Modified in such way, the transfer-matrix technique turns out to be much faster in practical simulations than that of scattering-matrix. Results of the simulation demonstrate the impact of realistic channel imperfections (random charged centers and wall roughness) on transistor characteristics. The Landauer-Buttiker approach is developed to incorporate calculation of the noise at an arbitrary temperature. We also validate the ballistic Landauer-Buttiker approach for the usual situation when heavily doped contacts are indispensably included into the simulation region. (C) 2011 Elsevier Ltd. All rights reserved.
Keywords:Ultra-thin silicon field-effect transistor;Quantum simulation;Transfer-matrix method;Random impurities;Rough channel walls;Quantum noise