소결온도가 ZPCCL계 바리스터의 전기적, 유전적 안정성에 미치는 영향

남춘우; Choon-Woo Nahm

Korean Journal of Materials Research, Vol.16, No.8, 466-472, August, 2006

DOI10.3740/MRSK.2006.16.8.466 Export Citation

소결온도가 ZPCCL계 바리스터의 전기적, 유전적 안정성에 미치는 영향

Sintering Temperature Effect on Electrical and Dielectric Stability of ZPCCL-Based Varistors

남춘우^†

동의대학교 전기공학과

Choon-Woo Nahm^†

Department of Electrical Engineering, Dongeui University, Busanjin-Gu, Busan 614-714, Korea

E-mail:

The electrical, dielectric properties, and its stability of ZPCCL-based varistors were investigated for different sintering temperatures in the range of . As the sintering temperatures increased, the varistor voltage decreased in the range of V/mm, the nonlinear coefficient decreased in the range of , and the leakage current increased in the range of . The stability of electrical and dielectric characteristics was obtained from sintering temperature of . the varistors sintered at marked the high electrical and dielectric stability, with $%{\Delta}{V_{1mA}=+1.9%,\;%{\Delta}{\alpha}=-10.6%,\;%{\Delta}I_L=+20%\;and\;%{\Delta}tan\;{\delta}=+9.9%$ for DC accelerated aging stress state of /24 h.

Keywords:Sintering temperature;Electrical properties;Stability;DC accelerated aging stress;ZPCCL-based varistors

[References]

Levinson LM, Philipp HR, Amer. Ceram. Soc. Bull., 65, 639 (1986)
Gupta TK, J. Am. Ceram. Soc., 73, 1817 (1990)
Mukae K, Tsuda K, Shiga S, IEEE Trans. Pow. Deliv., 3, 591 (1988)
Shichimiya S, Yamaguchi M, Furuse N, Kobayashi M, Ishibe S, IEEE Trans. Pow. Deliv., 13, 465 (1998)
Mukae K, Am. Ceram. Soc. Bull., 66, 1329 (1987)
Alles AB, Burdick VL, J. Appl. Phys., 70, 6883 (1991)
Alles AB, Puskas R, Callahan G, Burdick VL, J. Amer. Ceram. Soc., 76, 2098 (1993)
Lee YS, Liao KS, Tseng TY, J. Amer. Ceram. Soc., 79, 2379 (1996)
Nahm CW, Mater. Lett., 47, 182 (2001)
Nahm CW, J. Mater. Sci.: Mater. Electron., 15, 29 (2004)
Nahm CW, Mater. Lett., 57, 1317 (2003)
Nahm CW, Shin BC, Min BH, Mater. Chem. Phys., 82(1), 157 (2003)
Nahm CW, Mater. Lett., 58, 2252 (2004)
Nahm CW, Park JA, Shin BC, Kim IS, Ceram. Internation., 30, 1009 (2005)
Hng HH, Knowles KM, J. Mater. Sci., 37(6), 1143 (2002)
Wurst JC, Nelson JA, J. Am. Ceram. Soc., 97, 109 (1972)
Fan J, Freer R, J. Am. Cearm. Soc., 77, 2663 (1994)
Gupta TK, Carlson WG, J. Mater. Sci., 20, 3487 (1985)

[Referenced By]

[1] Levinson LM, Philipp HR, Amer. Ceram. Soc. Bull., 65, 639 (1986)

[2] Gupta TK, J. Am. Ceram. Soc., 73, 1817 (1990)

[3] Mukae K, Tsuda K, Shiga S, IEEE Trans. Pow. Deliv., 3, 591 (1988)

[4] Shichimiya S, Yamaguchi M, Furuse N, Kobayashi M, Ishibe S, IEEE Trans. Pow. Deliv., 13, 465 (1998)

[5] Mukae K, Am. Ceram. Soc. Bull., 66, 1329 (1987)

[6] Alles AB, Burdick VL, J. Appl. Phys., 70, 6883 (1991)

[7] Alles AB, Puskas R, Callahan G, Burdick VL, J. Amer. Ceram. Soc., 76, 2098 (1993)

[8] Lee YS, Liao KS, Tseng TY, J. Amer. Ceram. Soc., 79, 2379 (1996)

[9] Nahm CW, Mater. Lett., 47, 182 (2001)

[10] Nahm CW, J. Mater. Sci.: Mater. Electron., 15, 29 (2004)

[11] Nahm CW, Mater. Lett., 57, 1317 (2003)

[12] Nahm CW, Shin BC, Min BH, Mater. Chem. Phys., 82(1), 157 (2003)

[13] Nahm CW, Mater. Lett., 58, 2252 (2004)

[14] Nahm CW, Park JA, Shin BC, Kim IS, Ceram. Internation., 30, 1009 (2005)

[15] Hng HH, Knowles KM, J. Mater. Sci., 37(6), 1143 (2002)

[16] Wurst JC, Nelson JA, J. Am. Ceram. Soc., 97, 109 (1972)

[17] Fan J, Freer R, J. Am. Cearm. Soc., 77, 2663 (1994)

[18] Gupta TK, Carlson WG, J. Mater. Sci., 20, 3487 (1985)