SrCl 2 :Eu 2+ ,Na + X-선 영상저장 형광체의 발광특성

김성환; 김완; 강희동; 도시홍; 서효진; 김영국; 김도성; Sung-Hwan Kim; Wan Kim; Hee-Dong Kang; Sih-Hong Doh; Hyo-Jin Seo; Young-Kook Kim; Do-Sung Kim

Korean Journal of Materials Research, Vol.13, No.6, 343-346, June, 2003

DOI10.3740/MRSK.2003.13.6.343 Export Citation

SrCl 2 :Eu 2+ ,Na + X-선 영상저장 형광체의 발광특성

Luminescence in SrCl 2 :Eu 2+ ,Na + X-ray Storage Phosphor

김성환, 김완, 강희동, 도시홍^{1, †}, 서효진¹, 김영국², 김도성³

경북대학교 물리학과
¹부경대학교 물리학과
²경남대학교 응용수리학부
³대구대학교 물리교육학과

Sung-Hwan Kim, Wan Kim, Hee-Dong Kang, Sih-Hong Doh^{1, †}, Hyo-Jin Seo¹, Young-Kook Kim², and Do-Sung Kim³

Department of Physics, Kyungpook National University, Korea
¹Department of Physics, Pukyong National University, Korea
²Division of Applied Mathematics and Physics, Kyungnam University, Korea
³Division of Science Education, Daegu University, Korea

E-mail:

Photoluminescence(PL), photostimulated luminescence(PSL) and thermoluminescence(TL) in SrC1 2 : Eu 2+ , Na + phosphor powder were measured, and the activation energies(trap depth) of traps associated with TL and PSL were investigated. The PL and PSL in the studied sample is due to the 4f 6 5d\longrightarrow 4f 7 transition of Eu 2+ . TL glow curve is single peak, and its peak temperature is about 377.2 K. The PL, PSL and TL emission spectra of the phosphors are located in the range of 380∼440 nm, peaking at 408 nm. The activation energy of the PSL trapping center is 0.78 eV and that of the TL trapping center is 0.79 eV. We, thus, suggest that the trapping centers giving rise to the PSL are identical to those giving rise to the TL.

Keywords:activation energy . photoluminescence . photostimulated luminescence . thermoluminescence

[References]

Shastry SS, Bhatt RC, Vohra KG, Prot. Dosim., 6(1-4), 335 (1983)
Campos LL, Fernandes Filho OO, Radiat. Prot. Dosim., 33(1-4), 111 (1990)
Sonoda M, Takano M, Miyahara J, Kato H, Raiology, 148, 833 (1983)
Thoms M, Seggern V, J. Appl. Phys., 81(9), 5887 (1997)
Ichihara S, Hayakawa S, Saga S, Hoshino M, Sakuma S, Ikeda M, Yamaguchi H, Hanaichi T, Kamiya Y, J. Electron Microsco, 33(3), 255 (1984)
Nanto H, Miyazaki M, Imai A, Komori H, Douguchi Y, Kusano E, Kinabara A, IEEE Trans. Nucl. Sci., 47(4), 1620 (2000)
Nanto H, Murayama K, Usuda T, Tanigdchi S, Takeuchi N, Radiat. Prot. Dosim., 47, 281 (1993)
Von Seggern H, Meijerink A, Voigt J, Winnacker A, J. Appl. Phys., 66, 4418 (1989)
Rogulis U, Dietze C, Pawlik T, Hangleiter T, Spaeth JM, J. App. Phys., 80(4), 2430 (1996)
Kong W, Ahmed S, Ferguson J, Solanki R, Appl. Phys. Lett., 67(1), 7 (1995)
Tabakova V, J. Lumin., 68, 265 (1996)
Keller SP, Mapes JE, Cheroff G, Phys. Rev., 108(3), 663 (1953)
Douguchi Y, Sato T, Miyazaki M, Imai A, Kusano E, Kinbara A, Nasu S, Nanto H, in Proceedings of SPIE Advanced Sensors and Monitors for Process Industries and the Environment(1998), p. 286 (1998)
Nanto H, Komori H, Araki K, Douguchi Y, Kusano E, Nasu S, Kinbara K, in Proceedings of SPIE Rare-Earth-Doped Materials and Devices V(2001), p. 248 (2001)
Knitel MJ, Dorenbos P, Combes CM, Andriessen J, van Eijk CWE, J. Lumin., 69, 325 (1996)
Takahashi K, Miyahara J, Shibahara Y, J. Electrochem. Soc., 132, 1492 (1985)
Hangleiter T, J. Phys. Condens. Matter, 2, 6837 (1990)
Kimura T, Nakamura S, Itoh N, Inabe K, Phys. Stat. Sol. A, 165, 503 (1998)
Quang VX, Son NM, Yen PT, Mai TH, Hut B, Troppenz U, Mauch RH, Phys. Stat. Sol. A, 156, 209 (1996)
Kim SH, Kim CJ, Kim W, Kang HD, Kim DS, Kim YK, Seo HJ, Doh SH, Sae Mulli, 45(3), 184 (2002)
Takahasi K, Kohda K, Muyahara J, Kanemitsu Y, Amitani K, Shionoya S, J. Lumin., 31-32, 266 (1984)
Tayler GC, Lilley E, J. Phys. D-Appl. Phys., 11, 567 (1978)
Chen R, Winer AA, J. Appl. Phys., 41(13), 5227 (1970)

[Referenced By]

[1] Shastry SS, Bhatt RC, Vohra KG, Prot. Dosim., 6(1-4), 335 (1983)

[2] Campos LL, Fernandes Filho OO, Radiat. Prot. Dosim., 33(1-4), 111 (1990)

[3] Sonoda M, Takano M, Miyahara J, Kato H, Raiology, 148, 833 (1983)

[4] Thoms M, Seggern V, J. Appl. Phys., 81(9), 5887 (1997)

[5] Ichihara S, Hayakawa S, Saga S, Hoshino M, Sakuma S, Ikeda M, Yamaguchi H, Hanaichi T, Kamiya Y, J. Electron Microsco, 33(3), 255 (1984)

[6] Nanto H, Miyazaki M, Imai A, Komori H, Douguchi Y, Kusano E, Kinabara A, IEEE Trans. Nucl. Sci., 47(4), 1620 (2000)

[7] Nanto H, Murayama K, Usuda T, Tanigdchi S, Takeuchi N, Radiat. Prot. Dosim., 47, 281 (1993)

[8] Von Seggern H, Meijerink A, Voigt J, Winnacker A, J. Appl. Phys., 66, 4418 (1989)

[9] Rogulis U, Dietze C, Pawlik T, Hangleiter T, Spaeth JM, J. App. Phys., 80(4), 2430 (1996)

[10] Kong W, Ahmed S, Ferguson J, Solanki R, Appl. Phys. Lett., 67(1), 7 (1995)

[11] Tabakova V, J. Lumin., 68, 265 (1996)

[12] Keller SP, Mapes JE, Cheroff G, Phys. Rev., 108(3), 663 (1953)

[13] Douguchi Y, Sato T, Miyazaki M, Imai A, Kusano E, Kinbara A, Nasu S, Nanto H, in Proceedings of SPIE Advanced Sensors and Monitors for Process Industries and the Environment(1998), p. 286 (1998)

[14] Nanto H, Komori H, Araki K, Douguchi Y, Kusano E, Nasu S, Kinbara K, in Proceedings of SPIE Rare-Earth-Doped Materials and Devices V(2001), p. 248 (2001)

[15] Knitel MJ, Dorenbos P, Combes CM, Andriessen J, van Eijk CWE, J. Lumin., 69, 325 (1996)

[16] Takahashi K, Miyahara J, Shibahara Y, J. Electrochem. Soc., 132, 1492 (1985)

[17] Hangleiter T, J. Phys. Condens. Matter, 2, 6837 (1990)

[18] Kimura T, Nakamura S, Itoh N, Inabe K, Phys. Stat. Sol. A, 165, 503 (1998)

[19] Quang VX, Son NM, Yen PT, Mai TH, Hut B, Troppenz U, Mauch RH, Phys. Stat. Sol. A, 156, 209 (1996)

[20] Kim SH, Kim CJ, Kim W, Kang HD, Kim DS, Kim YK, Seo HJ, Doh SH, Sae Mulli, 45(3), 184 (2002)

[21] Takahasi K, Kohda K, Muyahara J, Kanemitsu Y, Amitani K, Shionoya S, J. Lumin., 31-32, 266 (1984)

[22] Tayler GC, Lilley E, J. Phys. D-Appl. Phys., 11, 567 (1978)

[23] Chen R, Winer AA, J. Appl. Phys., 41(13), 5227 (1970)