Previous Article Next Article Table of Contents Advanced Materials, Vol.26, No.38, 6554-6559, 2014 DOI10.1002/adma.201402028 Export Citation Element Specific Monolayer Depth Profiling Macke S, Radi A, Hamann-Borrero JE, Verna A, Bluschke M, Bruck S, Goering E, Sutarto R, He FZ, Cristiani G, Wu M, Benckiser E, Habermeier HU, Logvenov G, Gauquelin N, Botton GA, Kajdos AP, Stemmer S, Sawatzky GA, Haverkort MW, Keimer B, Hinkov V Keywords:thin film heterostructures;complex functional materials;resonant X-ray reflectivity;non-destructive characterization;depth profiling Please enable JavaScript to view the comments powered by Disqus.
