Patterned nano crystalline ZnFe2O4 thin film was fabricated on quartz substrate by pulse laser deposition. XRD and Raman spectroscopic techniques were employed for structural characterization of the film. Silencing of a small number of prominent ferrite XRD peaks in thin film signify mild textured film growth. The observed XRD peak position swing with respect to the target material in thin film indicates formation of lateral strain in opposite directions during film growth. The thin film XRD peak position shift with target material data as reference is explained by suggesting an appropriate film growth model. Designated ferrite Raman emission peaks originated from film surface authenticates the stoichiometric and structural stability of ferrite material. AFM images indicate specific pattern formation with nanogranular morphology. Magnetic property measurements of the thin film revealed enhanced properties which are explained on the basis of texture, lattice strain, and surface features that are originated from patterned thin film growth. (C) 2014 Elsevier Ltd. All rights reserved.