High-T(c) superconducting Bi2Sr2CaCu2O(x)/Ag tape was successfully fabricated using a screen-printing method and a partial-melting process. A highly oriented layer structure was achieved and confirmed by X-ray diffraction (XRD), pole-figure measurement and scanning electron microscopy (SEM). The critical current density, J(c), of the tape at 77 K, O T, was about 20 000 A cm-2. High-temperature XRD was used to clarify the mechanism of the grain alignment. An alignment structure of the 2212 phase was originated from Bi-free compounds, such as (Sr,Ca)CuO2 and (Sr,Ca)2CuO3 developed during a holding stage at 875-degrees-C.