Thin films of InSex were obtained by vacuum evaporation of polycrystalline materials onto substrates at moderate temperatures, T-s. Electrical properties of films grown from different stoichiometries of flash source materials are reported in this work. The temperature dependence of the conductivities shows two conduction regimes. The low temperature regime exhibits a T--1/4 conductivity dependence which fits well, using the Mott model, with an average localized states density value of N(E(F))approximate to 8x10(18)cm(-3)eV(-1). Hall measurements as a function of temperature show that the predominant conduction mechanism is scattering by grain boundaries in polycystalline films.