Polycrystalline CdZnTe thick films with an average grain size of 30 pm and thickness of 270 pm were successfully grown on SnO2:F (FTO)-coated glass substrates by close-spaced sublimation method. Electrical properties and UV response of CdZnTe thick films after Br-MeOH etching and ZnCl2 annealing treatment were investigated. By means of the photo-current measurements, the value of mobility-lifetime (mu tau) products for CdZnTe films were firstly reported. The results showed that Br-MeOH etching significantly improved UV detection sensitivity of CdZnTe thick films, and made the surface distribution of UV sensitivity more homogeneous. It was also found that a ZnCl2 annealing process did not improve the electrical properties. (C) 2015 Elsevier B.V. All rights reserved