Journal of Crystal Growth, Vol.436, 145-149, 2016
Surface reconstructions and transport of epitaxial PtLuSb (001) thin films grown by MBE
This work presents the surface reconstructions and transport properties of the topological insulator PtLuSb grown on Al0.1In0.9Sb/GaAs (001). Two stable surface reconstructions, (1 x 3) and c(2 x 2), were observed on PtLuSb (001) surfaces. Antimony-dimerization was determined to be the nature of the (1 x 3) surface reconstruction as evidenced by chemical binding energy shifts in the antimony 4d core-level for surface bonding components. The two surface reconstructions were studied as a function of Sb-4 overpressure and substrate temperature to create a reconstruction phase diagram. From this reconstruction phase diagram, a growth window from 320 degrees C to 380 degrees C using an antimony overpressure was identified. Within this window, the highest quality films were grown at a growth temperature of 380 degrees C. These films exhibited lower p-type carrier concentrations as well as relatively high hole mobilities. (C) 2015 Published by Elsevier B.V.
Keywords:Reflection high energy electron diffraction;Surface structure;X-ray photoemission spectroscopy;Molecular beam epitaxy;Heusler compounds;Topological insulator compounds