Journal of Materials Science, Vol.35, No.1, 63-69, 2000
Morphologies and growth mechanisms of aluminum nitride whiskers by SHS method - Part 2
The high resolution electron microscopy was used to investigate the microstructure of AlN whiskers. The growth mechanisms of AlN whiskers were VLS and VS mechanism. The phenomenon of stacking fault was analyzed. Moreover, the growth mechanism of dendritic crystal was proposed.