Previous Article Next Article Table of Contents Journal of Materials Science Letters, Vol.15, No.7, 551-554, 1996 DOI10.1007/BF00579247 Export Citation Preparation of Cross-Section Specimens for AFM Imaging of Metal-Semiconductor Interfaces Yoon J, Ivey DG Keywords:SCANNING-TUNNELING-MICROSCOPY;SPECTROSCOPY;STEEP;TIPS Please enable JavaScript to view the comments powered by Disqus.
